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Standard 0.30 (8.50) - 1.06 (30.00) Battery Probe
BIP-3
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 60Recommended Travel (mm): 1.52Mechanical Life (no of cyles): 250,000Overall Length (mil): 511Overall Length (mm): 12.98
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Circuit Tester
TE6-0720
Hangzhou Tonny Electric & Tools Co., Ltd.
*For use on cars, trucks, boats, trailers and motorcycles*Needle point probes *Use to trouble shoot both primary and secondary circuits*Use this tester to check primary circuits of 6/12V*On secondary or high voltage circuits you can check spark plugs
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SPL-03C-090 Step Probe
SPL-03C-090
Current Rating (Amps): 6Average Probe Resistance (mOhm): 50Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 127Recommended Travel (mm): 3.22Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,530Overall Length (mm): 38.86Rec. Mounting Hole Size (mil): 95Rec. Mounting Hole Size (mm): 2.40Rec. Mounting Hole Remark: 94 to 96 mil / 2.39 to 2.44 mmRecommended Wire Gauge: 22-26 AWGRecommended Drill Size: #41 or 2.40 mm
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High 1.80 (51.00) - 12.60 (357.00) Switch Probe
TSP138-C180-3
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 138Test Center (mm): 3.50Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,760Overall Length (mm): 44.70Switch Point (mil): 67Switch Point (mm): 1.70
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Spring Probes
Spring probes are designed to optimize performance in high reliability, multicycle applications. Smiths Interconnect's spring probes, featuring IDI contact technology, are compliant which makes them ideal for blind mate applications as they self correct for x, y, z, rotational and angular misalignment of the target. Offered in compressed heights less than 2 mm and utilized on pitches as tight as 0.4 mm, they are well suited for high density, board-to-board, battery contact and high frequency applications.
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Cantilever type Probe Card / C type
CE Series
Japan Electronic Materials Corp.
*Standard Cantilever Probe Card*Low Contact force*Stable Contact*High accuracy of alignment*Suitable for variety of Devices
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sbRIO-9234 , Non-Enclosed, 4-Channel, 51.2 kS/s/channel, ±5 V, C Series Sound and Vibration Input Module
782718-01
Non-Enclosed, 4-Channel, 51.2 kS/s/channel, ±5 V, C Series Sound and Vibration Input Module - The sbRIO‑9234 can measure signals from integrated electronic piezoelectric (IEPE) and non‑IEPE sensors such as accelerometers, tachometers, and proximity probes. The sbRIO‑9234 is also compatible with smart TEDS sensors. The sbRIO‑9234 delivers a wide dynamic range and incorporates software-selectable AC/DC coupling and IEPE signal conditioning. The input channels simultaneously measure signals. Each channel also has built-in anti‑aliasing filters that automatically adjust to your sample rate. When used with NI software, this module provides processing functionality for condition monitoring such as frequency analysis and order tracking. Non-enclosed modules are designed for OEM applications.
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Adjustable Press Plate Bed of Nails Testers
Protector Adjustable Family
Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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Electron Probe Microanalyzer
EPMA-1720
Both hardware and software incorporate the latest technologies to create the next generation of EPMA. New functions that offer simple and easy-to-understand operation have been added to the superb basic EPMA performance that Shimadzu has fostered over many years – high sensitivity, high accuracy, and high resolution – to allow the EPMA's capabilities to be exploited to the fullest. While easy enough for even novices to use, it also supports sophisticated analysis by experienced users.
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Probe Stations
PSI's 600LS Series Probe Station is designed to exceed performance metrics of equipment priced significantly higher.
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RF/High Frequency Probes
Everbeing is proud to distribute GGB Industries line of PicoProbes for customers everyday RF probing needs. The popular model 40A has been serving the needs of many high frequency researchers in the sub-40 GHz range. For more information on their products, visit www.ggb.com. If a product they sell is not shown here, we are still able to acquire for you. Please contact us for more details.
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110 GHz, 1.0 Mm (m-f) Test Port Cable 10 Cm
11500JK10
Connect test ports to devices, fixtures, or probe tips with this 10-cm cable
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Stand-Alone Test Fixture
MA 2011/D/H
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1000Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,00 kg
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Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25A-10
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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1kV, 80 MHz High Voltage Differential Probe with 6m Cable and Auto Zero Disconnect
HVD3106A-6M
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Digital Megohmmeter
800
The ACL 800 Digital Megohmmeter is a dependable and easy-to-use audit kit that is designed to test static dissipative surfaces for electrical resistivity and resistance according to industry standards such as ANSI/ESD test methods S4.1, S7.1, and ASTM D257. Tests are easy to perform with or without the 5lb probes. Use optional concentric ring probe for conformance to STM11.11.
