Antenna Test
See Also: Antenna Measurement, Test Ranges
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Product
Rapid Antenna Testing Services
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At JEM we understand the challenges facing antenna, microwave and communication system engineers, and we realize that accurate measurement of antenna electrical performance is critical. That’s why we offer a range of rapid antenna testing services from 50 MHz to 40 GHz.
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Product
Active biconical Antennas
BicoLOG X Series
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Only a single broadband test antenna for the complete frequency range from 20MHz up to 3GHz. Optimal for usage with spectrum analysers for EMC measurement. Active Antennas with high gain up to 41dBi.
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Product
Low Noise Pre-Amplifiers
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Low Noise Pre-Amplifier and companion external low noise amplifier (LNA) are used to amplify low level microwave signals. The Pre-Amplifier contains an AC/DC power supply, internal low noise amplifier, and a bias tee to source a DC bias voltage on the RF input connector.To overcome cable loss between the test antenna and the Pre-Amplifier assembly, a remote low noise amplifier (LNA) is mounted directly onto the 10 GHz antenna. A bias tee inside the Pre-Amplifier chassis powers the remote LNA through the coax cable interconnecting the pre-amplifier and the 10 GHz test antenna.
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Product
Saluki S5105 Series Microwave Analyzer (SA/VNA/CA)
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S5105 series microwave multifunctional analyzer has the wide frequency range from 30kHz to 40GHz. It integrates multiple functions such as dual-port vector network analysis, cable and antenna feeder test, vector voltage measurement, spectrum analysis, field strength measurement, and power measurement, providing you with powerful comprehensive test capabilities. S5105 series RF analyzer is widely used in the radar performance test and cable TV, wireless communication field.
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Product
Medium-size Compact Antenna Test Range
H-Series CATR
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The H-Series CATR chamber provide complete 3D performance assessment for 5G OTA devices and antennas including gain, efficiency, directivity, polarization and beam characteristics for frequencies from 3 up to 110 GHz, capable of supporting forthcoming 5G Sub-6 GHz (from 3 to 6 GHz) and mmWave (24 to 110 GHz) standardized testing including TRP/TIS, EIRP, EIS, IBB and emissions in accordance to 3GPP TR38.810 and TR37.842.
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Product
Range Automation System
ELE-RAS
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NSI-MI’s Range Automation System (ELE-RAS) has been specially designed to automate the time-consuming tasks associated with antenna range reconfiguration. This system eliminates operator intervention for range reversal, band switching, and power level optimization in antenna measurement facilities. This hands-off approach reduces uncertainty, extends the life of sensitive components, reduces RF leakage, and dramatically increases throughput and productivity. The modular architecture allows each ELE-RAS system to be optimized for maximum performance. ELE-RAS is software and receiver agnostic, meaning that it can be used to improve efficiency in virtually any antenna test range. Standard solutions are available for 20 GHz and 50 GHz applications. The ELE-RAS architecture also supports custom solutions to meet your unique measurement challenges.
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Product
Shield Level / Pathloss Equipment
SG1000B/PR1000A
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The SG1000 Signal Generator and PR1000A Preamplifier have been designed to simplify the measurement of shielding integrity in a shielded enclosure. When coupled with a high stability spectrum analyzer and an appropriate selection of test antennas, the SG1000/PR1000A combination can measure shielding effectiveness at all of the NSA 94-106 (supersedes NSA 65-6) defined test frequencies from 1 kHz to 10 GHz.The PR1000A amplifies the received signal from the test antenna and overcomes the high noise figure of the companion test receiver or spectrum analyzer. The PR1000A will ensure that the system noise figure will be less than 4.5 dB at all test frequencies from 1 kHz to 10 GHz. When used with a spectrum analyzer measurement bandwidth of 100 Hz, the system exhibits a sensitivity of -150 dBm at the test antenna output.To overcome high cable loss between the test antenna and the PR1000A assembly at 10 GHz, a remote low noise pre-amplifier (Praxsym PN 310-010091-001) is mounted directly onto the 10 GHz antenna.
