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Gravity Test Handlers
Microtec offers a wide variation of customizable gravity handlers. The focus of our systems is based on the approach to provide 1 system for many different applications. By pursuing continuous improvements and setting the objective to provide our customers the most convincing test handlers, we are always driven to push our products and its features to the limits and exceed traditional boundaries.
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Turret Test And Scan Handlers
Turret platforms for semiconductor test, inspection and packaging.
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High Parallel Test Handlers
High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test.
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IC Pick & Place Handlers
Chroma's IC test and handler solutions assure that IC packaging meets the original design specifications and verify the performance of the IC before it is assembled into the electronic product.
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Gravity Test Handlers
Extremely small to very large packages, very wide temperature range, high throughput octal site and quad site testing.
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CCD Device Handlers
Exatron has been in a unique position to supply handling systems for the new CCD device market. Manufacturers of CCD devices came to Exatron when these devices were new, looking for custom handling applications, and Exatron responded by modifying its Model 3000B, 3000BL, 5000, 5080, and 8000 systems to accommodate CCD devices.
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Test Handler
M4841
High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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High-Speed Laser Mark Handler
MCT MH-3300
MH-3300™ high-speed laser mark handler is used for marking of 2DID codes on the lead frame in support of strip testing, marking of reject devices, and for final package marking in strip test or assembly operations. The MH-3300 offers unparalleled throughput performance and the best cost-of-ownership in the industry.
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Test Handlers
Boston Semi Equipment test handlers are designed for optimum production performance on your test floor.
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100Hz-50kHz LCR Meter
Chroma 11021/11021-L
Chroma Systems Solutions, Inc.
The Chroma 11021/11021-L are the most cost-effective digital LCR Meters, providing 100Hz, 120Hz, 1kHz, and 10kHz test frequencies for the 11021 and 1kHz, 10kHz, 40kHz, 50kHz test frequencies for the 11021-L. Standard RS232 interface, optional GPIB & Handler interface, high speed and stable measurement capabilities enable the Chroma 11021/11021-L can be used for both component evaluation on the production line and fundamental impedance testing for bench-top applications.
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Automated ICT System
With world-famous in-circuit test technologies and innovations around automated inline handlers, Keysight automated inline ICT solutions are versatile and flexible and provide you:
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Test Handler
HA1200
The new HA1200 handler can be linked with a tester to utilize our unique active thermal control technology for testing singulated and/or partially assembled dies. This technology enables testing of powerful high-end SoCs with 100% test coverage. This helps reduce yield loss at final test, thus reducing losses of final multi-die assembled products.
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Final Test Manipulators
for test heads up to 250 kg / 550 lbsfinal test dedicatedhandler docking prolowest possible floor loadeasy motion in z-direction to facilitate docking processforce feedback control feature ensuring operator safety and protecting equipment during set-upactive cable managementdurable and robust designoptimized footprint for various test heads580 mm linear in/out motion for handler service access160 mm linear side-to-side feature270 column pivoting featurenumerous additional, unique features for individual set-up requirements
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300KHz Precision LCR Meter
Model 4300R
Aplab Precision LCR Meter Model 4300R is a new generation of impedance test equipment with high accuracy, wide measurement range and six digits resolution. Being featured with test frequency up to 300kHz, test voltage of 5mV ~ 2V, built-in -5V ~ 5V DC bias and -10V~10V DC voltage source output, it can meet all requirements for measuring components and materials and provide guarantees for production line quality assurance, incoming inspection and laboratory precision measurements. The Handler, RS232C and GPIB interfaces as well as improved command system provided by the instrument make it easier to build the test system.
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Line Automation Equipment
5000 Series In-line Handler
The Circuit Check 5000 Series In-line Handler is an integrated inline solution that combines automation, fixturing and measurement hardware in addition to other in-line PCBA probe based test stations, while adding a standardized quick change fixture interface. The 5000 series in-line is a unified solution that is software and hardware agnostic, enabling adaptability to a variety of off-the-shelf lower cost ICT, flash and functional test software and hardware.
