Regulator Test
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Temperature and Humidity Regulator
H3430
Built-in relative humidity, temperature sensors. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy. Three two-state inputs.
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Temperature and Humidity Regulator
H3021
Humidity, temperature probe on a cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy.
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Temperature Transmitter and Regulator
H0430
Built-in temperature sensor.Temperature transmitter is equipped with three two-state inputs for detection of two-state signals - e.g. power presence, water, smoke, airflow, glass break detection, door contact.
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Regulators
Parker offers a range of air-line, pressure high flow and single phase regulators for instrumentation, filtration, refrigeration and pneumatic applications. Instrumentation regulators are used in the process, power, oil, gas and semiconductor industries to control the flow of liquids and gases with speed and precision. Air regulators provide quick response and accurate pressure regulation for the most demanding industrial air preparation applications, available as miniature, economy, compact, standard, hi-flow and pilot-operated regulators to meet a variety of service needs. The refrigeration line of pressure regulators includes valves that control inlet, outlet or differential pressure. Each regulator is available with an assortment of variations which enable one regulator to perform multiple functions. All regulators are built to the highest quality standards, recognized around the world for their performance, durability and reliability.
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Regulated DC Power Supply
PDS-A Series Hybrid
As compared with dropper-method DC power supplies, the unique switching and dropper circuit systems bring low output noise at same level, light weight less than half, and compact body. PDS-A power supply corresponds to EU RoHS regulation in consideration of environment. GP-IB, RS-232C, USB and LAN optional control boards are available and users are able to download API and drivers software from TEXIO web-site.
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Off-Line Base Test Platform
6TL19
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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DC to DC Voltage Regulator
HVDR-15
The HVDR-15 is a high efficiency, high voltage step down DC to DC voltage regulator. Input voltage can be as high as 110VDC. Up to three output voltages can be pre-configured to allow up to 1A or 3A of output current. The HVDR-15 features over voltage, over current, and over temperature protection. It is offered in one, two, or three output voltage versions making it a very efficient and flexible platform for many applications.
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Low Voltage Switching Regulators
Renesas' comprehensive portfolio of low voltage, synchronous buck integrated FET switching regulators offer a compact solution size with outstanding performance.
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Linear Vs. Switching Regulators
Linear RegulatorsLinear regulators are a great choice for powering very low powered devices or applications where the difference between the input and output is small. Even though they are easy to use, simple and cheap, a linear regulator is normally inefficient.Switching RegulatorsSwitching regulators on the other hand are highly efficient and available as modular chips which are compact and reliable. Switching regulators can be further divided into isolated and non-isolated.
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Test Platforms
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Climate Regulators
Climate regulator for systems with traditional heating and/or floor heating. It allows to manage 3 outputs (3 + 1 Relays) and 4 inputs Probes, 1 input for the thermostat environment and input 1 for the Remote Controller.
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Off-Line Seat Operation Base Test Platform
6TL23
The 6TL23 is a bare rack for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation since there’s space for the operator’s legs under the fixture receiver.
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SCR Controller with Regulator
The SCR Controller and the Regulator Board are used in SCR controlled power supplies.CEHCO offers single phase and three phase SCR Controllers with Regulator Boards.
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Regulators, Monitoring, Sensors And Flow Control
All of the products in Parker's extensive pump and flow control product lines, from pumps and valves to motors and motion controllers, share a common heritage of advanced technology applied to meet the specific needs of our customers. In every instance and for every application, Parker components and systems are engineered to deliver precise and reliable control.
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Temperature and Humidity Regulator
H3331-4
Relative humidity, temperature probe on a cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy. Three two-state inputs.
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Temperature and Humidity Regulator
H3431-2
Relative humidity, temperature probe on a cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy. Three two-state inputs.
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TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Temperature and Humidity Regulator
H3431
Relative humidity, temperature probe on a cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy. Three two-state inputs.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Regulated Power Supply
PA-B Series
* A wide range of series and lineup, the experimental course, available use in a system and production and a wide range of scenes.10V,18V,36V,80V,120V,160V,250V,350V,600V* External remote control equipped with a terminal on the back, enables ON / OFF and output ON fixed output by the contact signal from the external.*In addition, external voltage, an external resistor, can be the output voltage and output current to the remote control.*In addition equipped with the adjustment for the volume at the time of external control on the front panel, you can adjust the offset and full-scale.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Integrated TFT-LCD DC-DC Regulators For Automotive
Renesas' portfolio includes automotive-grade multiple output regulators for use in TFT-LCD automotive applications.
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Scienlab Battery Test System — Cell Level
SL1002A
Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
