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Product
TestStation Multi-Site Offline
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TestStation Multi-Site Offline provides true parallel test, delivering 200% to 400% greater productivity, and 40% to 50% lower total cost of test.
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Product
Digital Phase Shifters
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Macom Technology Solutions Holdings Inc.
At MACOM we offer a comprehensive portfolio of 4-Bit and 6-Bit phase shifters. Each of these devices operates with either serial or parallel control inputs. These parts can be used for either Aerospace and Defense or Commercial applications such as; Military or Weather Radar, Transmit/Receive Modules, Phase Cancellation and Electronic Warfare. Our family of phase shifters are packaged in a convenient surface mount PQFN and boasts 360° Coverage, Fast Switching Speed and Low Phase Error.
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Product
Ultrasonic Thickness Gauge
UTG-1500
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The new PHASE II UTG-1500 is a hand held microprocessor controlled ultrasonic thickness gauge specifically designed for measuring the thickness of metallic and non-metallic materials such as aluminum, titanium, plastics, ceramics, glass and any other good ultrasonic wave-conductor as long as it has parallel top and bottom surfaces.
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Product
Modular UPS
PM SERIES 10 - 2080 kVA
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PM Series is a scalable, redundant Modular UPS system designed to cost effectively provide high level availability for high density data centers and critical applications. True Online Double Conversion and advanced DSP control technology. Modular Architecture can scale power and runtime as demand grows or as higher levels of availability required. Combines the modular design with the N+X parallel redundancy technology.The maximum capacity of a single cabinet is 520kVA. Cabinets can operate in parallel configuration to build a system of up to 2080kVA.
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Product
HPERC VITA 75 COTS Computers
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Sealed Extreme Rugged COTS computing platform in a tiny VITA 75 footprint, ideal for ground, air, and sea deployments. Based on Intel® Core™ i7 or Xeon® processors and optional GPGPU parallel processing engine. Easily configured application-ready platform for fast integration of custom rugged embedded applications. A wide array of fast IO provided on uniquely-keyed MIL-DTL-38999 connectors.
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Product
Advanced SoC/Analog Test System
3650-EX
Test System
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Product
EM Solver System Level Solver
EMA3D
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Electro Magnetic Applications, Inc.
MA3D is a powerful 3D numerical solution of Maxwell’s curl equations based on the time-domain finite-difference method in rectangular coordinates. The code has application to nearly any EM coupling, radiating, or interaction problem. EMA3D’s FDTD approach is the only EM tool capable of capturing the detail of entire aerospace or ground systems down to individual electronics interfaces in a computationally accessible manner. Computational advances and parallelization allow for fidelity once only dreamed possible.
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Product
Serializer/Deserializers & Selector Muxes
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Serializer/Deserializer muxes use both rising and falling edges of the clock to serialize the data from parallel inputs to serial output while demuxes deserialize the data from its serial input to parallel outputs. Selector muxes routes the differential inputs to either one or more of the desired outputs upon assertion of the appropriately selected port. Muxes can be used in various applications including High Data Rate Ethernet, Fiber Communication, Signal Routing and Broadband Test & Measurement Equipment.
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Product
PCI Three-Axis High Performance Laser Board with External Sampling
N1231B
Laser Board
The Keysight N1231B PCI Three-Axis Laser Board with External Sampling is a register based PCI bus board that implements three axes of laser interferometer measurement for position monitoring and closed-loop servo control. There are four external sample inputs along with four data hold inputs that allow easy synchronization with user systems. Several threshold compare registers, with both hardware outputs and interrupt capability, can be used for travel limit and in window or out of window detection functions. The dual mode hardware position outputs, controlled by the hold inputs, provide either a 32-bits/axis parallel interface or a 36-bit multiplexed interface to the 36-bit axis position data at rates up to 20MHz. The user can programmatically access the externally sampled position and velocity data, as well as software sampled position and velocity data, over the PCI bus at rates up to 100kHz (3 axes of position and velocity) or 200kHz (position or velocity only).
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Product
96-CH High-Driving DIO Card
PCI-7396
Analog Input Module
The PCI-7396 is 96-bit parallel digital input/output (DIO) cards designed for industrial applications. The PCI-7396 emulates four 8255 Programmable Peripheral Interface (PPI) chips. Each PPI offers three 8-bit DIO ports which can be accessed simultaneously. The total 12/6 ports can be configured as input or output independently.
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Product
Test System
LPDDR4 and LPDDR3
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Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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Product
Geometrical Measurement Software
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PRÜFTECHNIK Condition Monitoring GmbH
Activate your machinery more quickly, and help it run longer. PRÜFTECHNIK geometric laser alignment tools and software enable you to easily check and adjust your machine geometries for: straightness, flatness, level, inclination, plumbness, parallelism, and right angle check. Our tools are powerful, precise, and easy to use on a vast range of machinery—they can measure for the most demanding alignment jobs, including a bore of almost any diameter, and/or any surface type or inclination. Find the right geometric measurement tool for your machines.
