- Advanced Telemetrics International
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Band-On Telemetry System
Advanced Telemetrics International
The ATi Band-On Telemetry System transmits real-time sensor data from a rotating shaft while the system is running. The system consists of one or more rotating signal conditioner/ transmitter modules with battery pack and a stationary receiver. Rotating transmitters are available to interface with most any type of sensor including strain gages, thermocouples, thermistors, RTDs and accelerometers.
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T3DSO4000L-HD Series Oscilloscopes
T3DSO4000L-HD Series
The Teledyne Test Tools T3DSO4000L-HD Oscilloscopes feature four and eight channel low profile models all with 12 bits of vertical resolution. With analog bandwidth options of 500 MHz, 1 GHz and 2 GHz. Each model offers a maximum sample rate of 10 GSa/s with ESR per channel, and a maximum memory depth of 500 Mpts in single channel mode. The T3DSO4000L-HD series is ideal for ATE systems as well as other automated applications.
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Training Board
The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
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FPGA PXIe High-Performance Digital I/O Card
GX3700e
The GX3700e is a user configurable, FPGA–based, 3U PXI Express card offering 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features over 45,000 logic elements and 1.836 Kb of memory. The GX3700e is supplied with an integral expansion board providing access to the FPGA’s 160 I/Os. Alternatively, users can design th...show more -
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Memory Test System
T5831/T5831ES
High-productivity tester achieves low cost-of-test by performing massive parallel testing of NAND Flash and MCPs for SSDs and mobile applications
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Flash Device Test System
MS7208
The MS7208 system can test a wide range of device families including – but not limited to – NAND flash, NOR flash, multi-level flash, multi-die flash, EEPROM, RAM, and mixed-technology memory devices.
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Stack Analysis
VerOStack
VerOStack examines the binary executable to statically determine the actual worst-case stack size. This is a precise measurement technique not influenced by particular dynamic test runs and their variance based on a particular execution path. Furthermore, it can take into account not only the current program but also other programs that will run on the target at the same time, such as other applications running on a real-time operating system (RTOS) or in combination with the RTOS itself. It can thus provide truly meaningful data on target memory requirements.
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Memory Test System
T5851/T5851ES
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Fully Automatic Colorimeter
DRK103C
Shandong Drick Instruments Co., Ltd.
(1)5 inch TFT color LCD touch screen, the operation is more humanized, new users can be mastered in a short period of time using the method.(2)Simulation of D65 lighting lighting, using CIE1964 complementary color system and CIE1976 (L*a*b*) color space color difference formula.(3)The motherboard brand new design, using the latest technology, CPU uses 32 bits ARM processor,improve the processing speed, the calculated data is more accurate and rapid electromechanical integration design, ...show more -
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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ARINC818 Cards
> ARINC818 is a specification which has become an Industry standard for the transmission of uncompressed digital video. This commercial standard uses Fibre Channel as a point-to-point communication link for low latency with the ARINC818 defining the packetized protocol for transmission of the digital video information. It is highly flexible and can be used for a variety of onboard display systems in both commercial and military applications. AIM’s ARINC818 cards use our field proven Common C...show more -
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FPGA PXI High-Performance Digital I/O Card
GX3700
The GX3700 is a user configurable, FPGA-based, 3U PXI card which offers 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features 47,500 logic elements and 2.1 kb of memory. The GX3700 is supplied with an integral expansion board providing access to the FPGA’s 160 I/Os. Alternatively, users can design their own cust...show more -
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Universal Cable/Harness Tester
LX-686
Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface,.·Up to 1500Vdc/1000Vac Test Voltage ,.·256 Max. Test Points , (Max of all series).·500 Max Files Memory,support USB or PC unlimited expansion,.·Arc detection level 0-9 ,auto prompt.·Adopted high resolution colour 640*480 TFT LCD ,.·Providing Single-End ,Multi-segment ,Standard ,and Spot test of wire..·Auto Scan and Auto Pin Search ,.·The system provides advanced instant open-circuit, short-circuit, continuity test,.·Intermitten...show more -
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Memory Burn-In Test
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Circuit Breaker Analyzers & Timers
CAT Standard Series
Circuit breakers are being tested during manufacturing, commissioning or maintenance stages. The most basic test requires timing measurement using circuit breaker timer. Their primary role is timing and motion measurement of medium and high voltage circuit breakers. Devices from CAT Standard series have suitable application in:electric power generation,distribution system,part of the electric power transmission system,contractors testing,and industrial environments.CAT Standard series meets the ...show more -
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Minirator
MR-PRO / MR2
The Minirator MR-PRO provides a full set of analog audio signals including sine wave, pink noise, white noise, delay test signal, polarity test signal, stepped sweep and continuous sine sweep. Further, a set of wav-files, useful for system optimization, is stored in the internal flash memory. Add your own personal favorites to this set.