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Passive Probe, 10:1/1:1, 350 MHz, 1.3m
N2889A
The Keysight N2889A low-cost passive probe provides up to 350 MHz bandwidth and features high-input resistance of 10 MΩ (@10:1 mode) to address a wide range of measurement needs with low probe loading. The N2889A comes with a convenient switch in the probe handle that lets you switch between a 1:1 and 10:1 attenuation ratio.
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1 GHz, 1.0 pF Active Differential probe
ZD1000
With the ProBus interface, the ZD500, 1000, and 1500 becomes an integral part of the oscilloscope. All probe gain and offset controls are transparent to the user, making it easier to probe the circuit without concern for which gain setting to choose. When used with a LeCroy digital oscilloscope, no external power supply is required.
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ITA, I1, With Protective Cover
410128101
The i1 ITA's small width and inboard handle increase the side to side stackability. The U-shaped cable clamp allows modules to be pre-wired before assembly and can hold cable bundles with an oblong bushing effective diameter of 1.07 in. The removable cover allows easy access to wiring for maintenance and probing. Protective Cover included.
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DDR4 X16 2-wing BGA Interposer For Logic Analyzers, Connects To 61-pin ZIF
W4641A
The W4641A DDR4 2-wing BGA interposer for DDR4 x16 BGA DRAM probing takes full advantage of the quad sample state mode on the U4164A the W4641A is the smallest BGA interposers for DDR4 x16 DRAM capable of capturing simultaneous read and write traffic at data rates exceeding 3.2 Gb/s. U4208A and U4209A probe/cables connect any W4640A Series DDR4 BGA interposer directly into the U4164A logic analyzer module from 61-pin high density zero insertion force (ZIF) connectors that attach to the W4640A Series BGA interposer wings.
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Light 0.60 (17.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-72T20-2
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type H, Ø0.80mm, 305gf
K100-H080305-SKAU
K100 Series, Pitch 100mil, Tip Style H, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
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Gold Probes
4900 Series
The "GOLD PROBE" has been designed specifically for use with Tektronix, Hewlett Packard and other high performance oscilloscopes. This new slim design along with a host of versatile accessories, allows you to reach the most difficult test point in today's highly complex circuitry. The gold plated Probe Tips, Sprung Hook, Ground Lead, Alligator Tip and other critical interconnect points within the Gold Probe, provide excellent contacts for probing low level analog signals and high speed digital data. Unlike most "off shore" commodity probes, Probe Master guarantees quality and continuing domestic support for our "Made in America" Gold Probe.
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Ice Point Calibrators
These ice point calibrators are designed to accurately calibrate probes at the freezing point of water. These devices have multiple thermowells to calibrate multiple sensors simultaneously.
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Adapter/Stainless Steel
WADP-NFNF-BH
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Flicker Measuring Probe for LCM ATS
A712306
The Chroma A712306 Flicker Measuring Probe for LCM ATS is specifically designed for adjusting the flicker on LCM automatically following the FMA(Flicker Modulation Amplitude) standards defined by VESA (Video Electronics Standards Association) and JEITA (Japan Electronics Information Technology Industries Association) for flicker measurement.
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Battery Impedance Meter
Operation is fast and simple. Just press the spring-loaded probes onto the two poles of the battery. After 1.5 seconds, the unit beeps (indicating good contact) and displays the battery voltage and either the number of siemens or milliohms, depending on the knob setting. The display continues to show these numbers after the probes are removed; it resets only when the probes are pressed onto the next battery. The impedance and voltage of any battery between 1.2 and 60 volts can be read. Because of the wide range of voltages, even single low-voltage cells, such as NiMH, can be measured. The manufacturers of some batteries specify impedance in milliohms while other specify in siemens (one divided by the resistance in ohms). This meter will display both types of impedance for any given battery. Accuracy is +/- 2% of the value.
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Probe Needles for Wafer Sort and Test Applications
Advanced Probing Systems, Inc.
APS is the global leader in the manufacture of probe needles used in cantilevered probe cards. All probe needles used in wafer sort are manufactured according to customer specifications using stringent in-process quality assurance procedures.
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Motherboards
ITC currently manufactures over 100 different motherboard types, including interfaces to all major brands and types of testers. Additionally, ITC has the ability to quickly design and manufacture motherboards for any new tester interface including custom probe cards.