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Die Test Handler
3112
Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
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MEMS Inertial Test
Cohu´s inertial solutions enable high precise Gyroscope and Accelerometer test with best-in-class cost of test due to high parallelism and package flexibility. All Cohu stimulus modules guarantee high precision and velocity stability as well as high temperature accuracy. With use of our high efficient handler portfolio we can offer the ideal solution with optimized cost of test.
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Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
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Digital Low Resistance Tester
TH2512
Shenzhen Chuangxin Instruments Co., Ltd.
The TH2512 series digital dc low resistance tester i s an intelligent, wide range, high-precision tester which suitable for transformer, inductor copper resistance, relay contact resistance, switches, connectors, wire resistance, contact resistance component solder contact resistance, PCB line, welding hole resistance and metal detection, etc. It’s applied to the production line and can use HANDLER interface and GPIB interface (option) output good/bad signal, in order to improve production line automation testing capability.
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Hybrid Single Site Test Handler
3110
Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
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Slip Line Detection System
YIS 200
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.
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Programmable LCRZ Meter
DU-6212/6215/6216
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 55 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Package Test Loadboards/DIB
DTS Package Test (DIB) loadboards are designed to specific devices and configured for both hand test and fully automated handler applications. DTS loadboards incorporate any brand of socket or contactor and can be configured for multi-site testing. Designs incorporate all necessary components, connectors, mechanical hardware and stiffeners to provide a complete plug-n-play solution. DTS has a vast database of tester and handler information which allow designs to be started and completed quickly without burdening the customer to supply excessive information. DTS designers are experienced in all device types, including digital, analog, mixed signal and RF devices.
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Logic Test Handler
M620
- Maximized Productivity- Handles various device size- Short conversion time- Easy mantenance- Minimized footprint
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Software Tool Especially Designed for Production Process Supervision
LEON OP
The Leon OP is a software tool especially designed for production process supervision. Therefore, the application provides the following key features:- Execution of KT ICT sequences or NI TestStand sequences- Parallel, semi-parallel or sequential execution of test sequences, individually definable per Test Sequence- Customizable User Interface, simple or detailed test views, grid or board layout arrangement possibilities- Tracing into sequence execution- User management with different user levels and restrictions per user group- Displaying execution results and statistics by panel or nest- Supporting interaction with an automation (e.g.: handler system)- Supporting interaction with a process control / MES system- Integrated Callback structure to adopt to different workflows- Maintenance view for fast displaying of fails inside a board- Result History View to quickly access the last test results- Store execution results in result files with user defined format- Autostart-option for running application in automation mode without any operator interaction at all- Several abortion criteria to abort execution by fail count (consecutive or time based)- A Maintenance View for viewing testprobe locations on the DUT is available via Aster Quadview
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Clinical Microplate Instrumentation
Clinical microplate instrumentation provides high efficiency and performance for your clinical diagnostic workflows. From ELISA microplate readers and washers, to multifunctional liquid handling, multimode detection and automated microscopy, Agilent BioTek microplate instruments and software are designed for ease of use in setup and operation, while providing powerful analysis for quick, high-quality results. For even greater automation and higher throughput, microplate stackers, handlers and automated incubators transform a benchtop instrument into a walk away automated system.
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LCR Digital Bridge
FD2810B
• Test parameter: C, R, L, Z, D, Q• Test frequency: 100Hz, 120Hz, 1kHz, 10kHz• Test level range: 0.1V, 0.3V, 1.0V• Output impedance: 30Ω, 100Ω• Slow or fast (15 times/s)• Automatic selecting, out of limit alarming• Provide the RS-232 & HANDLER interface• Accuracy: 0.1%
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Kitless Pick-and-Place Handler
900
Exatron now offers a new breed of Benchtop Pick & Place Handlers: the Model 900 series. The Model 900 is an extremely efficient yet inexpensive PC controlled Pick & Place System
