Test Heads
1) interchangeable assembly connecting test signals between DUT and ATE. 2) representation of a human head. 3) provide network test access.
See Also: Heads, Test Probes
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Channeling Decoder, Nav/Comm/Control Head
RCD200
Designed to provide the Avionics shop a simple and expeditious method for testing general aviation radio tuning. Provided are front panel mounted LED's as well as a digital display to provide the quickest code recognition while testing. With this simple method of testing you will soon find yourself testing all your radios and finding those troublesome intermittents. This unit also decodes altitude and ARC 1000 serial data. Click on picture for larger view.
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Hexagon Head Drum Sprays
850
A Stainless Steel Socket Head Drum Sprays provide a wide range of spray forms for pick flushing on cutting drums.
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Bipolar/FET/Diode Dual Head Production Test System
36XX
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Single Optical Head Interface Module
81618A
The single-channel interface module is used to connect optical heads ( Keysight 8162x ) to the mainframes 8163A/B, 8164A/B or 8166A/B.
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Laser Head Cable, 20 m
10882C
The 10882C 20-meter Laser Head Cable is used to connect the 5519A/B Laser Head to the E1735A USB Axis Module for the 5530 Laser Calibration System.
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Frequency Extension Heads for Vector Network Analyzers
FEV
These frequency extension modules connect to your existing test ports and leverage the inherent microwave network analyzer’s performance and features to display full port S-parameters: Two measurement architecture available: 1-path/2-port and fully reversing 2 port. Waveguide calibration kits are available as separate accessories.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Laser Head
5517A
The Keysight 5517A is used primarily in VME and PC based laser interferometer systems where the velocity of motion is slower, such as machine tool applications. Please contact Keysight for custom requirements.
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Head Mounted Temperature Transmitters
Datexel manufactures a large range of head mounted temperature transmitters. Field proven and high accuracy are the ingredients in the Datexel range of head mount temperature transmitters. Low cost, fully isolated, PC programmable, direct or inverse output, up scale or down scale burn out are just some of the features available on the Datexel range of head mounted temperature transmitters.
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60 GHz, 2/4 Port, Electrical Remote Sampling Head Module
N1045B
The N1045B 60 GHz remote sampling head module is engineered to provide superior measurement accuracy with the highest throughput for testing multi-lane electrical designs.
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Laser Heads
The laser head is the source of the laser beam used in all laser motion and position measurement systems. The primary difference between laser heads is in the velocity, reference frequency and optical output power. Other considerations are size, heat dissipation, and input power requirements. Which laser you choose depends primarily on the application in which it will be used. For example, semiconductor lithography systems typically have faster moving parts (stages), and therefore need higher velocities than machine tool applications.
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Probes With Industrial Heads
Used in industrial applications for process temperature measurement, these probes come in a variety of protection head styles for easy connection wiring to your extension cable
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Remote Radio Head 50 GHz
CMPHEAD50
The R&S®CMPHEAD50 is the only remote radio head supporting bi-directional testing at five mmWave frequency bands with one hardware set and EVM booster ports. It extends the R&S®CMP200 radio communication tester to frequency range 2 (FR2/ FR2-1). The improved performance ensures optimum accuracy for testing next generation FR2 RF designs – from early development to final certification and regulatory compliance. Test with confidence and ensured RF performance with the latest state-of-the-art measurement solution from Rohde&Schwarz.
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Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Attitude Heading Reference System
M&M Modules
PNI’s M&M modules will self adapt and learn its system and its environment automatically to provide accurate quaternions, heading, pitch and roll. All while using 100 times less power than traditional AHRS modules.
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Test Contactor/Probe Head
cBoa
cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.
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SOA Testing, Cloud Testing, Web Application Testing
SOAtest
Automate complete end-to-end testing for business and security-critical transactions. Parasoft SOAtest is widely recognized as the leading enterprise-grade solution for API testing and API integrity. Thoroughly test composite applications with robust support for REST and web services, plus an industry-leading 120+ protocols/message types.
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Test Fixtures & Test Sets
Keysight test fixtures are used to hold electronic components or materials (physically and electrically) in order to perform various measurements. Keysight offers a variety of test fixtures from Parametric, Dialectrice, Liquid test fixtures and more.Some of our test fixtures allow you to connect directly to your measurement instrument, while others require various adapters.
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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IEC Testing
International Electrotechnical Commission
F2 Labs can assist you in testing your electrical products to the applicable IEC standards. The IEC is the world’s leading organization for the preparation and publication of International Standards for all electrical, electronic and related technologies.
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Non-Destructive Tests
Non-destructive tests on reinforced concrete and masonry structures are the first method of investigation for verifying the real conditions of a building or structure, existing or under construction. As indicated by the anti-seismic legislation, these tests can be performed by all authorized operators.
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In-circuit Test
Medalist i1000 Systems
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Vibration Testing
Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
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Test Handler
M4841
High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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Laser Head
5517C
The Keysight 5517C is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Option 009 allows a larger angular range of measurement by providing a 9 mm beam diameter for use with three-axis interferometers. Please contact Keysight for custom requirements.
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Qualification Testing
Qualification testing is an important step in evaluating how well spacecraft and launch vehicles perform under severe loading conditions that occur during launch and operation. ATA has conducted acoustic and vibration qualification testing of numerous launch vehicles and spacecraft components.
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Battery Test
1260
*Basic Battery Load Test*Battery Analysis*Mac*Test*Bad Cell Indicators*Testing the Starter Motor*Low Temperatures Effects
