Game Test
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Product
Functional Test
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For a functional test the WEETECH test systems simulate reality and enforce switching operations that can only be tested in an embedded condition. In doing so voltages, currents, time intervals and other measurement categories are adjusted and switching sequences are processed in a way, it would happen in reality.
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Product
UAT testing
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A successful UAT is crucial for deploying systems with no errors and business risks. However, implementing UAT in an agile environment might lead to frequent and reduced cycles of testing. This mandates UAT testers to develop skills of optimized testing techniques, automation and work in collaboration with the development and QA teams.
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Test Companions
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Test lead kits that include our Test Companion carrying cases for conveniently storing your test accessories.
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Test Applications
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We have a long and enviable reputation for supplying quality test applications to a wide range of industries covering many different technologies. Not only do we understand your test requirements, but we also try to make the software simple to use and support.
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Test Adapter
cPCI/VME/VME64x
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The test adapter is used for measurement and testing of test specimen boards, which gives optimal access of signals, address lines as well as power from backplane assembly. Usually the test adapter includes fields for voltage and amp, current measurements and in some cases also some pins for wire wrap to conduct custom connections.
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Test Software
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American Probe & Technologies, Inc.
This new series of software allows you to analyze materials or semiconductor leakage with all of the capabilities of your HP 4140B to resolutions of 1 fA @ 100VDC. Completely rewritten in Visual Basic for Windows XP operating system, it offers Virtual Front Panel Operation of 4140B for I-V & CV Analysis and allows operator to virtually control the 4140B for any instrument operation. I-V Plots with options of displaying current over time. CV Plots with high resolution plotting capability.
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Impact Testing
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Educated Design & Development, Inc.
1250 g body includes release mechanism and striking element guide.250 g striking element comes with cocking knob and hammer head, polyamide face, is hemispherical with a radius of 10 mm, has a hardness of HR85-100.60 g release cone with a 10N release force.Single Impact Force models range from a 0.2 J Hammer to a 2.0 J Hammer.Custom padded carrying case included.
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Product
Test Box
RF
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This is a custom made part of a Phase Noise test system. It contains relays, filters, amplifiers, and so on. It works with other of-the-shelf eqipment, and custom software to form a high volume production test system.
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Product
Noise Test
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As experts in the acoustic industry, our company offers a wide range of noise monitoring equipment, including sound level meters, monitoring substations, and noise localization devices. We also provide customized solutions to meet specific scenarios and requirements for noise control.
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Product
Wafer Test
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Silicon Turnkey Solution, Inc.
Most foundries provide wafers already probed to a set of DC parameters at room temperature to ensure they meet a basic subset of the package-part specification. Beyond this basic set of tests, more rigorous testing is often needed to meet specifications requiring die to be 100 percent probed, identify and segregate devices with higher performance levels and guarantee that parts will perform to a certain specification level.
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Test Probes
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Test Probes provide the vital link to transfer measurement signals as true and as undistorted as possible. Therefore these elements can be regarded as the heart of Test Fixtures – and for this very reason it is important for Equip-Test to offer high performance Test Probes with best quality and value, and thus ensure maximized ROI (Return of Investment) for our customers. Test Probes supplied by Equip-Test always provide the best-possible available solution for your contacting demands.
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Product
Test Services
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A2LA-accredited measurement facilities, combined with our expert staff of engineers, can tackle any unique test and calibration requirements with precision and accuracy. Our equipment is calibrated with NIST traceability providing you with the assurance that we can accurately and consistently characterize your antennas, radomes and other devices.
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ESD Testing & Latch-Up Testing Services
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EAG is an industry leader in ESD testing (Electrostatic Discharge) and Latch up testing. Our highly experienced engineering team use their industry leading knowledge and years or real world experience of the latest semiconductor technologies, circuit design, and device physics to optimize our customer's ESD and latch-up results. Human Body Model (HBM) and Machine Model (MM), Charged Device Model (CDM), Latch-up, Transmission Line Pulse (TLP).
