Reference Standards
See Also: References, Reference Antennas, Reference Decoders, Reference Jumpers, Reference Sources, Reference Transformers, Reference Transmitters, Acoustical References, Frequency References, Solar Reference Cells
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Product
Standard 1.10 (31.00) - 3.85 (109.00)General Purpose Probe
SPA-64-3
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3: 0,365″; Tip 8: 0,385″; Tip ,9,10: 0,363″
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Product
Standard 2.00 (57.00) - 4.00 (113.00) General Purpose Probe
P2757G-3W1S
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Current Rating (Amps): 20Average DC Resistance lower than (mOhm): 10Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,210Overall Length (mm): 30.73Overall Length Remark: Tip 2C: 1140 mil (28.96 mm) Tip 1W: 1205 mil (30.61 mm) Tip 2W: 1205 mil (30.61 mm)
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Product
Open Network Standards
ControlNet
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ControlNet is one of three open network standards (DeviceNet, ControlNet and EtherNet/IP), all of which use a common application layer, the "Common Industrial Protocol" (CIP). The Family of CIP Networks is specified and published by ODVA (Open DeviceNet Vendor Association - http://www.odva.org) and CI (ControlNet International - http://www.controlnet.org).
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Product
Standard Climatic Test Chamber(Environmental Chamber)
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Guangdong Test EQ Equipment co., Ltd.
Primarily used for accelerated damp heat testing, alternating damp heat testing, constant humidity testing, as well as high/low temperature routine testing, cold resistance testing, low-temperature storage, and adaptability testing under rapid or gradual temperature changes in industries such as aviation, aerospace, electronics, instrumentation, electrical products, materials, components, equipment, and complete machines. It is particularly suitable for Environmental Stress Screening (ESS) testing of electrical and electronic products or for enhancing production efficiency. It enables analysis and evaluation of performance and behavior under simulated environmental conditions.
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Product
ETX® Reference Carrier Board in ATX Form Factor
ETX-Proto
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The ETX-Proto is an ETX Reference Carrier Board in standard ATX form factor. Together with the ETX module of your choice and off-the-shelf add-on cards, you can quickly emulate the functionality of your desired end product for software development and hardware verification. The ETX concept has a great many advantages over full custom designs. It reduces engineering complexity, lowers the threshold for total project quantity and last but not least brings your product to the market in no time.
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Product
Standard 1.10 (31.00) - 2.50 (71.00) General Purpose Probe
HPA-1C
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Product
Reference Measuring System
SMG-R
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Reference peak voltage meter SMG-R for precise measurement of high voltage. This PEAK voltmeter has higher accuracy and the measuring divider has a very high stability.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1J-4-S
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25T36-4
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard Probe Station Chucks & Accessories
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In this test solutions section of our website we describe the expanding line of Abet PV IV probe stations for the growing variety of solar cell types and sizes being developed around the world. This page describes a line of vacuum chucks and accessories for top/bottom, top/top, and bottom/bottom solar cells from 3 x 3 mm to 300 x 300 mm. Probe stations for multiple device on a single substrate and multifunction probe stations are described further in the sections highlighted to the left of this page.
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Product
Standard 1.02 (29.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-62J-4
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 0.79 (23.40) - 1.75 (49.60) General Purpose Probe
HPA-40J
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Current Rating (Amps): 2Average Probe Resistance (mOhm): 35Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 660Overall Length (mm): 16.76
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Product
Standards Reference for Test Systems PXI Card
GX1034
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The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system's source and measure baseband instrumentation resulting in simplified support / maintenance logistics and improved system availability.
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Product
Rubidium Reference Oscillator
VCH-210
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The rubidium reference generator VCH-210 is designed to generate a highly stable reference and clock signal.
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Product
Software Development Standards Compliance Solution
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The most comprehensive development compliance solution; FDA, DO-178B/C, MISRA, JSF, PCI-DSS, ISO, IEC, and more. ntegrate compliance policies into the SDLC and team workflow. Accurately and consistently automate verification and validation tasks
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1T-4
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.10 (31.00) - 2.50 (71.00) General Purpose Probe
HPA-1T
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Product
Standard Emission Monitoring System
CEMS-2000
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CEMS-2000 is a multi-gas monitoring system aimed to continuously and reliably measure emissions from various industrial combustions. The adoption of the hot-wet extractive method avoids the loss of content during sampling. The system is extendable with additional parameters upon request. All output signals proceed through the data acquisition system and then upload to the DCS or environmental authority server.
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Product
Vector Network Analyzer (VNA) Simulator – Standard
S94050B
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S94050B puts flexible S-parameter analysis into your own computer. Dive deeper into measurements captured on a network analyzer or develop and optimize test programs before deploying them onto an instrument.
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Product
Ultra Low Noise Disciplined Frequency 4220a Standard with Rubidium and OCXO Clean-Up Oscillator
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Precise Time and Frequency, Inc.
The ptf 4220A is an Ultra Low Noise Disciplined Frequency Standard with rubidium and OCXO clean-up oscillator.The instrument contains a high performance rubidium module, with an extended life design, and very low aging rate, with high quality OCXO o/p for low phase noise.
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Standard 0.50 (14.00) - 2.00 (57.00) Non Replaceable General Purpose Probe
A-A-S-C
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Current Rating (Amps): 2Average DC Resistance lower than (mOhm): 30Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 30Full Travel (mm): 0.76Recommended Travel (mil): 20Recommended Travel (mm): 0.51Overall Length (mil): 310Overall Length (mm): 7.87Rec. Mounting Hole Size (mil): 31.5Rec. Mounting Hole Size (mm): 0.80Recommended Drill Size: #68 or 0.79 mm
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Product
Standard Voltage 9 Pin D-Type Cables - Connector to Connector for Pickering Products
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The connector to connector cable assemblies below are suitable to use with Pickering cards and modules that utilize a standard voltage 9-pin D-type connector.
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Standard 3.00 (85.00) - 6.00 (170.00) Non Replaceable General Purpose Probe
G-S-R
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Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 780Overall Length (mm): 19.81Rec. Mounting Hole Size (mil): 86Rec. Mounting Hole Size (mm): 2.18Recommended Drill Size: #44
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Product
Standard 2.00 (57.00) - 4.00 (113.00) General Purpose Probe
P2757G-1W1S
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Current Rating (Amps): 20Average DC Resistance lower than (mOhm): 10Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,210Overall Length (mm): 30.73Overall Length Remark: Tip 2C: 1140 mil (28.96 mm) Tip 1W: 1205 mil (30.61 mm) Tip 2W: 1205 mil (30.61 mm)
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Standard 1.53 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-72J-4
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Standard 0.79 (23.40) - 1.75 (49.60) High Frequency Probe
CSP-40A-024
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Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Recommended Travel (mil): 133Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,231Overall Length (mm): 31.28Full Travel Remark: Shield: 225 (5.72) including travel of probes
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Standard 2.40 (68.00) - 6.20 (176.00) Battery Probe
BIP-8
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 30Test Center (mil): 188Test Center (mm): 4.78Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 60Recommended Travel (mm): 1.52Overall Length (mil): 396Overall Length (mm): 10.06
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Product
Reference Oscillator
REF Series 1.5” x 1.5” x 0.6”
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*Connectorized Package *Free Running *Low Phase Noise *Output Power to +12 dBm Available
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Product
NI Real-Time Test Cell Reference System
778820-35
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DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
