Automated Fiber Optical inspection Systems
See Also: Inspection Systems, X-ray Inspection Systems
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Automated Production Testing
MegiQ provides an Application Programming Interface (API) for controlling the VNA application and measurements.This API is used for developing custom automated measurements in a factory.
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Inspection scope
KI-TK1012
Inspection scope & cleaning materials. Interchangeable MPO SC LC connectors
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Biofuels Testing and Inspection
Intertek delivers assurance, testing, inspection and certification services to refiners, producers, blenders, distributors, consumers and research institutes across the world.
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PXI/PXIe MEMS Optical MUX, 8-Channel, Multi-Mode, 50/125 Fiber
40-852A-318-M50
The 40/42-852A-318-M50 is a PXI/PXIe 8-channel multiplexer with MU (mini SC) connectors and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules. They are available in many high density formats with a choice of different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications.
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Automated Quality Control System of Capillary Blood Collection Tubes
ASKKP
The Automated Quality Control System of Capillary Blood Collection Tubes "ASKKP" was developed and put into operation. The customer of the system is Eiliton LLC, a manufacturer of medical equipment.
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Surface Defect Inspection System
Wafer for inspection of surface condition of specular flat substrate, glass substrate, others φ 100 ~ φ 300 compatible
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Automation Testing
Every time software code is modified, it has to be tested manually to ensure quality. With increasing codebase and added functionality, manual testing turns laborious, inefficient and costly. Automation testing helps automate highly repetitive test cases to provide testing coverage on core business processes, cutting costs by up to 40% and reduce test times by over 20%.
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Industry-Standard, Automated Precision Inspection Systems
Circuit AOI 4.0
Circuit AOI 4.0 is a set of industry-standard, automated precision inspection systems that combine precision, robust construction and line-of-sight technology for assembly and production under stringent regulatory standards and is ideal for PCB / HDI line inspection.It uses innovative alignment detection logic to detect defects such as short / open circuit, protrusion / depression, scratch, pinhole, residual copper, line width / line distance violation, missing objects, unwanted objects, and so on. The system can be used with off-line set-up station and off-line re-check station to enhance the detection capacity.Circuit AOI 4.0 uses multi-angle LED light source, compared to the traditional single angle light source design, can obtain the best image contrast, widely used in different plate inspection.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Automated Metrology System
EVG®50
High-throughput, high-resolution metrology for bonded stacks and single wafers. The EVG 50 (fully automated stand-alone tool) and the Inline Metrology Module (integrated in EVG''s high-volume manufacturing systems) offer highly accurate measurements at high speed, utilizing different measurement methods for a large number of applications. The tool''s application range covers multi-layer thickness measurements for determination of the total thickness variation (TTV) of an intermediate layer, the inspection of bond interfaces as well as resist thickness measurement, and meets the most demanding requirements of the yield-driven semiconductor industry.
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Miniature Fiber Optic Pressure Transducers
*The diameter of the working length section can be as small as 0.5 French *The sensor tip size can be as small as 0.8 French The flexibility of the glass fiber offers excellent deliverability without being prone to kinking like electrical wires *The front looking configuration of the sensor tip prevent side-facing/wall bouncing artifacts in the measurement*The lack of metallic components provide full immunity to interference from RF, MW and MRI systems
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Luminescence Defect Inspection System
INSPECTRA® PL Series
This system uses luminescent images created using photoluminescence (PL) to perform high-speed, high-sensitivity automatic inspection for crystal defects, cracks, and luminescence defects which cannot be detected with conventional visible light surface inspection!
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X-ray Inspection System
X-eye SF160 Series
High-performance Micro-focus Open Tube with 160kV is installed and fine defects of 1㎛ are detectable. High-resolution X-ray image can be gained with world best magnification by installing high-price Open Tube as standard.Dual CT function can be purchased adtionally, and exact location & size of defects can be detected and analyzed with this function.
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Brinell Optical Scanning System
B.O.S.S.
Newage Testing Instruments, Inc.
The B.O.S.S. brinell optical scanning system measures your brinell impressions faster, more accurately and more consistently. And it improves your quality control with advanced data acquisition and analysis capabilities, including the ability to save your high-resolution image of our impression to file.
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Managed Ethernet Switch with L2/L3 Layer Support and Fiber Optic Option
ES2
Ethernet Switch module, ES2 provides up to 16 10/100/1000 Base-T 1 Gb ethernet ports. Additionally, there is one 10/100/1000 Base-T maintenance port interface, one RS-232 maintenance/console port interface, and a Fiber-Optic channel with four 10 Gb ports. It also provides numerous L2 and L3 networking, quality of service (QoS) and security features available as described below.
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PXI/PXIe MEMS Optical MUX, 8-Channel, Multi-Mode, 62.5/125 Fiber
40-852A-518-M62.5
The 40/42-852A-518-M62.5 is a PXI/PXIe 8-channel multiplexer with ST connectors and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules. They are available in many high density formats with a choice of different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications. They are also available with an optional hardware interlock which, when activated, will return all optical switches to their default unpowered state.