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Environmental Testing
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We have a CTS C-65/100 Climatic Test Chamber available for hire at dB Technology.They have available:*Internal dimensions: 500 x 500 x 400mm (w x h x d)*Temperature range: -65°C to +180°C*Heating rate: 3°C/min*Cooling rate: 2°C/min*Climatic temp range: +10°C to +95°C*Humidity Range: 10 to 98% RH
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EMC/EMI Testing
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MET Laboratories boasts proven, superior capabilities in Electromagnetic Compatibility (EMC) compliance testing, including wireless & RF testing. Our EMC labs are among the most respected in the U.S. Our EMC testing covers FCC Part 15, as well as Parts 18, 22, 24-27, 74, 90 & 95, and 101
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Test Probes / Test Fixtures
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INGUN has an unbeatable assortment of test probes and test fixtures for individual testing tasks.Thanks to many years of experience in the testing equipment field, INGUN offers the suitable test solution for every test requirement.
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Test Chamber
Immunity
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Laplace can supply high performance mobile, bespoke and customised mobile RF and Antenna chambers which have been developed to meet all types of customers’ requirements. These mobile RF and Antenna chambers are very high performance and offer +100db of shielding attenuation @ 40GHz and can be fitted with best-in-class absorbers rated up to 110 GHz.
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Test Tool
Iron - IEC 60870-6
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Iron is a Windows™ application that creates compliant IEC 60870-6 (TASE.2/ICCP) Applications, both unidirectional and bidirectional. Iron is a highly configurable tool with multiple simulation options for changing Data Model values and generating valid message traffic. Support for Read, Write, Reporting, Discovery, Controls, and Dynamic DataSets are built into the tool.
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Environmental Testing
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Independent Testing Laboratories
Carefully conceived environmental testing can expose hidden product flaws, allowing you to make critical changes before releasing your product to market.
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Regulatory Testing
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At Mobile Power Solutions, we’re focused on battery testing solutions. Our state-of-the-art lab and experienced engineering team are fully equipped to ensure your battery systems meet today’s rigorous regulatory requirements. We are ANAB accredited to ISO/IEC 17025:2017.
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Microwave Testing
325B
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The Model 325B Picoprobe sets new® standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 325B Picoprobe achieves an insertion loss of less than 3.0 db and a return loss of greater than 15 db over its frequency range (see accompanying data).
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Material Testing
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With so many materials and applications in the world, you need to know that you can trust your products are durable and do what your engineers designed them to do. Manufacturers rely on results from hardness testing and international safety standards require materials to have a specific hardness or stiffness. Different metals need to be tested according to different hardness testing standards, whether it’s using a Rockwell, Brinell, Vickers or a Universal machine. Bowers Group have a variety of portable, bench and floor models in our product range to provide a solution for your hardness testing needs, whatever it may be.
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Transformer Test
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Beijing GFUVE Electronics Co.,Ltd.
Check whether the performance of the transformer meets the requirements of relevant regulations and technical standards.
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Performance Testing
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All of Xena’s products can be used for performance testing. This typically includes measuring:*the volume of data successfully delivered between two points, usually measured in bits or packets per second*how long it takes data packets to travel between two points in a network or a device, also known as latency*variations in latency – also known as jitter – due to network congestion or other factors*how many data packets fail to reach their destination*if data packets are delivered in a different order from that in which they were sent
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Vibration Testing
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Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
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Test tools
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Try our low-cost RF sniffers for fast and easy troubleshooting of unwanted interference caused by electromagnetic radiation sources in your local environment.
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Fungus Test
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The fungus test assesses the extent to which material will support fungal growth and how any fungal growth may affect performance. The fungus test also identifies how rapidly fungus will grow on the material, and how fungus affects the material, its mission, and its safety for use following the growth of fungus on the material.
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Test Switch
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The W3TS Test Switch, a miniature knife blade switch (5/8 inch centers including barrier) with #10-32 stud terminals, is available in three types: Basic Switch, Short-Circuiting Switch (Shorting Switch), Test Jack Switch
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Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Semiconductor Test
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Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.





























