Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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TEST BOX
6280 TB
Standard Electric Works Co., Ltd
● Wide range of operating voltage from AC 210V/50Hz to 250V/50Hz.● For checking AC voltage.● For checking a RCD tester's test current & time in mA(ms).● For checking a loop tester.● For wiring check (Phase, Neutral, Earth).● For checking continuity.● For checking insulation (The maximum is 1.2kV).● For checking UK16th edition.● Safety standard: EN 61010-1 / EN 61326-1
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PCIe-8430, PCI Express, 8-Port, RS232 Serial Interface Device
780591-01
The PCIe‑8430/8 is a high-performance interface for high-speed communication with RS232 devices. It features high-performance DMA transfers, multithreading, and multiprocessor support. NI serial interfaces also appear as standard … COM ports for compatibility with programs that use serial communications.
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Load Testing Platform
NeoLoad
NeoLoad is the only load testing platform covering you for both Cloud-ready apps, microservices architected apps, mobile and IoT apps and enterprise-grade packaged apps.
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Tire Testing
PL-2000X Plunger Testers equipped with servo-hydraulic system to control the testing speed. Available for customers to select suitable model.
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Biosafety Testing
Biological products derived from mammalian cell lines pose an inherent risk for the introduction of microbial or viral contaminants. In addition, the manufacturing process or product itself may introduce impurities that must be characterized.
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Multiple Light Beam Safety Devices
Leuze electronic GmbH + Co. KG
The multiple light beam safety devices of the MLD 300 (type 2) and MLD 500 (type 4) series are used for access guarding at machines and systems. The devices are available as 2-, 3- and 4-beam transmitter-receiver systems for large operating ranges up to 70 m and as cost-efficient 2- and 3-beam transceiver systems for operating ranges up to 8 m.
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Universal Test Fixture
CAM/GATE
The Low Cost Solution for Accurate and Dependable Universal Functional TestThe CAM/GATE ® Universal Test Fixture System is your afforable, efficient solution for functional test. No need to have multiple fixtures in your test area...
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PCIe-6536B, 32-Channel, 25 MHz, 100 MB/s Digital I/O Device
782630-01
The PCIe-6536 can continuously stream data over the PCI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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Wired Serial Device Server
SD-300
The Silex SD-300 and SD-310AN are designed to easily connect and share RS-232 serial devices over a wired or wireless network. Industrial automation, building automation, medical devices, security access and control, point of sale devices, LED signs, bar code/label and other specialty printers, or virtually any other device with a serial port can be now be enabled with secure, robust wired or wireless network capability.
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European Standard for Remote Reading of Measuring Devices
M-Bus
M-Bus (Meter-Bus) is a European standard for remote reading of measuring devices. M-Bus is predominantly used in buildings, for example in electricity meters, gas meters, water meters or other types of consumption meters. It is also used for various sensors and actuators.
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Test System
USB Explorer 280
The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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Stand-Alone Test Fixture
MA 2011/D/H
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1000Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,00 kg
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Photo Detector Testing
With the rise of 5G technology and popularization mobile devices, more and more advanced photoelectric sensors are used in our daily lives. In order to be better applied to mobile devices, the photosensitive area of these advanced photodetector is getting smaller and smaller. However, these applications place higher and higher requirements on the light sensing performance of advanced photodetectors. In the process of shrinking the photosensitive area, it also brings the challenge of accurate measurement of quantum efficiency. Enlitech adopts the spatial light homogenizing technology and follows the ASTM standard “Irradiance Mode” test method, which is proven that it can accurately perform quantum efficiency and other key parameter measurements of advanced photodetectors.
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Test System
DA-2 ATS
The DA-2 ATS is an economical Commercial-Off-The Shelf (COTS) build-to-print tester. The test station is compliant with the published drawing package. The system does not include software.
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Photonic Device Testing
ficonTEC’s series of photonic device testing machines is focused on automated electrical, optical or mixed-signal electro-optical characterization (test-&-qualify) of chips and dies, opto-electronic assembles and integrated devices. Capability includes PIC design validation and device verification.
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Leak Testing
M SERIES
For several years, the M series has been the high-quality leak testing line, created by FORTEST for sealing and capacity testing, a series that offered great performance and is now in its new T-range its natural evolution.
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Mineral Assay and Testing
Intertek is the minerals assay testing laboratory of choice for mining and exploration companies. Intertek Mineral laboratories are located in key strategic locations around the world, serving the mining industry. The mineral assay laboratories provide sample preparation facilities and a wide range of Total Quality Assurance mineral testing services.
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USB-485/4, 4-Port, USB, RS485/RS422 Serial Interface Device
778476-94
The USB‑485/4 interface transforms your USB port into a single asynchronous serial port for communication with RS485 and RS422 devices. You can use a USB‑485/4 port as a standard serial port from your application, including RTS/CTS hardware handshake lines. NI serial interfaces also appear as standard COM ports for compatibility with programs that use serial communications.
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Ferroelectric Test System
LCII
Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.
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In-Circuit Testing
If you are looking for in-circuit test applications, equipment or advice, our experienced engineers can help you. Whatever your fixturing requirements or special software features, our long history of work in this field means that we have probably seen and done it before.
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Dummy Test Wafers/Chips
Advanced Dummy Test Wafers/Chips available with over 35 different chip designs and choices of 11 different material configurations as well as kits complete with test vehicles. Custom-make test production of TEG wafer/glass (TEG=Test Element Group). Design and provide custom-make test kit.
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EN60350-2：2013 Cookware Test Pot Test Vesssel
CX-G08
Shenzhen Chuangxin Instruments Co., Ltd.
EN60350-2：2013 cookware test pot test vesssel
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PCIe-8244, 4-Port, USB3 Vision Frame Grabber Device
782890-01
The PCIe‑8244 is a USB 3.0 interface device designed for use with USB3 Vision cameras. USB 3.0 is ideal for high-data-rate machine vision applications. USB3 Vision cameras also offer plug‑and‑play functionality and ease of use through a standardized catalog of functions.
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DC Safety Inspection Device For Solar Panels
“DC Fault Tester”
Identifies defect position instantly- contributes to saving inspection time
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Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Standard Test Finger
SMT-1
It with Protection against electric shock device. It according to IEC60335, IEC60884, IEC61032, IEC60529, IEC60065, IEC60035, IEC60950, EN60529, EN60950, GB4706, GB7000, GB9706, UL507, VDE0470, etc.
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Pressure Testing
All metal, plastic, and composite parts intended to contain liquids or gases under pressure are required to undergo stringent pressure testing procedures to meet qualification standards.
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Fire & Flammability Test
Fire & Flammability testing: ASTM E119 [UL 263]; ASTM E152 [UL 10C]; ASTM E814 [UL 1479]; API 607, 6A; ASTM E108 [UL 790]; UL 1709; UL 1715; UL 2043; NFPA 286; UBC 26-2; UBC 26-3; ASTM E84 [NFPA 255, UL 723]; ASTM E162; ASTM E662 [NFPA 258]; ASTM D635; ASTM D1929; ASTM D2863; ASTM E1354; ASTM E1317; Room Burn Facility; CAL 133, 117, 129; UL 94 V/HB; IMO A.652 (16); IMO A.653 (16); ULVW I; ASTM D2859; AITM 2.0007; NFPA 701; FMVSS 302; FAA 25.853; IEEE 383