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Product
PXI-5652, 6.6 GHz RF Analog Signal Generator
779670-02
RF Signal Generator
6.6 GHz PXI RF Analog Signal Generator—The PXI‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
Testing Large Radar Sensors with CATR Technology
CATR Radar Test System UTP 5069
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Modern driver assistance systems must recognize increasingly complex traffic scenarios and convert them into appropriate vehicle reactions with the help of artificial intelligence (AI) and specific algorithms. Imaging radar sensors with a higher spatial resolution, so-called imaging radar sensors, are therefore required. These can better distinguish larger from smaller objects and, due to the larger antenna apertures, also require larger dimensions of the test environment or larger far-field distances. Testing these sensors in the direct far field ( UTP 5065 ) would therefore require very large absorber chambers up to ten meters in size and more.Our efficient test system UTP 5069 offers exactly the right solution:By using CATR technology (Compact Antenna Test Range), 4D, imaging and other radar sensors with large far-field distances are calibrated with high precision in a small footprint. With the extremely low-reflection NOFFZ absorber chamber, the system is very well suited not only for validation, but also for EOL tests.
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Product
High Power, Low PIM Switch Unit
LPSU
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Low PIM coaxial switch matrix 5 x 6 or 1 x 4 configurationFrequency range 698-2700 MHz.SCPI commands via Ethernet (wired or wireless).Significantly reduces test time for multi frequency PIM applications.Applications: ATE systems, multi-band antenna and component testing.
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Product
PXIe-5650, 1.3 GHz RF Signal Generator
781215-01
RF Signal Generator
The PXIe‑5650 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5650 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
Active Loop Antenna
AL-130R
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Also known as Magnetic Loop Antenna, the AL-130R is compliant with CISPR 16-1-4. It is ideal for emissions measurements as required by various EMC standards such as FCC 18, CISPR 11, CISPR 13, CISPR 14, CISPR 32 and many more. The built-in, low-noise preamplifier, increases overall measurement sensitivity as well as the overall signal to noise ratio. As per ANSI C63.4-2014, the use of active loop antenna for compliance testing is permitted in a non-sheilded environment ONLY if the saturation indicator is continuously monitored during the course of testing. Com-Power’s Remote Antenna Interface (RAI-100) comes in very handy for this application. It is a compact controller which can be used to enable/ disable RF measurement circuit and monitor saturation and battery low conditions remotely via a fiber optic cable up to 30 mtrs in length.
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Product
Antenna Test System
ATS1000
Test System
Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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Product
High Gain Horn Antenna
BBHA 9120 K
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The BBHA 9120 K is a linear polarized high gain horn antenna for immunity testing at short distances, especially optimized forAutomotive 600 V/m Pulse Radar Test 1.2 - 1.4 GHz. Standard: General Motors: GMW3097, Ford: EMC-CS-2009.
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Product
14-bit 16 Concurrent Channel 65MSPS A/D board
AD14-65Mx16AVE
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14-bit 16-concurrent channel 65MSPS A/D board for demanding large-system uses, where signals on multiple time-aligned channels need to be observed with high SNR, such as RADAR, nuclear instrumentation, ultrasound, medical imaging, spectroscopy, communications systems, RF component and antenna testing and other critical applications. An on-board low-jitter LMX2581-based RF synthesizer allows any A/D sampling rate between 20MSPS and 65MSPS to be specified in software. A second on-board LMX2581 with synchronized reference can be optionally used to output four stimulus clocks on SMA connectors that can be vectored to any combination of 4 external transmitters, microwave pulse generators, laser modulators, and other devices.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
TestStand
test
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Product
Explosive Test Site Range Instrumentation
test
Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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Product
Wireless Test Standards Software
test
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Product
Prototyping & Test Consulting Services Solutions
test
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Safety Compliance Test System
EN 60601
Test System
Test system for electrical safety compliance testing of medical products in accordance with EN 60601-1, 3rd edition.The system is equipped with three test fixtures which are connected in parallel order to reduce the number of setup tasks for different variants in the course of day-to-day manufacturing processes. Its purpose is to test medical products, e. g. patient monitors, which are employed at hospitals to monitor heartbeat and oxygen saturation.Based on the integrated electrical safety tester by Associated Research, in combination with an AC power source and a switching matrix, it is possible to fully automate tests like for instance AC/DC high-voltage tests, insulation resistance measurements, earth connection tests and leakage current measurements.The required occupational safety is provided by a high-voltage safety hood in accordance with EN 501191. The entire safety technology, as well as the control PC, is mounted in an aluminum-profile cart.
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Product
Automotive Test Platform
ETS-800
Test Platform
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Test System
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Product
Conformance Test System
TS8980
Test System
The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
