Measuring Microscopes
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Product
Automatic Measurement
Mylab V
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For performing automatic measured simply and easily scenario tabular to make with software such as Microsoft Excel, Mairabo V is the instrument control tool regardless of manufacturer.
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Product
Measurement
AC Selective Voltmeter
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AC Selective Voltmeter is used for measuring AC voltage coming to the input channels of ADC modules and FFT spectrum analyzers. The specific feature of the AC selective voltmeter is perfomance of voltage measurements on the main signal-carrier frequency, which allows to eliminate the harmonics influence on the readings.
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Product
Filaments for Measures
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Japan Electronic Materials Corp.
The field of filaments for measuring instruments is where our boasting processing technology of tungsten and other thin wires powerfully plays a major role.
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Product
Electrical measurements
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Instruments for measurement and analysis in accordance with the regulations of single / triphasic low voltage networks and data networks via cable or fibre.
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Product
High Quality Digital Benchtop Microscope
D SCOPE
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This unique microscope combines high quality optics with a modern and ergonomic design ideally suited to fiber optic applications. Until the D Scope, most microscopes were suffering from poor illumination quality yielding variable and non-reproducible image quality even amongst scopes of the same kind.
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Product
Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Product
Cleanliness Inspection System / Microscope
CIX90
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The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.
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Product
Heating Microscope
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Heating microscopy is a non-contact technique that, based upon an advanced image analysis of a specimen subjected to a thermal treatment reproducing industrial firing conditions, identifies several characteristic shapes and related temperatures key to the optimization of manufacturing processes in ceramics, metals, and alloys.
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Product
Deep Ultraviolet Observation System for Microscope
U-UVF248
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Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
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Product
PXIe Source/Measure Unit, 15 MSa/s, 1 PA, 60 V, 3.5 A DC/10.5 A Pulse
M9602A
Source Measure Unit
The Keysight M9602A is a PXIe SMU featuring best-in-their-class narrow pulse width as narrow as 10 μs. It enables dynamic/pulsed measurements with up to 15 MSa/s for broad emerging applications such as VCSEL optical devices.
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Product
Inverted Light Microscopes
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Inverted microscopes from Leica Microsystems are designed to meet the rigorous demands of life science as well as material science and industrial applications.
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Product
Testing and Measurement
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AkroMetrix provides a variety of products to help you identify and evaluate warpage: For warpage measurements along a production line or at room temperature, AkroMetrix has developed the LineMoiré Production Level Automated Flatness Inspection System. If you need to measure warpage and flatness during pre-defined temperature profiles, AkroMetrix's TherMoiré In-Process Warpage Measurement Systems may fit your requirements.
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Product
Inline Measurement
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X-Rite's inline solutions increase efficiency, reduce waste, and make life easier for production operators and quality controllers. It's a continuous monitoring system that can catch even small deviations immediately, so changes can be made before production moves out of tolerance. X-Rite offers inline solutions for all stages of paper manufacturing, as well as for the coil coating, plastics, coated glass, textile, and automotive industries. Inline systems are turn-key and have a very quick ROI.
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Product
Test & Measurement
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High-performance surface and dimensional analysis tools for industry and researchers
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Product
Ultrasound Measurements
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Is sound waves with frequencies higher than the upper audible limit of human hearing. Ultrasound is no different from 'normal' (audible) sound in its physical properties, except in that humans cannot hear it. Ultrasound devices operate with frequencies from 20 kHz up to several gigahertz.Ultrasonic devices are used to detect objects and measure distances. Ultrasound imaging or sonography is often used in medicine. In the nondestructive testing of products and structures, ultrasound is used to detect invisible flaws.
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Product
Stability Measurement
Rancimat
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Instrument for determining the oxidation stability of natural oils and fats.
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Product
Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
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"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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Product
Atomic Force Microscope
LensAFM
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The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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Product
Industrial Microscope Solutions
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Industrial microscopes are a vital tool used for measuring, quality control, inspection, and in soldering and manufacturing. Each industrial microscope we offer uses complex designs that provide unique solutions for the inspection process and aim to improve resolution and sample contrast.
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Product
Measuring Arms
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Among the highly ergonomic and portable scanning and probing solutions that QFP offers are the KREON arms , a range of tools capable of operating on different working volumes (approximately from 2 meters with the ACE 6-20 model to 4.5 meters with the ACE 6-45 model) applicable in different sectors.
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Product
Measurement Systems
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Systems used in the process of associating numbers with physical quantities and phenomena.
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Product
Stereo Microscopes & Macroscopes
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Leica Microsystems offers customized stereo microscopes for research, industry and education. Our macroscopes for industry, medicine and research offer exceptional optics and ultra convenient operation. Stereo microscopes and macroscopes from Leica enable you to view, analyze and document your specimens in two and three dimensions for any application.
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Product
Scanning Electron Microscope
E5620
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The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Product
Measuring Instruments
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Since acquiring the Kimo and E Instruments brands, we have added a comprehensive range of measurement instruments to the Sauermann product portfolio. These instruments are designed to monitor indoor air quality (IAQ) and combustion gas machines during installation and maintenance operations by measuring concentrations of gases and other substances in the air.
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Product
Measuring Amplifiers
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Smart force measurement with a parameterizable measurement amplifier.
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Product
Microscope
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Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Product
Measuring Management
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Our test equipment is more than a test-set with a screen. Our application software provides an integrated tool to easily store the measurements at different stages and create a log of what we have done. Each measurement stores all data and settings, including display, markers and calibration.
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Product
Microscope Imaging Software
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Microscope imaging software from Leica Microsystems combines microscope, digital camera and accessories into one fully integrated solution.
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Product
Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
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The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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Product
AFM (Atomic Force Microscope) Optical Platform
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The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
