PCI Express Test
See Also: PCI Express, PCI Express Analyzers, PCIe
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PCI Express x4, Gen3 XMC Carrier
TPCE278
The TPCE278 is a standard height PCI Express Revision 3.0 compatible module that provides one slot for a single-width XMC module used to build modular, flexible and cost effective I/O solutions for all kinds of applications like process control, medical systems, telecommunication and traffic control. The TPCE278 is a versatile solution to upgrade well known XMC I/O solutions to the PCI Express signalling standard. The PCI Express x4 link from the host board to the XMC module is enhanced by a PCIe Gen3 Redriver, allowing safe operation of XMC modules on PCIe mainboards.
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PCI Express Graphic Card with NVIDIA® Quadro® P2200
Quadro-E PEG P2200
The Quadro-E PEG P2200 perfectly balances performance, features, and compact form factor to deliver exceptional creative experience and productivity across a variety of 3D applications. The Pascal GPU with 1280 CUDA cores, 5GB GDDR5 onboard memory and support for up to four 5K (5120x2880 @ 60Hz) native displays accelerate product development and creation workflow demanding fluid interactivity for large, complex 3D workpieces.
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PCI-8516, 2-Port, PCI, LIN Interface Device
781365-01
2-Port, PCI, LIN Interface Device—The PXI‑8516 is a Local Interconnect Network (LIN) interface for developing applications with the NI‑XNET driver. The PXI‑8516 excels in applications requiring real-time, high-speed manipulation of hundreds of LIN frames and signals, such as hardware‑in‑the‑loop simulation, rapid control prototyping, bus monitoring, automation control, and more. The NI‑XNET device-driven DMA engine enables the onboard processor to move LIN frames and signals between the interface and the user program without CPU interrupts, minimize message latency, and free host processor time for processing complex models and applications.
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Flexible Mini PCI Express to MiniPCI Adapter
SKU-066-0X
Flexible MiniPCI Express to MiniPCI Bus Adapter (Adapter) was designed to convert motherboard MiniPCI Express bus into a standard MiniPCI bus. It allows connection of a standard 124-pin MiniPCI add-in board to a motherboard’s MiniPCI Express connector via full- or half-size MiniPCI Express host board.Adapter includes MiniPCI Adapter board, MiniPCI Express host board and flat PCI Express Cable.
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PCI Express Graphic Card NVIDIA RTX 4000E Ada
NVIDIA RTX 4000E Ada
- NVIDIA Ada Lovelace Architecture- 5-year Longevity Support- Full height, full length design- PCIe Gen4x16 interface- 20GB GDDR6 Memory, 160-bit Bandwidth- 6144 CUDA Cores, 26.7 TFLOPS SP Peak
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IEC Testing
International Electrotechnical Commission
F2 Labs can assist you in testing your electrical products to the applicable IEC standards. The IEC is the world’s leading organization for the preparation and publication of International Standards for all electrical, electronic and related technologies.
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Non-Destructive Tests
Non-destructive tests on reinforced concrete and masonry structures are the first method of investigation for verifying the real conditions of a building or structure, existing or under construction. As indicated by the anti-seismic legislation, these tests can be performed by all authorized operators.
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In-circuit Test
Medalist i1000 Systems
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Basic 3U VPX-to-PCI Express (PCIe/PCI-e) Adapter
8065
The Technobox, Inc. P/N 8065 is a 3U VPX-to-PCI Express (PCIe) adapter that provides a convenient and cost-effective means for developing 3U VPX boards in a personal computer environment. It can also be used for production testing of 3U VPX boards. The adapter is a half-length PCIe card with the VPX card under test mounted close to the PCIe edge fingers to minimize signal lengths. When seated in a PC motherboard, the VPX card primary side faces upward to allow convenient access to components.
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Vibration Testing
Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
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Test Handler
M4841
High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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PCIe CobraMax Express 8-Bit Digitizer
The GaGe CobraMax Express CompuScope PCIe digitizer board features 8-bit resolution with sampling rates up to 4.0 GS/s with true Effective Number of Bits (ENOB) of 7.6-bits with 10 MHz input.
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Qualification Testing
Qualification testing is an important step in evaluating how well spacecraft and launch vehicles perform under severe loading conditions that occur during launch and operation. ATA has conducted acoustic and vibration qualification testing of numerous launch vehicles and spacecraft components.
