Impulse Test
Check using a short surge of energy.
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Impulse Current Generator
Weshine Electric Manufacturing Co., Ltd
Impulse current generator is mainly used to test the ability of electrical equipment to withstand strong impulse current, widely used in lightning arresters and electrical and electronic equipment in operation conditions of oscillation wave immunity test, can also be used for other research tests.
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PXI Integration Platform
ATS-3100
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Test Fixture
16047E
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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Impulse Winding Tester
TH2882A-3
Changzhou Tonghui Electronic Co., Ltd.
Due to the influence of coil wire material, magnetic material, framework and manufacture technics etc., coil products (such as transformers, motors, etc.) may have defects of low insulation between coil layers, circles and leads. TH2882A series impulse winding tester, adopting high-speed sampling technique, is a new generation analysis test instrument for insulation performance of coil products.
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Benchtop Automated Functional Test
midUTS
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Impulse Generators
HYPERLABS triggerable impulse generators create precise high-speed pulses with 50 to 100 ps rise time. They can be triggered by input from antennas and other signal generator systems.
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Impulse Winding Tester
TH2883S8-5
Changzhou Tonghui Electronic Co., Ltd.
TH2883 series products are newly developed impulse winding testers by Tonghui. This product line makes Tonghui as the first provider of impulse winding tester from low voltage of 30V to high voltage of 10kV, single channel to multichannel (Max.:8 channels) in this industry. The instrument adopts popular 32 bit CPU and high density SMD technology, 65k color 7-inch TFT wide display screen, bringing ease for your eyes and convenience to your operation. The impulse voltage of100V~5000V, maximum 8 channel sweep test, maximum 20 test procedures, sampling rate of 200Msps, memory depth of 6k bytes makes your test accurately.The usage of standard sample average, application of demagnetized impulse, high bandwidth analog acquisition circuit, technology of high-fidelity corona extraction as well as the opening of non-destructive test reflect the design philosophy “customer-oriented, share the future technology with you” of Tonghui.
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Off-Line Base Test Platform
6TL19
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Test Platforms
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Impulse Current Measuring Shunts
ICMS
The Impulse Current Measuring Shunts ICMS are new designed tubular shunt types with best response behavior to match the high performance of the TR-AS digital recorder for comparative current measurements. A 1st partial response time less than 10ns and a settling times less than 20ns show the advantage of these shunts. They show no initial overshoot peak, no oscillations and do not need compensation box to optimize the transient behavior as known from e.g. cage shunts.
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Off-Line Seat Operation Base Test Platform
6TL23
The 6TL23 is a bare rack for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation since there’s space for the operator’s legs under the fixture receiver.
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Impulse Winding Tester
TH2883-10
Changzhou Tonghui Electronic Co., Ltd.
TH2883 series products are newly developed impulse winding testers by Tonghui. This product line makes Tonghui as the first provider of impulse winding tester from low voltage of 30V to high voltage of 10kV, single channel to multichannel (Max.:8 channels) in this industry. The instrument adopts popular 32 bit CPU and high density SMD technology, 65k color 7-inch TFT wide display screen, bringing ease for your eyes and convenience to your operation. The minimum impulse voltage of 30V, maximum impulse voltage output of 10kV, winding test of 1uH inductance value, sampling rate of 200Msps, memory depth of 6k bytes makes your test accurately. The usage of standard sample average, application of demagnetized impulse, high bandwidth analog acquisition circuit, technology of high-fidelity corona extraction as well as the opening of non-destructive test reflect the design philosophy “customer-oriented, share the future technology with you” of Tonghui.
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TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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AC & DC Combined Test Set With / Without Impulse
This testing equipment is used in electrical and power industry.
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Impulse Voltage Generator
Hilo-Test manufactures Surge generators for surge voltage and safety tests as well as for testing the insulation withstand voltage, the waveform in accordance with IEC 60060. Especially for EMC tests on photovoltaic systems and surge voltage tests, for example, to relay, capacitors, coils.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Impulse Sledge Hammer
Impact hammers are designed to measure the frequency of mechanical structures, such as mechanical movement, mechanical damping and impedance.
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Scienlab Battery Test System — Cell Level
SL1002A
Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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Impulse Withstand Voltage Tester
SUG255
The Impulse Withstand Voltage Tester (or High Voltage Surge Generator), it is according to IEC255-5, IEC60060, IEC60065, GB14711, GBT17215.301 and GBT17215.322. It is suitable for doing all kinds of electrical and electronic products (such as energy meter, household appliances, low voltage electrical appliances and small power motor) insulation performance test.
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Parametric Test Fixture
U2941A
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
