Showing results: 76 - 90 of 182 items found.
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VAXE -
Elmika
The VAXE Variable Attenuators are waveguide components for tunable signal leveling or reflection compensation in waveguide networks. The Attenuators consist of waveguide section with a resistive film evaporated on the mica surface. The Attenuators has 0 ÷30 dB minimum attenuation range. The VAXE Attenuators are available in four waveguide bands between 33 GHz and 170 GHz.
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RMS 1200 -
Instrument Systems Optische Messtechnik GmbH
The RMS 1200 from the Optronik line from Instrument Systems measures the back reflection of retroreflectors of all kinds in the automotive field and other retroreflecting materials. High-precision measurements are made in accordance with CIE Publication 54.2-2001 and reliably fulfil all current requirements, e.g. ECE R3, SAE J594, ISO-EN-DIN 20471 or DIN 67520.
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FilmTek 2000 SE -
Scientific Computing International
Benchtop metrology system delivering unmatched measurement performance, versatility, and speed for unpatterned thin to thick film applications. Ideally suited for academic and R&D settings. Combines spectroscopic rotating compensator ellipsometry, multi-angle polarized spectroscopic reflection, and intuitive material modeling software to make even the most demanding of measurement tasks simple and reliable.
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Element -
Onto Innovation
The Element system is the tool of record for wafer suppliers for high speed impurity mapping and epi thickness measurement. It is the only tool on the market with the unique combination of transmission and reflection based technology. This system is the industry standard for dielectric monitoring.
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778572-45 -
NI
2.7 GHz, 50 Ω, Terminated 4x1 PXI RF Multiplexer Switch Module—The PXI‑2545 is an RF signal multiplexer switch module. The internal termination of the PXI‑2545, which helps prevent high-power reflections that arise from open channels on the module, makes it ideal for use in RF applications where such reflections can damage the source. The module also provides excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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SH-TR300 -
Shenzhen Sharingtek Communication Co., LTD
Determine fiber optic cable or fiber optic’s failure point, connection point, breakpoint position -Describe fiber optic cable or fiber’s loss distribution curve, measure cable, fiber’s length and the loss, attenuation coefficient between two points-Measure fiber optic cable, optical fiber connector’s insertion loss-Measure fiber optic cable, optical fiber’s reflection loss
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TAC-L -
Dwyer Instruments Inc.
Model TAC-L Portable Digital Tachometer measures rotational speed either by contacting a rotatable head to the shaft of the object, or using photo sensor to detect the reflections from the laser. The laser target can record from a distance of up to 20 inches and gives a more accurate measurement than LED targeting. Model TAC-L includes a large LCD with a backlight for use in dark areas.
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778572-55 -
NI
2.5 GHz, 75 Ω, Terminated 4x1 PXI RF Multiplexer Switch Module—The PXI‑2555 is an RF signal multiplexer switch module. The internal termination of the PXI‑2555, which helps prevent high-power reflections that arise from open channels on the module, makes it ideal for use in video RF applications where such reflections can damage the source. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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7505-01 -
Chroma ATE Inc.
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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TR7007 -
Test Research, Inc.
The TR7007 ultra-high-speed 3D Solder Paste Inspection adopts the Fringe Pattern Technology and dual light source, can solve the shadow and reflection problem simultaneously. It is equipped with a linear motor and linear scale that provides a highly accurate X-Y Table system.
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Materials Analysis Technology Inc.
Optical microscopy is used to display the surface morphology of samples by 2D intensity contrast due to deflection and reflection of visible light shined on areas of interest. Its resolution is about half of the incident wavelength, which is ~0.2 μm for visible light (wavelength of 400-700 nm). Such resolution limits the maximum magnification to X1000, and thus optical microscopy provides preliminary inspection of sample surface structure.
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SpectraRay/4 -
SENTECH Instruments GmbH.
SpectraRay/4, the SENTECH proprietary spectroscopic ellipsometry software, includes data acquisition, modeling, fitting, and extended reporting of ellipsometric, reflection, and transmission data. It supports variable angle, multi-experiment, and combined photometric measurements. SpectraRay/4 includes a huge library of materials data based on SENTECH thickness measurements and literature data as well. The large number of dispersion models allows modeling of nearly any type of material.
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GAO Tek Inc.
Gloss meters are used devices designed for measuring the specular reflection gloss of a surface. The gloss is determined by the measuring of the amount of reflected light at an equal, but opposite angle from the light beam. The quantity of light is determined by shining light from a defined angle at a surface and then measuring the light opposite the source of light at the same angle. The measurement is then compared to a standard. The most common angle for measurement is 60°.
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Tektronix, Inc.
Verification and debug of today's high speed, low voltage digital signals requires probing solutions that can accurately acquire from a wide variety of electronic designs and protect signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection of your design's performance. Compare and learn more about Tektronix logic analyzer probe solutions.
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NuVant Systems, Inc.
The spectroelectrochemical cell enables acquisition of infrared and Raman spectra of working electrode discs (variable sizes, up to 10 mm OD) under flowing solution. Working electrodes available include: Pt, Au, Ag, Cu, glassy carbon, etc. The cell uses a Pt-wire counter electrode and a Ag/AgCl reference electrode. For use with the EZpump peristaltic pump. Adapts to the Harrick Praying MantisTM Diffuse Reflection Accessory.