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Battery Test
1260
*Basic Battery Load Test*Battery Analysis*Mac*Test*Bad Cell Indicators*Testing the Starter Motor*Low Temperatures Effects
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PCI Module
PCI-1553-PLX
The PCI-1553-X uses a single UTMC’s Sµmmit or BCRTM communication device as its 1553 bus controller, or remote terminal, or monitor terminal. The single controller has two redundant channels. This controller accesses 64Kx16 word of external memory and has external for both channel A and B. The 3U PCI board has on-board transformers for both channels.
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Continuous Testing
Continuous testing is the practice of embedding quality through every phase of the software delivery lifecycle - from planning to production. The goal is to ensure that testing continuously reduces risk and improves application quality.
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Wafer Test
Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
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14 bit, 125 MS/s PCI Digitizer
ATS460
ATS460 has been designed from the ground up for OEM applications, which require very high reliability, high performance, high quality and reasonable prices. ATS460 uses COTS analog components and FPGAs to provide you more features and benefits and at the same time reduced manufacturing costs without compromising quality. The result is that you get more digitizer for less money.
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PCI 25xDPST Reed Relay Card
50-115A-022
This is the 25xDPST version of our 50-110A/50-115A range of reed relay switching cards which are available in both Changeover (SPDT) and Normally Open (SPST & DPST) configurations. Connections are made via a front panel 200 pin female LFH connector.
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Test And Measurement
Standardized instruments used to evaluate individuals, populations, or processes.
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PCI Extender Card for cPCI Systems
DP-cPCI-7497
The DP-cPCI-7497 is highly flexible PCI Extender card, which can be used to extend PCI / PCI-X bus from one system to another system over an optical fiber medium upto 500m distance. A PCI-X to PCI-e Bridge is used to convert the PCI / PCI-X protocol to x4 PCI Express protocol operating at 2.5Gbps.The PCI-X to PCI-e Bridge is connected to four optical transceivers (x4 PCI- e link) which can transmit optical signals upto 2.5Gbps speed.A x4 copper medium connection option in lieu of optical transceivers is also available.
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Squid PCI Express Carrier Board™ for M.2 and NGSFF (NF1) SSD Modules
Amfeltec Squid PCI Express Carrier Board™ for M.2 and NGSFF (NF1) SSD Modules
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Transformer Testing
Measuring bridges or electronic burdens can be individually integrated into existing CT/VT test systems. Customized solutions are our core competence.
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5G Testing
Teradyne test solutions are at the forefront of the 5G test era. Why? We work with the leading semiconductor manufacturers and provide optimized test coverage for the major wireless standards. From emerging millimeter wave devices to the traditional sub-6GHz, our test solutions are already leading the way.
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PCI Express 4 M.2 Receiver Test Automation
N5991PM4A
The N5991PM4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express M.2 devices and hosts at 8 GT/s.
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Test Set
TS® 22
The TS22 Test Set’s unique built-in one-way amplified speaker provides three audio levels for hands-free listening and use with automated voice response systems. Multiple memories enable storage of nine 18 digit telephone numbers in repertory dialer (speed dialing) for easy access to test boards, the central office and other frequently called numbers. The last number redial feature eliminates the need to re-key your last entry. The TS22 Test Set offers an unbeatable combination of reliability, durability and expanded utility.
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PCIe-to-MXM adapter supporting ADLINK Mobile PCI Express Modules with NVIDIA® Quadro® embedded GPUs
EGX-MXM-AD
The EGX-MXM-AD is an PCIe adapter supporting ADLINK NVIDIA® Quadro® MXM 3.1 Type A, Type B, and Type B+ GPU modules for quick validation and early development purposes on your AI applications. The following modules are supported: EGX-MXM-P1000, EGX-MXM-P2000, EGX-MXM-T1000, EGX-MXM-RTX3000, and EGX-MXM-RTX5000. A reference thermal solution is available.
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Test System
NFC Xplorer
The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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Test Chambers
The left-hand axis scales the level of the 100 measurements and the right-hand axis displays the uncertainty to a statistical confidence level of 95%; proving the repeatability is better than +/-0.25dB between the measured values. Guaranteeing repeatability, accuracy and correlation across Lab’s, across Production lines and across the World





























