Measuring Microscopes
-
Product
DFB Laser Source Module
LaserPXIe 1200 Series
Source Measure Unit
The LaserPXIe 1200 Series is a highly customizable DFB laser source available in a wide range of wavelengths and powers.
-
Product
PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit
782435-01
Source Measure Unit
PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
-
Product
PXIe-4137, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit
783761-02
Source Measure Unit
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers
-
Product
Source Measurement Unit
PEMU4
Source Measure Unit
The PEMU4 represents a new level of performance and capabilities for USB-based SMU (Source MeasurementUnit) instrumentation. The PEMU4 supports -1V to +6.5V 0.5A with FVMI, FVMV, FIMV, FIMI modes. 4 channel can be ganged to support high current driving. I2C/SPI/RFFE function for serial port device testing. 4 Counter for frequency measurement.
-
Product
USB Modular Source Measure Unit
U2722A
Source Measure Unit
The U2722A USB Modular Source Measure Unit is a 3-channel 20V/120mA that can operate in a 4-quadrant operation. The channels could be connected in series or in parallel to achieve up to 60 V/360 mA. It uses the common non-proprietary standard high-speed USB 2.0 interface that provides ease of connectivity allowing users to set up and configure their tests swiftly with its plug and play feature.
-
Product
PXIe-4144, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit
782432-01
Source Measure Unit
PXIe, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit - The PXIe-4144 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4144 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
-
Product
PXIe Measurement Accelerator
M9451A
Measurement Accelerator
The M9451A PXIe Measurement Accelerator combined with Option DPD Digital Pre-Distortion & Envelope Tracking Gateware shows what is possible when you combine state of the art FPGA's with Keysight's trusted measurement expertise and PXIe's high speed data handling. As part of Keysight's RF PA/FEM Characterization & Test, Reference Solution, this combination provides unprecedented performance for demanding envelope tracking and digital pre-distortion measurements required for testing modern power amplifiers (PAs) and front-end modules (FEMs). Hardware acceleration provides better than 20x speed improvement over Keysight's previous host-based Reference Solution, with closed/open loop digital pre-distortion (DPD) and envelope tracking (ET) measurements taking just tens of milliseconds and overall measurement times less than 70 ms.
-
Product
PXIe-4142, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit
782430-01
Source Measure Unit
PXIe, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit - The PXIe-4142 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4142 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
-
Product
Two-Quadrant SMU For Battery Drain Analysis, 20 V
N6781A
Source Measure Unit
The Keysight N6781A is a source / measure unit (SMU) designed specifically for the task of battery drain analysis. Whether the device under test (DUT) is an eBook reader, MP3 player, mobile phone, or pacemaker, the N6781A’s seamless measurement ranging, programmable output resistance, and auxiliary DVM combine the best set of advanced features on the market for battery drain analysis. When used with the 14585A Control and Analysis software, the N6781A becomes an even more powerful battery drain analysis solution, offering additional insights into your measurements. Learn more about the 14585A Control and Analysis software.
-
Product
50 µs Pulse Medium Current Source/Measure Unit (MCSMU)
B1514A
Source Measure Unit
The 50 s Pulse Medium Current SMU is an SMU designed for faster pulsed IV measurement. It enables a pulsed measurement down to 50 s pulse width, a 10 times or more narrow pulsed measurement than provided by a comparable conventional SMU. In addition, the instrument offers a wider range and versatility, up to 30 V / 1A, with voltage/current programmability. It is useful to characterize high to medium power devices on the new materials such as SiC and GaN, and organic devices, and the MCSMU expands your choices of pulsed IV measurement.
-
Product
PXI Isolated Single Channel Voltage/Current Source, 100V
M9186A
Source Measure Unit
The V/I source lets you source a voltage and measure the resultant current, or source a current and measure the resultant voltage. It consist of two separate amplifiers, denoted "low" and "high" that share a common output connection. The "low" amplifier provides voltages in the range of 16 volts at up to 200ma and the "high" amplifier provides voltages in the range of 100V at up to 20mA.
-
Product
PXIe-4139, ±60 V, ±3 A DC, ±10 A Pulsed, 20 W DC, 100 fA Precision System PXI Source Measure Unit
782856-02
Source Measure Unit
PXIe, ±60 V, ±3 A DC, ±10 A Pulsed, 20 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4139 is a high-precision, system source measure unit (SMU) that features 4-quadrant operation and sources up to 20 W of DC power. This module features analog-to-digital … converters that help you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. You can use the PXIe-4139 for applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
-
Product
Source/Measure Unit for Functional Test, Multiple Ranges, 80 W, Double-wide
N6786A
Source Measure Unit
Only Keysight`s N6780 Series SMUs let you visualize current drain from nA to A in one pass and one picture unlocking insights to deliver exceptional battery life.
