PCI Test
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Product
ZIF PCI Test Connector
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Meritec's ZIF PCI Test Connector offers the user an accurate and reliable way in which to test their PCI cards. With over 20,000 reliable cycles, it eliminates the need to constantly replace your PCI Connectors. Meritec's Test Connector assembly plugs directly into the PCI Connector in the test bed and is actuated by a lever for easy loading and unloading of cards. Meritec's solution eliminates the uncertainty associated with intermitancy between the PC Board and Test Connector during the test cycle.
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Product
PCI Express, PCI, Multi-Interface Test Backplanes
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Amfeltec PCI Express, PCI, Multi-Interface Test Backplanes
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Product
PCI Express PLL Test Application
N1081PLCA
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Keysight N1081PLCA PCI Express PLL Test Application designed to measure transmitter PLL bandwidth and peaking based on the PCI Express 5.0 TX PLL Specifications. Use N1081PLCA PCIe PLL test software to test, debug and characterize your PCIe designs.
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
32-bit PCI Test Backplane
SKU-014-01
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The 32-bit PCI Test Backplane was designed to support production testing/debugging of PCI-based peripheral boards. The backplane expands the x1 PCI Express interface of the host computer into four 32-bit PCI slots via 7 ft CAT6 cable. The PCI backplane is a versatile platform that allows you to test up to 4 PCI boards at the same time, facilitates easy access to logic signals, provides hot-swap compatibility, and per-slot overcurrent protection.
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Product
PCI Express® Electrical Performance Validation and Compliance Software
D9040PCIC
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D9040PCIC PCI Express Transmitter Test Compliance Software for PCI Express 4.0 (PCIe 3.x, 2.x and 1.x also supported).
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
PCI bus Test Adapter
pcibus1b
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All important PCI bus signals routed to pin headers for easy connection of logic analyzer. Filter assistance for logic analyzer: D-FF to delay FRAME# by one cycle. To see actual PCI data transfers, filter for FRAME2# high + FRAME# low (address phase), or IRDY# low and TRDY# low (data phase). Business card size. Notched for 5V PCI bus (can be used on 3.3V bus with mechanical modification).
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Product
PCIe Compliance Testing
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Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 4.0 and PCIe 5.0 specification. This solution combines a Summit Z58 or Summit Z516 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 4.0 and PCI Express 5.0 Link and Transaction Layer Compliance Testing.
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Product
PCIe 3.0 and 4.0 Compliance Testing
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Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 3.0 and PCIe 4.0 specification. This solution combines a Summit Z416 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 3.0 and PCI Express 4.0 Link and Transaction Layer Compliance Testing.
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Product
PCI Express Gen 1 Test Backplane
SKU-015-01
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The PCI Express Test Backplane was designed to support production testing/debugging of PCIe-based peripheral boards. The backplane expands the x1 PCI Express interface of the host computer into one x4 and three x1 PCI Express slots via 7 ft CAT6 cable.
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Product
250 KS/s, 16-Bit, 64-Ch Analog Input Universal PCI Card
PCI-1747U
PCI Card
64-ch single-ended or 32-ch differential or a combination of analog input16-bit A/D converter, with up to 250 kHz sampling rateAuto calibrationOnboard FIFO memory (1,024 samples)Universal PCI Bus (support 3.3 V or 5 V PCI bus signal)BoardID™ switch
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Product
100 KS/s, 12-Bit, 16-Ch Universal Multifunction PCI Card
PCI-1710
PCI Card
16-ch single-ended or 8-ch differential or a combination of analog input12-bit A/D converter, with up to 100 kHz sampling rateOnboard programmable counterTwo 12-bit analog output channels16-ch digital input and 16-ch digital outputAutomatic channel/gain scanningOnboard FIFO memory (4,096 samples)Programmable gainBoardID™ switch
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
NI Real-Time Test Cell Reference System
780590-35
test
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
Socket Saver
4690
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The Technobox PMC Socket-Saver permits cost effective volume testing of PMC modules when used with Technobox P/N 3390 ?PMC to PCI adapter for Test.? It may also be used to reduce wear and tear on Technobox P/N 1518/1523 (?Extender/Preprocessor?).
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Product
NI HIL and Real-Time Test Software Suite
test
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Functional Test
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
Functional Test
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Mini LED Backlight Module Automatic Optical Test System
7661-K003
Test System
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Product
2-Axis Stepping And Servo Motor Control Universal PCI Card
PCI-1220U
PCI Card
Independent 2-axis motion controlHand wheel and jog function2-axis linear interpolation function2-axis circular interpolation functionContinuous interpolation functionProgrammable T/S-curve acceleration/deceleration rateUp to 4 Mpps output for each axisTwo pulse output types: CW/CCW or pulse/directionUp to 1 MHz encoder input for each axisTwo encoder pulse input types: A/B phase or up/downConstant speed controlPosition management and software limit switch functionBoardID™ switch
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Product
RSE Wireless EMC Spurious Emission
TS8996
Test System
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
FPD Tester Model
27014
Test Platform
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Product
Automotive Electronics Functional Test System
TS-5020
Functional Test
The Keysight TS-5020 Automotive Functional Test System is a low cost, scalable test system designed with “just-enough-test” concept for medium complexity electronic control modules, such TPMS, RKE and body electronic modules
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Product
FADEC/EEC Test Platform
Test Platform
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
True Concurrent Test
TestStation Duo
Test System
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
