Showing results: 1 - 15 of 180 items found.
-
RC-088 -
Rinch Industrial Co.,Limited
This instrument is a special equipment for measuring the reflectivity of rearview mirror (or similar product) of motor vehicle. The product composes intelligent measuring instruments, optical integrating sphere, parallel lamp, standard light source, constant current source etc. It is easy to operate,it can measure the reflectivity quickly and accurately. On instrument structure, it adopts standardized modulation design. It takes latest single chip as its digital central processing element. After the measuring signal is converted by modulus, CPU will do some computation and compensation. The instrument can display the reflectivity of device which is measured in rear time. It operates simply and quickly, the indication is direct and accurate. It’s good for quality examination &control in the production scene as well as laboratories. This product has the convenience &quick demarcation way, can meet requirement of different occasion. It is applicable for measuring light reflection on mirror and not mirror parts.
-
Bunkoukeiki Co., Ltd
Measure spectral transmittance and reflectance of optical elements such as lens, plate glass, filter, reflector, prism and so on.The wavelength range is 350 to 1100 nm as standard and 220 to 2000 nm as an option.Reflection measurement of a general spectrophotometer can only measure several types of fixed angles, but in this device the incident angle of the sample at the time of reflectance measurement is variable at an arbitrary angle and the minimum incident angle at reflectance measurement is 15 ° ( Optical axis angle 30 °) can be set up.
-
WZG-24B -
Langeo Co., Ltd.
Based on WZG-24 engineering seismograph, WZG-24B 24 channels Engineering Seismograph is developed as a 24bit instrument under Chinese/English version WINDOWS operating system. With years of designing and manufacture experiences, and accepting latest electronic technologies and design ideas, WZG-24B features multi-function, high accuracy, high speed, reliable data and good expandability.
-
FilmTek 3000 PAR -
Scientific Computing International
Metrology system with a 50µm spot that delivers high-performance transmission and reflection measurement of patterned films deposited on transparent substrates. Ideally suited for measuring the thickness and optical constants of very thin absorbing films.
-
Rigaku Corp.
Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
-
Evans Analytical Group®
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
-
Reflection -
Neaspec GmbH
Reflective AFM-tip illuminationDetection optimized for high-performance near-field imagingEnables optical amplitude and phase resolved near field measurementsNear-field spectroscopy possible via sequential imaging (Requires tunable illumination unit)Patented background-free detection technologySuited for visible & infrared wavelength range (0.5 20 m)Version for infrared & THz wavelength range (5 300 m) availableSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
-
Land Vertical Geophones 40 Hz Vert. -
PASI srl
For seismic reflection investigations
-
Konica Minolta Sensing Americas, Inc
Gloss meters measure specular reflection or gloss of a surface (Specular reflection describes how a reflective surface such as a mirror reflects light waves from its surface). Specular reflection is directly related to the ratio of incident light (the light that falls on an object) and reflected light (the light that bounces off an object) and is the basis for standardizing and measuring gloss values.
-
Kontron
Hartmann Electronic’s cPCI 3U RA Series features a sleek board design based on High Speed Design concept with exceptionally low-level reflection. The featured reflection levels are achieved by means of uniform signal surge impedance.
-
MicrOBS -
Sercel Group
MicrOBSNT is an ocean bottom node solution for seismic refraction and reflection surveys.
-
ERAVANT
A device used to reduce power levels of a signal by a fixed amount with little or no reflections
-
ERAVANT
Is used to adjust power, reduce reflection interaction, and provide isolation where needed.
-
Bruker Nano Surfaces
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
-
Bruker microCT
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.