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Installation Safety Testers
PeakTech Prüf- und Messtechnik GmbH
This innovative combination meter for testing electrical installations according to VDE 0100 convinces by its technical performance in the high-end range.With the large 3.5 "TFT color display all important safety checks as the RCD-, Voltage-, Loop-, Low-Ohm, Earth resistance and Insulation tests for annual safety-checks and newly installed systems can safely be carried out by the responsible electrical engineer.Since this new development was designed only according to the latest standards, the r...show more -
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Programmable LCR Meter
DU-6211
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 75 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Memory Test Systems
T5503HS2
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Audio Generator & Impedance Meter
MR-PRO/MR2
The Minirator MR-PRO provides a full set of analog audio signals including sine wave, pink noise, white noise, delay test signal, polarity test signal, stepped sweep and continuous sine sweep. Further, a set of wav-files, useful for system optimization, is stored in the internal flash memory. Add your own personal favorites to this set.
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope
780319-01
1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, use...show more -
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Leeb Hardness Tester
THL500
It is the highest brightness display in China showing all functions and parameters, easy read Largest screen Oled screen and operate,also can save lots of energy .the largest screen of Leeb hardness tester in China. Two hardness scale dual-display in the screen. Measuring direction in 360 and add the auto measure direction to make test easy and precision. Add four new hardness scales, HRA, HB for D impact device of alloy tool steel; HV for cast aluminum alloy. Add New user material function, to ...show more -
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Compute Express Link (CXL)
Compute Express Link (CXL) is a new high-speed CPU-to-Device and CPU-to-Memory interconnect designed to accelerate next-generation data center performance. CXL technology maintains memory coherency between the CPU memory space and memory on attached devices, which allows resource sharing for higher performance, reduced software stack complexity, and lower overall system cost. This permits users to simply focus on target workloads as opposed to the redundant memory management hardware in their accelerators. CXL is based on a PCI Express 5.0 Physical layer with speeds up to 32GT/s. Teledyne LeCroy provides protocol analysis test equipment to support development and debug of CXL based devices.
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LCRZ Tester
DU-6218
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 55 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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STANAG3910/EFEX Modules
AIM’s STANAG3910/EFEX test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with multiple processors for real time bus protocol and application support, massive memory and IRIG-B time code encoder/decoder functions are standard. The latest versions also support avionics discrete I/O. Configurations with...show more -
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Training Board
JT 2156
The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
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Memory Test System
T5830/T5830ES
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Evaluation Kit
ROM-3310 Development Kit
*Evaluation kit for ROM-3310*Lower power TI sitara AM3352 1GHz processor*On board DDR3 512MB memory / 4GB Flash*HW WDT for system protection*Supports 1 GbE, 1 USB 2.0, 1 USB 2.0 OTG, 2 CANbus, 10 GPIO, 4 UART,1 I2C, 1 I2S, 1 SPI, 1 SDIO*Cable pack & Panel included*Evaluative image & test utilities built-in
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3U PXI-E System Controller
PX32101
LinkedHope Intelligent Technologies Co.,Ltd.
PX32101 is a 3U PXI-E system controller based on the newest Intel® Haswell platform. It is designed to provide comprehensive and reliable system controller to support hybrid PXIe-based systems for multiple environments test and measurement applications.Hybrid PXIe-based systems are often required to complete independent diversified complex testing tasks on the PXI test platform. PX32101 provides rich interfaces: 4 USB2.0 / 3.0 for peripheral connectivities; UART for communication or control equi...show more -
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FPGA PXI High-Performance Digital I/O Card
GX3702
The GX3702 is a user configurable, FPGA-based, 3U PXI card which offers 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features over 45,000 logic elements and 1.836 Kb of memory. The GX3702 is supplied with an integral expansion board providing access to the FPGA's 160 I/Os and is pin for pin compatible with the N...show more -
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Data Acquisition Equipment
Get the data you want, where, how and when you want it. Fluke gives you a broad choice in data acquisition for process monitoring and laboratory test systems. You can choose a stationary or portable data logger. Transfer data to internal memory, to a removable memory card, or to your PC. Choose a standalone or distributed networked units. And you can expand your system from 20 to 1,000+ channels, depending on the series.