-
Product
4-Quadrant General-Purpose Source/Measure Unit, ±20 V, ±1 A Or ±6 V, ±3 A, 20 W
N6784A
Source Measure Unit
The Keysight N6784A is a source/measure unit (SMU) designed for general-purpose precision sourcing and measurement. General-purpose applications can span many different industries and many different devices under test (DUTs). The N6784A SMU is a versatile tool designed to tackle many of these general-purpose applications. Its glitch-free operation ensures safe usage with the DUT during output and measurement range changes, even with capacitances of up to 150 µF. Its 4-quadrant operation enables it to act as a bipolar power supply or a bipolar electronic load, for added versatility. When using the N6784A SMU, engineers can be confident that they have an all-around general-purpose tool for their test systems or lab bench.
-
Product
High-Speed Precision SMU (100 FA, 60 V, 15 MSa/s)
PZ2121A
Source Measure Unit
The Keysight PZ2121A is a high-speed precision source / measure unit (SMU) featuring best-in-industry narrow-pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices, integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.
-
Product
PXIe-4135, PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit
783762-02
Source Measure Unit
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
-
Product
3D Measuring Laser Microscope
LEXT OLS5000
-
The OLS5000 laser confocal microscope precisely measures shape and surface roughness at the submicron level. Data acquisition that's four times faster than our previous model delivers a significant boost to productivity. Measure samples that are up to 210 mm tall. Capture the shape of any surface. Total magnification: 54x - 17,280x
-
Product
Microscope
-
Shanghai Selon Scientific Instrument Co. Ltd.
An optical instrument used for viewing very small objects, such as mineral samples or animal or plant cells, typically magnified several hundred times.
-
Product
High-Resolution Precision SMU (10 FA, 210 V)
PZ2110A
Source Measure Unit
The Keysight PZ2110A is a precision source / measure unit (SMU) that expands precise measurements from conventional static measurements and pulsed measurements, to fast dynamic measurements. It is ideal for a wide variety of current versus voltage (IV) measurement tasks that require both high resolution and accuracy. The PZ2110A can accurately perform characterization, parametric tests, and reliability tests of semiconductors, active / passive components, and general electronic devices.
-
Product
Microscopes
-
Probing Solutions offers Microscopes made by Azoom, Excelitas, Meiji, Leica, Mitutoyo, and Motic. To order Microscopes, please call PSI at (775) 246-0999, or email sales@probingsolutions.com for a quote.
-
Product
Precision Source / Measure Unit (2 Ch, 100 FA)
B2902B
Source Measure Unit
The Keysight B2902B precision source / measure unit (SMU) is a 2-channel, compact, and cost-effective benchtop SMU with the capability to source and measure both voltage and current. It easily measures current versus voltage (I/V) with high accuracy. The 4-quadrant source and measurement capabilities enable taking I/V measurements without configuring multiple instruments.
-
Product
Microscopes
-
Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
-
Product
Confocal Microscopes
-
Our confocal microscopes for top-class biomedical research provide imaging precision for subcellular structures and dynamic processes.
-
Product
High-Speed Precision SMU (100 FA, 60 V, 1 MSa/s)
PZ2120A
Source Measure Unit
The Keysight PZ2120A is a cost-effective, high-speed precision source / measure unit (SMU) featuring best-in-class narrow pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices and integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.
-
Product
Infrared Microscope
DDR200 & DDR300
-
The McBain DDR200 and DDR300 for 200mm and 300mm wafer defect detection and review are unmatched in value and features in this special application and price category. The systems offer significant and unique advantages for both production and engineering use, and provide an ideal solution when both defect detection and dimensional metrology are required.
-
Product
Digital Microscopes
-
Digital microscopes are microscopes without eyepieces. A digital camera acts as a detector. Images are displayed on a screen or monitor, turning the microscopy workstation into an ergonomic digital workplace.
-
Product
Confocal Raman Microscope
LabRAM HR Evolution
-
The LabRAM HR Evolution Raman microscopes are ideally suited for both micro and macro measurements, and offer advanced confocal imaging capabilities in 2D and 3D. The true confocal Raman microscope enables the most detailed images and analyses to be obtained with speed and confidence. With guaranteed high performance and intuitive simplicity, the LabRAM HR Evolution is the ultimate instrument for Raman spectroscopy. They are widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
-
Product
Electron Microscope Analyzer
QUANTAX FlatQUAD
-
QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
-
Product
Fluorescence Microscopes
-
Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology. Our confocal systems enable cell biologists to study function and structure using live-cell imaging in cell cultures and invertebrate model organisms at speeds and durations previously not possible. Bruker’s super-resolution microscopes are setting new standards with quantitative single molecule localization which allows for the direct investigation of the molecular positions and distribution of proteins within the cellular environment. Our latest addition, Luxendo light-sheet microscopes, are revolutionizing long-term studies in developmental biology and investigation of dynamic processes in cell culture and small animal models.
-
Product
Atomic Force Microscope
XE-PTR
-
Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the PTR Series is the metrology tool of choice for Slider manufacturers to improve their overall production yield.
