Integration
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Phase Detectors
Macom Technology Solutions Holdings Inc.
MACOM's MSPD Series Integrates an SRD reference frequency multiplier, coupling capacitors and a Schottky diode microwave sampler / phase detector in a 0.075” by 0.100” hybrid. They are used to phase lock microwave oscillators up to 22 GHz to a much lower reference frequency by deriving a locking voltage from the sampled RF and the multiplied reference.
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Class 2 Integrating Sound Level Meter
Castle Sonus GA216I
The Castle Sonus GA216i is a feature packed instrument, fully compliant with IEC 61672:2002 Class 2. This meter gives simultaneous Leq and peak measurements for assessments to the Control of Noise at Work Regulations 2005. It has a high-specification measurement microphone and is cased in tough, crack resistant ABS plastic. To comply with the Control of Noise at Work Regulations 2005, this Class 2 Sound Level Meter enables you to assess Noise in the workplace at fantastic value.
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Systems Integration & Test
Watring Technologies, Inc. is an experienced, diversified high technology company proficient in total system integration services including test & evaluation, custom tooling design, and automated hardware validation and verification. We give customers access to a sole- source, multi-disciplinary staff of specialists offering turn-key solutions.
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UV-VIS-NIR Spectrophotometer
UV-3600i Plus
UV-3600i Plus, the Multi-purpose large-sample compartment and the Integrating sphere attachment also feature three detector, enabling the high-sensitivity measurement of solid samples. LabSolutions UV-Vis is a next-generation Shimadzu UV control software pursuing efficiency of analysis. LabSolutions UV-Vis software with easy-to-use is included as standard.
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Integrated Connection Technology
Compact design - Connection points for bridge combs - Solder-free circuit board contact - Plug -in connectors for interchangeable modules, such as small relays
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Laser
BDS-MM Series
*Pulse Width Down to 60 ps*Repetition Rate 20 MHz / 50 MHz*Free Beam or Fiber Output*Optical Power Up to 40 mW*All Electronics Integrated*No External Driver Unit*Simple +12 V Supply*40 mm x 70 mm x 120 mm
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Cable Fault Location System
BAUR Syscompact 2000 Portable
Cable fault location system Syscompact 2000 portable. The cable fault location system Syscompact 2000 portable is used for precise location of high-resistance and intermittent faults in low and medium voltage cables.* Fast and reliable* Precise, dependable cable fault location* High performance high voltage unit* Integrated proven cable fault pre-location methods
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The Ease of TEAM with the Power of Orientation Imaging Microscropy (OIM)
TEAM™ Pegasus
Introducing the new EDS and EBSD Integrated System
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Switches-SP4T
Macom Technology Solutions Holdings Inc.
At MACOM we offer an extensive collection of switches covering multiple commercial and aerospace and defense markets. Our product portfolio has a broad frequency spectrum from DC to 70 GHz. Our silicon Heterolithic Microwave Integrated Circuit (HMIC) PIN diode process is ideal for high power and broadband switches operating from 50 MHz to 26 GHz. Our AlGaAs PIN diode process can extend the upper frequency range of our switch die beyond 70 GHz and is ideal for instrumentation and radar applications. Our GaAs pHEMT and MESFET technology is ideal for fast switching and low control voltage switches optimized for both narrow band and broadband applications. Our 75 Ohm absorptive switches are designed specifically for demanding CATV, FTTx and DBS Infrastructure and CPE applications.
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Analytical Probe Station with Laser Cutting System
LCS- 4000 Series
The LCS-4000 Probe Station with Integrated Laser Cutting System gives the user maximum flexibility in semiconductor diagnostic cutting, failure analysis, trimming, marking and topside layer removal. All of these functions can be performed on a microscopic level, all on this one system which provides a high level of performance that is remarkably easy to use.
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Integrating Spheres - Luminous Flux Measurement For LEDs And Lamps
Konica Minolta Sensing Americas, Inc
One of the most important tests in light measurement is the assessment of the total radiant power or luminous flux of light sources using integrating spheres. An integrating sphere’s inside surface is coated with a diffusely reflecting material which guarantees complete integration and homogenization of the emitted radiation. The integrated light is then measured at the detector port.
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Integrated Board Power Management Functions For The Forward Thinking Engineer
Power Manager II
*Up to 12 differential voltage sensors with immunity to noise on ground plane*Voltage trimming to within 1%*Ruggedized CPLD with up to 48 macrocells for sequencing and supervisory signal logic*Large operating power supply range (3.3 V + 20% to 3.3 V -15%)*Up to 4 High-Voltage MOSFET Driver Outputs*Voltage Measurement with 10-bit ADC through I2C*Up to 8 On-chip DACs for Margining and Trimming
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All-In-One Battery Testing System
Integrating charge-discharge and temperature testing into one.
