Measuring Microscopes
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Product
Measurement
Site VSWR
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The Site VSWR measurement is done according to CISPR 16-1-4 in the frequency range from 1 GHz to 18 GHz using broadband omni directional antennas in horizontal and vertical polarisation. The volumetric test method is applied (test volume needs to be specified), test distance 3 m - any other distance upon request. The ground plane has to be covered with absorbing material.
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Current-Voltage Measurement System
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The SSIVT is an electrical current-voltage measurement system used to characterize photovoltaic cell performance. This current-voltage tester works by sampling various current versus voltage combinations of the photovoltaic cell with a variable impedence load. The performance of the photovoltaic cell is determined by measuring this output I-V relationship while it is being illuminated.
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Measurement Sensors
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High accuracy and measurement stability, at an affordable price. The laser sensor offers best in class performance for accuracy and speed for all linear displacement applications. Utilising an advanced image sensor, high measurement stability is achieved, even on the most challenging of surfaces.
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Multiphoton Laser Scanning Microscope
FVMPE-RS
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The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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Product
Measurement
AC Voltmeter
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AC Voltmeter is used for measuring AC voltage. The software is capable of switching measurement modes (RMS or amplitude), but regardless of the selected mode the information about the current peak value is always displayed.
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Product
Precision Source / Measure Unit (1 Ch, 100 FA)
B2901B
Source Measure Unit
The Keysight B2901B precision source / measure unit (SMU) is a 1-channel, compact, and cost-effective benchtop SMU with the capability to source and measure both voltage and current. It easily measures current versus voltage (I/V) with high accuracy. The 4-quadrant source and measurement capabilities enable taking I/V measurements without configuring multiple instruments.
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Product
Spectroradiometers For LED/Laser Measurements
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Spectroradiometers for measuring white light and color LEDs, UV LEDs and NIR LEDs in CW and pulse mode. Measurement of Laser and VCSEL. Portable and fixed installation instruments for photometric, radiometric, colorimetric and flicker measurements.
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Product
Vision Measuring System
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CNC Vision Measuring System. Supporting non-contact and contact hybridContact measurement of detailed shape is achieved by extra small stylus with minimum diameter of 15um
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Product
Temperature Controlled Microscope Stages
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Your product descripThere are various version options for this stage, including pressure, vacuum, electrical sample measurement and sample holders to mount the stage vertically in IR or xray spectrometers.tion goes here.
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Product
MEASUREMENT QUALITY JUMPERS
4000-1065
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This kit includes two (2) Singlemode Enhanced MQJs (ST-to-Socket, 1 meter, SinglemodeEnhanced), two (2) Singlemode Enhanced MQJs (ST-to-Pin, 1 meter, SinglemodeEnhanced), two (2) Multimode MQJs (ST-to-Socket, 1 meter, Multimode), two (2)Multimode MQJs (ST-to-Pin, 1 meter, Multimode), two Snap Lock Plugs, and two SnapLock Receptacles.
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Product
Measurement and Analytics Solutions
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Based on our OTP² system platform, we were able to implement a family of scalable test systems which is based on a common systems architecture, e. g. for products in the area of chemical analytics measurement. We not only implemented a universal, extremely comprehensive test system, but also a series of compact systems for benchtop placement which are fully compatible with the larger, universal system. Our specialized self-test adapters and test software enable fast verification of the test systems as well as partly automated calibration by the customer.Our systems are also used in electrical measurement applications, e. g. for calibrating analog input assemblies for PLC technology. For this purpose, specialized calibrators are integrated into the system; they provide traceable calibration of the relevant stimulus signals.
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Vibration Measurement Tools
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SKF Condition Monitoring Center
Abnormal vibrations are often the first indication of a potential machine failure. Conditions that can cause these vibrations include unbalance, misalignment, looseness of parts, deteriorating rolling element bearing and gear damage. Vibration analysis instruments and systems can help detect many serious problems at an early stage, allowing personnel to undertake remedial work in a timely manner.
