Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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Test System
LPDDR4 and LPDDR3
Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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Function Test and In-Circuit Test
CT350
ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
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Test Tables / Test Consoles
Adaptronic test tables and test consoles are a decisive component of the adaptronic kit for the assembly of comfortable and high-quality test systems for the wiring test of manufactured cable harnesses of all types.
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Large Current Battery Short Circuit Test Device
Guangdong Bell Experiment Equipment Co.,Ltd
DGBELL Large Current Battery Short Circuit Test DeviceApplication: Battery Module, Battery Pack, Battery System short circuit.Short Circuit Mode: Pneumatic drive contact + Vacuum Interrupter
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Piezoelectric Testing
Radiant Technologies, Inc. specializes in the measurement of electrical and piezoelectric properties of non-linear materials. The Piezoelectric Task captures a sample's displacement as a function of voltage profile along with the sample's polarization response. An external displacement measurement instrument must be attached to a Radiant Precision Test System to make this measurement. All of the Radiant testers are equipped with a high-impedance voltage input to capture the output of a displacement sensor. Every Vision measurement task will collect data from that sensor input simultaneously with the measurement being executed. Radiant's test systems work easily with displacement sensors which include:
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Package Test
WinWay’s commitment to technology, quality and service ensures our interface solutions go above and beyond to exceed your expectations. Our products and services have a proven track record of delivering customer success in semiconductor testing. The Company offers comprehensive test interface solutions ranging from wafer-level test, package-level test to thermal management.
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Measuring Devices For Drawing Dies And Punches For 2-piece Can Production
PUNCHMASTER - the benchmark for accuracy
Optik Elektronik Gerätetechnik GmbH
Measurement of the outer diameter, the roundness and the outer contour of cylinders, in particular of punches (stamps) for the 2-part beverage can production.
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Test Data
Studies by major universities were conducted in response to a request from the military, scientific and engineering communities for scientific validation of claims that Pulse Technology actually improves battery efficiency and lengthens battery life. PulseTech contracted with Oakland University in Rochester, Michigan and Ohio State University in Columbus, Ohio to conduct separate evaluations of the technology. These extensive evaluations began in the summer of 1998 and concluded in the fall of 2000.
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General Test
Helps technicians diagnose and troubleshoot problems with twisted pair cable. Easily install, qualify, and maintain DSL services.
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OLLI - gas detector / measuring device
Gas measurement & warning instrumentExplosion-proof & compact handheld gas measurement instrumentas diffusion device. It can be used for up to 5 combustible and toxicgases as well as oxygen and comes in an extremely rugged2C synthetic housing with a Li-Ion rechargeable battery.Explosion-proof measurement instrument formethane (CH4),propane (C3H8),oxygen (O2),carbon monoxide (CO),carbon dioxide (CO2),hydrogen sulfide (H2S)
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Loading Devices
Educated Design & Development, Inc.
Built-in fans provide sufficient coolingSelf-contained unit eliminates hazards due to exposed wiringFine tuning mechanism allows for ultra precise measurementsUnits are on casters, providing a portable test station!
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Thermal/Mechanical Testing
Accolade Engineering Solutions
As new products employ advanced materials and processes, the need to measure and characterize those material properties becomes increasingly important. DSC is used to measure heat flow in to or out of a material. Some DSC applications include measurement of melting temperature, polymorphic transitions, crystallization temperature, thermal stability, heat of fusion and degree of cure. TMA is used to measure dimensional changes of a material as a function of temperature.
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Continuous Testing
Continuous testing is the practice of embedding quality through every phase of the software delivery lifecycle - from planning to production. The goal is to ensure that testing continuously reduces risk and improves application quality.
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Combinational Base Test Platform
6TL24
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid-volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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USB-8506, 1-Port, USB LIN Interface Device
784663-01
1- or 2-Port, USB LIN Interface Device—The USB‑8506 is a Local Interconnect Network (LIN) interface for developing applications with the NI‑XNET driver. The USB‑8506 is powered over the USB bus and does not require external power. The USB‑8506 excels in applications requiring logging or manipulation of hundreds of LIN frames and signals, such as in-vehicle data logging, bus monitoring, automation control, and more. The NI‑XNET device-driven DMA engine enables the onboard processor to move LIN frames and signals between the interface and the user program without CPU interrupts, minimize message latency, and free host processor time. The USB‑8506 is available with a three‑pin COMBICON synchronization connector for triggering and synchronizing the internal hardware timebase with other devices.