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Modulation Distortion Up To And Beyond 125 GHz
S930713B
S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Portable, Integrated O-Level Test Platform
Guardian™
Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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Integrated Receivers/Demodulators/Bit Synchronizers
Lumistar provides a wide variety of rack mount integrated receiver and diversity combiner systems. Some of these can be configured with multiple receivers, diversity combiners, and bit synchronizers depending on custom requirements. Lumistar does not manufacture any computers, but selects only the finest of the industrial machines available to provide a high performance package. Basic system setup, control, and display software is included with each of these systems at no additional cost.
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RTView® Integrations
Middleware monitoring that integrates with multiple outside technologies
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120 A High Voltage 50 Ω Pulse Generator
TLP-12010C
High Power Pulse Instruments GmbH
- High pulse output current up to 120 A (short circuit)- Ultra-fast 50 Ω high voltage pulse output with typical rise time 100 ps (0 A to 40 A) and 300 ps in high-current mode (0 A to 120 A)- Wafer, package and system level TLP, VF-TLP and HMM testing- Up to 180 kW peak output power into 50 Ω load- Built-in HMM pulse up to ±32 kV in 50 Ω-configuration- High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)- 6 USB programmable pulse rise times: 100 ps to 50 ns (custom selectable)- 8 (optional 9) programmable pulse widths: 0.5 ns (optional), 1 ns to 100 ns (0 A to 40 A), 1 built-in pulse width: 100 ns (>40 A)- The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 GPIB programmable steps (0 A to 40 A)- Optional external pulse width extensions from 5 ns to 500 ns (>40 A to 120 A)using the external pulse width extender TLP-12012A6- Built-in pulse reflection suppression- Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses- Efficient sofware for system control and waveform data management- The sofware can control automatic probers for fast measurements of complete wafers- Combines TLP-12010A and TLP-4010C into one system- Can be operated together with TLP-12012A6 and TLP-3011C pulse width extenders- Integrated interlock safety shut-down- Industrial isolated and EMI/ESD protected USB control interface
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Digital Insulation Testers
Built-in PV dedicated function 600 V AC/ 1000 V DC meter 5 test voltage ranges from 50 to 1000 V Comparator function Integrated hard carrying case
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Integrating Sphere Spectroradiometer System for LED
LPCE-2(LMS-8000)
LPCE-2(LMS-8000) is an Integrating Sphere Spectroradiometer LED Testing System for identifying the performance of single LEDs and LED lamps. LED’s quality should be tested by checking its photometric, colorimetric and electrical parameters. According to CIE 127-1997 and IES LM 79-08 standards, it recommends using an array spectroradiometer with integrating sphere and photometer head to test SSL products. LISUN GROUP developed LPCE-2 test system for LED products.
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LuxMeters
Shanghai Beha Electronics Co., Ltd.
*Large measurement range with resolution 0.01 lux*Measurement of safety lights*Integrated Data Hold*Min/Max Hold Function
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Network Management
Neuron System
Integrated management: Displaying current status of optical cable installation and location of fault using GIS - Facility management: Establishment of database as to the information of such physical communication facilities as communication device, cable, manhole, and telephone pole.- Recovery management: Enabling quick recovery by sending maintenance personnel to exact location in the event of fault.- Preventive management: Providing preventive measure against fault by prediction of fault due to heat deterioration of optical cable.
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Integration and Functional Testing
Exactest provide test analysts of the highest calibre only. Those who think "anyone can test software" are mistaken. Many key skills are required depending on the project and test phase being undertaken.
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Miniature Instantaneous Relays
CU-B Series
Heavy duty miniature power relays for demanding applications, switching of AC&DC voltages, resistive and/or inductive loads. Integrated magnetc arc blow-out function.
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Integrated Multi-Gas Detector for Unmanned Aerial System
MUVE C360
The FLIR MUVE™C360 is a multi-gas detector completely integrated with an unmanned aerial system (UAS) to provide real-time continuous monitoring of chemical hazards while on the move. The sensor block boasts 8-channels, which includes a photoionization detector (PID), Lower Explosive Limit (LEL) detector, and six other sensors. The integrated snorkel is designed to negate the effects of rotor wash, extending past the propellers to sample the unperturbed air. The MUVE C360 sensor block quickly latches to a proprietary integration dock mounted to the UAS. The FLIR calibration station features the same dock, so the operator can easily connect for routine sensor verification. Sensor readouts are prioritized based on alarm conditions and are displayed real-time on the pilot’s interface in the FLIR VueLink™ app. The MUVE C360 is a time-saving, game-changer for emergency responders, industrial safety officers, and environmental monitoring experts.
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Automated Optical Inspection (AOI)
TR7700 SIII 3D
TRI’s ground breaking 3D AOI solution delivers the fastest hybrid PCB inspection combining optical and blue-laser-based true 3D profile measurement for the highest automated defect symptom coverage possible. Integrated state-of-the-art software solution and third generation intelligent hardware platform offer stable and robust 3D solder and component defect inspection and with high inspection coverage and easy programming.
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Integrated Solutions
On top of this test infrastructure, we have designed a suite of services to help Communication Companies optimizing their revenues:Customers End-to-End Billing VerificationOperators End-to-End Billing VerificationInterconnect Fraud Detection
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Integrated I-V Test Systems
The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