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Defect Inspection and Review
KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
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Automated Testing Systems
Instron’s automated testing systems bring precision, productivity, and safety to materials testing by automating routine tensile, flexural, and compression operations. Available as full turnkey platforms or modular add-ons for existing test frames, these systems — including the AT3 three-axis, AT6 six-axis robotic, AT2 automated XY stages, CT6 cobot integration, and carousel stations — allow labs to boost throughput, reduce operator variability, and free up staff for higher-value activities. The systems are engineered to support a wide spectrum of materials (plastics, metals, films, composites, medical devices) and comply with international ASTM and ISO test standards while enhancing repeatability and workflow efficiency.
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WiFi Inspection Cameras
WiFi Inspection Cameras generates a local WiFi hotspot (without Internet access) through which video clips and still photos of hard-to-reach or hard-to-see areas or equipment captured by the probe camera can be sent to an app-enabled smartphone or tablet for viewing and sharing. Free apps for iOS devices (iPhones or iPads) and Android devices are available from the iTunes App Store and Google Play Store, respectively. The three WiFi cameras differ in probe length, camera lighting and grip style.
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Waterproof Inspection Cameras
waterproof inspection cameras have waterproof probes, General's DCS6XX wet/dry cameras, the DCS600A, DCS605, DCS660A, DCS665 & the DCS665-ART, go one step further because their grips and monitors are also waterproof. This feature, unique in the industry, allows users to inspect toilets and water and sewer lines carrying running water without worrying about dropping and "dunking" the instrument.
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Optical Coherence Tomography (OCT) systems
dOCTor™
dOCTor™ Optical Coherence Tomography (OCT) systemsoffer very high quality non-invasive tissue imaging in 2D and 3D. They are ideal for: In-Vivo Imaging Small Animal Imaging Tissue Engineering and Visualization Developmental BiologydOCTor systems are available in Swept-Source(SS) OCT and Time-Domain (TD) OCT configurations to satisfy different application imaging needs.
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Package Inspection Products
Image quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.
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PXI/PXIe MEMS Optical MUX, 4-Channel, Multi-Mode, 50/125 Fiber, FC/PC Connectors
42-850A-114-M50
The 40/42-850A-114-M50 is a PXI/PXIe 4-channel multiplexer with FC/PC connectors and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules.
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PXI/PXIe MEMS Optical MUX, Dual 2-Channel, Single-Mode, 9/125 Fiber
40-855A-022-HI
The 40/42-855A-022-HI is a PXI/PXIe dual 2-channel multiplexer with FC/APC connectors, includes hardware interlock and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules. They are available in many high density formats with a choice of different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications.
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Industrial Automation Components
Panasonic Industrial Devices Sales Company of America
Panasonic offers total automation solutions products that include PLCs, human machine interfaces, sensors, static control devices, laser markers, servo motors, temperature controllers, timers, hour-meters, counters, limit switches and other factory automation components.
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Automated Test Environment
AS5657-ATE
The AS5657 Automated Test Environment (AS5657-ATE) is designed to automate device compliance testing according to the SAE-AS5657 “Test Plan/Procedure for AS5643 IEEE-1394b Interface Requirements for Military and Aerospace Vehicle Applications”. The purpose of this tool is to automate and simplify the task of AS5643 compliance verification and testing, which of course is essential for device compatibility within avionics and aerospace programs.
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Automated Visual Control System
Eyesystem 1.0
To develop a system for automated detection of rejects in the process of filling yoghurt into a bottle on a production conveyor.
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Optics Test Stations For Single Lenses And Optical Systems
OTS
Optik Elektronik Gerätetechnik GmbH
The optics test stations of the OTS series enable the computer-based, software-controlled measurement of optical parameters of individual lenses (including cylindrical lenses) and optical systems. Measured variables are, for example, focal length, MTF, focal length, radius, contact dimension, centering, wedge angle and deflection angle. The optional software module LensTest enables the measurement of the center thickness of lenses and air gaps in complete lenses as well as the measurement of the centering error of individual surfaces.
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Brinell Optical Systems
Newage Testing Instruments, Inc.
Newage offers optical solutions for your hardness testing include the popular B.O.S.S. Brinell Optical Scanning System, HiLight optical scope and pocket optical scope.
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Concrete Inspection
Concrete structures are normally constructed using steel reinforcement and Elcometer offers Concrete Covermeters and Rebar Locators to either measure the depth of concrete over the rebar or simply to detect the rebar under the surface. Half-cell versions of the Covermeter can be used to assess the probability that corrosion is taking place on the rebar. Test Hammers are used to assess the surface hardness of cured concrete and Elcometer offers several moisture meters that can be used to determine if the structure is sufficiently dry for coating.