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Data Acquisition Device A2D / D2A
General Features10 DAC channels5 ADC channelsDifferential or single ended IOs Full scale bipolar or unipolar signaling
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In-Line RF Test Platform
AR925
This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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PCI-5412, 100 MS/s, 14-Bit Waveform Generator Device
779177-03
The PCI‑5412 can generate user-defined, arbitrary waveforms and standard functions, including sine, square, triangle, and ramp. This arbitrary waveform generator can generate signals from -6 V to +6 V and uses direct digital synthesis (DDS) to precisely generate waveforms.
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Modal Testing
We pioneered the use of random excitation for modal testing and extended the method to include multishaker random testing and polyreference data processing. We have unsurpassed experience in modal testing of aerospace and industrial systems, including large scale testing for aerospace systems with over 400 accelerometers and eight shakers.
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Device Power Supply (DPS) & Parametric Measurement Units (PMU) ATE
Analog Devices’ parametric measurement units (PMUs) and device power supply (DPS) products offer a flexible range of voltage and current source/measurement capability to meet the needs of a wide range of cost-sensitive test applications. With a proven track record, Analog Devices’ PMU and DPS products serve a wide variety of precision test application requirements, such as measurement and control for voltage and current. Analog Devices’ DPS and PMU products are equipped with unique precision measurement and control capability for today's demanding ATE solutions.
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Test Sockets
Smiths Interconnect offers a wide range of spring contacts and design standards for high quality test sockets providing flexibility and fast delivery for optimal cost/performance ratio.
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FPGA Testing
Silicon Turnkey Solution, Inc.
The secret to our success in the FPGA testing field is the STS hammer file, a proprietary test methodology based on our experience testing thousands of unique FPGA designs. The hammer file is designed to program the FPGA to its maximum combination and block configuration and then tests the completely programmed FPGA for full dynamic, DC and at-speed AC performance. Power and transient tests are also conducted under worst-case populated configurations. Application-specific usage configurations are also used to assist in generating the worst-case electrical specification limits at worst-case environmental use.
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Location Devices
Flash Pinger is a small battery powered acoustic transmitter as well as an optical flashing recovery device. Multiple settings allow for selection of flashing, timing, and frequency options for use in a variety of different applications.
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Test Handler
M4841
High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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Switch Device for PCI Express
The Switch Device for PCI Express provides two PCI Express upstream ports and eight downstream ports. You can connect the downstream ports to external devices, such as a Software Defined Radio Reconfigurable Device, to create large multichannel, multiple input, multiple output (MIMO) systems. You can also connect multiple Switch Devices for PCIe to a single PXI Express chassis to create large MIMO systems with a Software Defined Radio Reconfigurable Device.
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Test Switches
RTS
STATES Type RTS Test Switches are designed to simplify and speed testing and check-out of relay, control and instrumentation systems. They eliminate the need to change connections and prevent open-circuiting CTs during tests.
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Climatic Testing
Environmental Test Chamber. Environment Associates' complete Climatic test facilities offer precise simulation of Temperature, Humidity, Altitude, Thermal Vacuum, Salt Fog, Sand and Dust, and Rain as well as many other specialized environments. Microprocessor Control along with calibrated recorded measurements and outstanding attention to detail by our technical staff make for a perfect test everytime.
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Hardness Testing
DeFelsko offers handheld digital hardness tests in compliance with two different recognized hardness scales: Shore and Barcol. Our PosiTector SHD Shore Hardness Durometer is available in both Shore A and Shore D scale to measure the indentation hardness of non-metallic materials. The new PosiTector BHI Barcol Hardness Impressor is ideal for measuring the indentation hardness of soft metals, harder plastics and fiber-reinforced plastics.
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PCB Test And Design-For-Test Services Group
ntellitech has a very experienced consulting and test development organization that is dedicated to provide our customers with high-quality design and test services. Choosing Intellitech Test Services can help you lower the risk of adopting a new Design-for-Test methodology or speed your product to market when you need to deploy a test solution quickly.
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