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Product
The Ultrafast Grid
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The next generation of cross browser testing gives you parallel test automation at a scale never seen before – across all browsers, devices, and viewports.
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Product
Phasing Sticks
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High voltage phasing rods enable phase comparisons to be made at the point of paralleling two circuits without the interposition of voltage transformers or secondary wiring circuits.
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Product
Buffered Analog Crosspoint Switches
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Analog Devices buffered video crosspoint switches offer multiple configurations from 8x8 up to 32x32 channels with gain of 1 or 2 and are offered in LQFP, LFCSP, and BGA packages. These crosspoint switches can be programmed either in serial or parallel modes and are used primarily for routing high speed signals, including composite video (NTSC, PAL, SECAM) and component video (YUV, RGB) in applications such as studios, video on demand, in-flight entertainment, surveillance, and video teleconferencing.
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Product
Power Supply, 40 V, 85 A, 3400 W
N8736A
Power Supply
Keysight basic DC power supplies offer essential features for a tight budget. The Keysight N8736A is a 40V, 85A, 3300W single output power supply in a small 2U package. It offers flexible AC input options, analog / resistance control of output voltage and current as well as parallel and series connection of multiple supplies to achieve more output current or voltage respectively.
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Product
Power Supply, 150 V, 22 A, 3300 W
N8740A
Power Supply
Keysight's basic DC power supplies offer essential features for a tight budget. The Keysight N8740A is a 150 V, 22 A, 3300 W, single output power supply in a small 2U package. It offers flexible AC input options, analog/resistance control of output voltage and current, as well as parallel and series connection of multiple supplies to achieve more output current or voltage respectively.
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Product
Analog Meter
PR-A Series
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The PR-A Series of series-regulated CV/CC power supplied were designed to provide a compact power supply package with high performance, and ensure excellent reliability as well as excellent design. Four types are available, three 18V types and one 36V type. Whether used individually or connected in series or parallel for greater capacity, the PR-A Series are housed in a compact rack-mount package and can be used on the bench top as well.
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Product
ICT Software: Interactive Developmetn Encironment ICT ICE & ICT Sequencer
ICT IDE and Sequencer
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The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway
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Product
Current Logger Sensor
NUL-202
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This sensor can be used to measure the current in parallel or series branches of low voltage AC and DC circuits and also to investigate the dependence of the current flow through components on the voltage across them.
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Product
Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Product
Test Database Software Module
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The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.
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Product
AXIe Logic Analysis & Protocol Test
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Keysight's AXIe Modular Logic Analysis and Protocol test modules and powerful analysis software provide essential capabilities for engineers working on fast digital designs and chipsets using high speed parallel and serial buses, such as DDR and PCI Express Gen 3.
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Product
VLSI Test System
3380D
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
High Voltage Capacitor Batteries
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Lifasa - International Capacitors, SA
There are a series of elements and materials, just like in the BT equipment, for their operation in AT and that must accompany our AT capacitors for the proper functioning of these and for our installation / network, as well as the rest of equipment that compose it and that are in operation in parallel to the capacitor / s that we want to put into service for the correction of the power factor (compensation of the consumption of reactive energy).
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Product
High Performance DC/DC Converters
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The 4:1 Input Voltage 1000 Watt Single FXP DC/DC Full Brick converter is designed to operate in parallel with up to 3 FXP bricks (2800 Watts) with no external circuitry. The FXP series provides a precisely regulated DC output. The output voltage is fully isolated from the input, allowing the output to be positive or negative polarity and with various ground connections.
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Product
4-CH 12-Bit 80 MS/s PCI Express Digitizer
PCIe-9814
Digitizer
The ADLINK PCIe-9814 is a PCI Express digitizer providing speedy, high quality data acquisition. Each of the four input channels supports up to 80MS/s sampling, with 12-bit resolution A/D converter. This allows simultaneous recording of signals on all channels with no inter channel phase delay. The extremely large on-board memory enables long recording times even at the highest sampling rates.Unlike parallel PCI buses, PCI Express slots utilize serial point-to-point connection. Each connection pair (lane) can achieve burst connection speeds of 250MB/s. The PCIe-9814, based on x4 lane slot PCI Express technology, provides a clear advantage in that direct connection of each slot allows full transfer bandwidth for each individual card. The ADLINK PCIe-9814 x4 digitizer can be used in any standard PCI Express slot, x4, x8, or x16.
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Product
DC Source/sink
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Single channel system. One output with up to 1500 V or 1200 A. Maximum power in single operation 650 kW, up to 2.6 MW in parallel operation.
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Product
Emulation of the Mobile Wireless Environment from 2G to 5G
Base Station Emulator sUTP 5018
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Bring a whole mobile network to your lab or production: NOFFZ Base Station Emulator (BSE) creates a customized cellular wireless environment. This makes testing wireless devices easier than ever before.Compact, cost-effective testing of multiple DUTs in parallel from 2G to 5G, including endurance testing for several days.
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
