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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Ethernet and Fibre Channel Test Platform
SierraNet M648
The SierraNet M648 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M648 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M648 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Application Lifecycle Management Platform
ALM Studio
Kovair ALM Studio along with its integration capability provides a cohesive solution for end-to-end application lifecycle management from conception to delivery. One can use Kovair ALM Studio as a platform for creating custom business solutions or as a pre-configured, ready-to-use ALM solution.
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Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Lifecycle Services for Humidity, Dewpoint, Trace Gas or Oxygen Measurement Products from PST
Whatever your industry, your location or your measurement product, our global network of service centres with over 50 skilled service engineers will help you locally. We are committed to support you with services that are based on our technical expertise to maintain the reliability, safety and performance of your process control and measurement equipment from one of our trusted brands.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Lifecycle Management
Reliable mobility means more productive employees, more efficient operations and a better customer experience. That’s what you can expect from Stratix lifecycle management services.Our end-to-end mobile lifecycle services include managing your customer spare pool program to guarantee fast and accurately reconfigured hot-swap replacements. We provide full warranty and repair management, from initial RMA request and replacement, through spare pool replenishment.
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Lifecycle Support for Custom Product Development
The parts and components that are rooted in idea generation and product development are the ones that are most likely to succeed. Electri-Cord’s lifecycle support for the production and manufacturing of custom wiring harnesses, cable assemblies, power cords, and high-level assemblies incorporates a four-stage approach that covers the lifespan of the product. This custom product development process includes everything from design prototyping to end-of-life processes.
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Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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SOA Testing, Cloud Testing, Web Application Testing
SOAtest
Automate complete end-to-end testing for business and security-critical transactions. Parasoft SOAtest is widely recognized as the leading enterprise-grade solution for API testing and API integrity. Thoroughly test composite applications with robust support for REST and web services, plus an industry-leading 120+ protocols/message types.
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Test Fixtures & Test Sets
Keysight test fixtures are used to hold electronic components or materials (physically and electrically) in order to perform various measurements. Keysight offers a variety of test fixtures from Parametric, Dialectrice, Liquid test fixtures and more.Some of our test fixtures allow you to connect directly to your measurement instrument, while others require various adapters.
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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IEC Testing
International Electrotechnical Commission
F2 Labs can assist you in testing your electrical products to the applicable IEC standards. The IEC is the world’s leading organization for the preparation and publication of International Standards for all electrical, electronic and related technologies.
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Non-Destructive Tests
Non-destructive tests on reinforced concrete and masonry structures are the first method of investigation for verifying the real conditions of a building or structure, existing or under construction. As indicated by the anti-seismic legislation, these tests can be performed by all authorized operators.
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In-circuit Test
Medalist i1000 Systems
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Vibration Testing
Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
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Test Handler
M4841
High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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Qualification Testing
Qualification testing is an important step in evaluating how well spacecraft and launch vehicles perform under severe loading conditions that occur during launch and operation. ATA has conducted acoustic and vibration qualification testing of numerous launch vehicles and spacecraft components.
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Battery Test
1260
*Basic Battery Load Test*Battery Analysis*Mac*Test*Bad Cell Indicators*Testing the Starter Motor*Low Temperatures Effects
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Continuous Testing
Continuous testing is the practice of embedding quality through every phase of the software delivery lifecycle - from planning to production. The goal is to ensure that testing continuously reduces risk and improves application quality.
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Wafer Test
Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
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Test And Measurement
Standardized instruments used to evaluate individuals, populations, or processes.
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Transformer Testing
Measuring bridges or electronic burdens can be individually integrated into existing CT/VT test systems. Customized solutions are our core competence.
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5G Testing
Teradyne test solutions are at the forefront of the 5G test era. Why? We work with the leading semiconductor manufacturers and provide optimized test coverage for the major wireless standards. From emerging millimeter wave devices to the traditional sub-6GHz, our test solutions are already leading the way.
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Test Set
TS® 22
The TS22 Test Set’s unique built-in one-way amplified speaker provides three audio levels for hands-free listening and use with automated voice response systems. Multiple memories enable storage of nine 18 digit telephone numbers in repertory dialer (speed dialing) for easy access to test boards, the central office and other frequently called numbers. The last number redial feature eliminates the need to re-key your last entry. The TS22 Test Set offers an unbeatable combination of reliability, durability and expanded utility.
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Test System
NFC Xplorer
The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