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Product
Mobile Measuring System
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For the purpose of oscillations period determination, there is used an indirect measuring method, which registers oscillation processes in three mutually transverse axes. As a result of measurements, one can obtain oscillations period values and corresponding decrement values for each of the axes.
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PV Measurements System
PH-IQE200
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PV Measurements offers to combine a Spectral Response/QE/IPCE system with an I-V system into one compact measurement system. Depending upon the configuration required for your devices,it may share a test fixture.This reduces overall system cost.
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Product
Light Sheet Microscopes
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Life science research can place high demands on your imaging capabilities: Sometimes you need to image whole living model organisms, tissues and cells as they develop. Or you may want to observe subcellular dynamics in living samples over hours and even days. Light sheet fluorescence microscopy (LSFM) with its unique illumination principle is ideal for fast and gentle imaging of such specimens.
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Product
Peak Power Measurement
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Directly measure the instantaneous peak power level of a pulse modulated signal. Use the "sample delay" function to set the desired measurement point on the waveform. And an external scope can be used to view the profile and see the exact measurement point on the pulse.
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Product
Filaments for Measures
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Japan Electronic Materials Corp.
The field of filaments for measuring instruments is where our boasting processing technology of tungsten and other thin wires powerfully plays a major role.
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Sensors for Contour Measurement
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Leuze electronic GmbH + Co. KG
The CMS 700i 3D contour measurement system detects the length, width, height, deformations and position of any objects as they pass by, independent of their shape and surface. Even polybags are reliably detected. The complete system includes all components for operation and installation under one part number. In contrast, light section sensors record a height profile along a projected laser line. This allows objects to be detected with high resolution in multiple dimensions. The integrated functions range from presence control to edge measurement and 3D object measurement.
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Measuring, Controlling, Regulating
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Provides precision devices and systems for measuring, controlling, and regulating electrical quantities, energy flows, and physical parameters in industrial, medical, and energy sectors.
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Product
Modular Infinity Microscope (MIM)
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30mm diameter coupling to the I.D. of the C60-TUBE, or with a 50mm coupling on the O.D. of the lens tube.
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High-Resolution Scanning Probe Microscope (SPM)
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High-Resolution Scanning Probe Microscope (SPM)
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Product
Products for High-Frequency Measurement
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This product range includes passive high-frequency test probes and accessories as well as touch-protected BNC plug connectors, insulated BNC panel-mount sockets, leads with RG58 or RG59 cable, adapters and converters. Our test probes are suitable for use in CAT III- and CAT IV environments (Measurement Categories), such as the analysis of house and building installations with mains analysis/mains monitoring devices. Our high-frequency accessories are designed with clearance and creepage distances in accordance with IEC/EN 61010-031.
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Temperature & Velocity Measurement
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Advanced Thermal Solutions, Inc.
Highly Accurate Instruments for Measuring Temperature & Air Velocity of Electronic Devices.
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Digital Microscopes
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Great for capturing and sharing digital information with anyone, anywhere, digital microscopes by Vision Engineering are built with quality to last a lifetime. Powerful and easy to use, their versatile, operator-friendly design means they can be repurposed as your needs change, protecting your return on investment.
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Stereo Microscopes & Macroscopes
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Leica Microsystems offers customized stereo microscopes for research, industry and education. Our macroscopes for industry, medicine and research offer exceptional optics and ultra convenient operation. Stereo microscopes and macroscopes from Leica enable you to view, analyze and document your specimens in two and three dimensions for any application.
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Precision Measurement System
OmniMic V2
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Updated software and improved hardwareCompact, portable, accurate, affordableIntuitive software—open the box, start testing in minutesPerfect for setting up home theater systemsOptimized for use with netbooks and laptopsAccurate response down to 5 Hz, fully calibrated, includes FRD fileFor professionals and hobbyists—design and tune speaker systems and arrays
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Atomic Force Microscope
Flex-Mount
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Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM.
