Sensor Test
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Product
In-Line Test System
Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Product
Polarity Test Sensors
P-FINN
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The P-FINN is a cost effective method of identifying object presence and/or orientation, and/or color. The key to the design is simplicity.
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Product
Universal LightProbe S2 Sensors
LED Sensor
Optomistic Products’ Universal LightProbe S2 Sensors are designed for the In-circuit, Functional or Finished Product test of an LED’s color and/or intensity. Implemented in a unique and customizable 2-Part solution, the S2 Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
VR/AR/MR Calibration Platform
Test Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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Product
Functional Test Trainer System
QT65
Functional Test
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Selectable Shunt Current Sensor ±40 V, 20 MHz
CX1104A
Power Sensor
The CX1104A selectable shunt current sensor is a dedicated accessory for the CX3300 series and enables dynamic current measurements from 1 μA to 15 A up to 20 MHz bandwidth with an available calibrated resistive sensor head attached
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
NI Real-Time Test Cell Reference System
780590-35
test
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
E-Series Average Power Sensor
E9304A
Power Sensor
Refer to the E9301A for standard power sensor features Low frequency coverage (9 kHz to 6 GHz) for EMC/EMI test applications such as the radiated immunity test (IEC61000-4-3)High sensitivity (-60 to +20 dBm) and fast measurement speed to reduce the time taken to calibrate radiated field uniformity and EMC/EMI test receivers Measure transmitter power and receiver sensitivity at Very Low Frequency (VLF) to microwave frequencies Special option available to 18 GHz Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters
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Product
FADEC/EEC Test Platform
Test Platform
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
6TL23 Off-Line Seat Operation Base Test Platform
H71002300
Test Platform
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
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Product
Sensors
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The large selection of sensors and the modular design of the multisensor coordinate measuring machines enable application-specific device configurations. The use of multi-sensor systems allows the economical solution of many measuring tasks with just one measuring machine, which in the past required many different machines. This minimizes investments, maintenance costs and set-up times.
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Product
ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
Test Module
The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
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Product
Sensors
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A speed and angle sensor using a black/white tape which is glued on a rotating part. The reflection is converted into a TTL signal, bandwidth 100 kHz. The sensor consists of a tiny electronics part and a 5 m fiber optic cable terminated with a M6 screw. Thus areas where space is very limited still can be reached conveniently.
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Product
SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Product
10 MHz to 50/53 GHz USB Wide Dynamic Range Peak and Average Power Sensor
U2065XA
Power Sensor
The Keysight U2065XA is a fast, accurate and wide dynamic range 10 MHz – 50/53 GHz USB peak and average power sensor.
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Product
Sensors
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Our product range of SQUID sensors is divided into current sensors, magnetometers and gradiometers.
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
Sensors
Werth MultiRing®
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Angle of incidence programmableNo loss of working distanceNo moving partsProgrammable incidence angle over large rangeHigh performance white LEDs
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Product
Sensors
TA120
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The TA120 sensor combines the precision of a Class 1 sound level meter, maximum protection of an outdoor kit and full connectivity with open source platforms.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
Force Sensors And Strain Sensors
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Force and strain measurement in machines, installations, and tools.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Sensors
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To measure machinery or structural vibration, a transducer is needed to convert the mechanical motion into an equivalent electrical signal. Each sensor has distinct advantages in certain situations and limitations in other, so it is important to select the most suited transducer or sensor for your job. Equally, important is selecting the appropriate parameter of vibration amplitude for measurement. IRD® has a wide range of transducers and accelerometers available to help you obtain accurate, reliable data, whether your concern is vibration monitoring, analysis, or dynamic balancing.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
PCIe 5.0 Test Platform
PXP-500A
Test Platform
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
