Acoustic Doppler Profilers
measure water current velocity across a range of depths. Also known as: ADP
See Also: Current Profilers, ADCP, Doppler Radar
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Product
Autonomous Pulsed Doppler Wind LiDAR System
Galion
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The Galion LiDAR, distributed by SgurrEnergy, has been optimised for collecting data for wind power applications. The all-sky scanning capability enables many more data collection opportunities than VAD scanning alone.
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Product
Profiling Current Meter and Wave
SeaGuardII DCP Wave
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The SeaGuardII DCP Wave is a 600kHz Doppler Current Profiler able to measure directional wave parameters and currents from a bottom mounted installation.The Acoustic Wave software 5759 used by the DCPS implements unique features to improve the wave measurement accuracy by optimizing the signal to noise ratio.Maximum deployment depth is 40m in normal scatter conditions. The Profiling Current Meter and Waveis available as a self-recording instrument. It can be easily integrated into a real-time system offering reliable two-way communication.
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Product
Acoustic Emission Calibrator
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AE calibrator is similar to a simple signal generator, it can generate a variety of controlled waveform signal, different types, different amplitude and different frequency. It can help users calibrate acoustic emission detection equipment before acoustic emission detection.
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Product
Doppler Radar Target Simulators
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Automotive radar sensors play a vital role in the current development of autonomous driving. Their ability to detect objects even under adverse conditions makes them indispensable for environment-sensing tasks in autonomous vehicles. As their functional operation must be validated in-place, a fully integrated test system is required. Radar Target Simulators (RTS) are capable of executing end-of-line, over-the-air validation tests by looping back a received and afterward modified radar signal and have been incorporated into existing Vehicle-in-the-Loop (ViL) test beds before. However, the currently available ViL test beds and the RTS systems that they consist of lack the ability to generate authentic radar echoes with respect to their complexity. The paper at hand reviews the current development stage of the research as well as commercial ViL and RTS systems. Furthermore, the concept and implementation of a new test setup for the rapid prototyping and validation of ADAS functions is presented. This represents the first-ever integrated radar validation test system to comprise multiple angle-resolved radar target channels, each capable of generating multiple radar echoes. A measurement campaign that supports this claim has been conducted.
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Product
Acoustic Calibrator
Beddrock BACx
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The Bedrock BAC1 and BAC2 acoustic calibrators are used to accurately verify (and if neccesary adjust) the level calibration of your Bedrock acoustic measuring instruments. We recommend the BAC1 for the Bedrock SM90 class 1 instrument, and the BAC2 (which complies with class 2) for the Bedrock SM30 and SM90. Each calibrator comes with an individual calibration certificate.
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Product
3D Optical Profilers
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Bruker is the industry-leading provider of 3D surface measurement and inspection solutions, offering systems for fast, reliable, and easy-to-use non-contact analyses with best-in-class accuracy on samples ranging in size from microscopic MEMS to entire engine blocks. They provide researchers and engineers in R&D, manufacturing, and quality control the industry-leading sensitivity and stability necessary for precision 3D surface measurements in applications and environments that are challenging for other metrology systems.
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Product
Low Profile PCI Express 8-Port
7802ec
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The 7802ec low profile PCI Express serial interface provides eight serial ports, each individually field-configurable for RS-422 or RS-485 communications. Each serial port features an ultra high-speed UART, flexible clock prescalar, and large 256-byte Tx/Rx FIFOs allowing the adapter to support the widest range of standard and non-standard baud rates exceeding 1 Mbps. These features make the 7802ec ideal for data-intensive applications that require reliable, ultra-fast throughput rates.
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Product
Doppler Sensor Modules
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Doppler radar measures the Doppler effect, or an increase or decrease in the frequency of sound, light, or other waves as the source and observer move toward or away from each other.
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Product
Oven Temperature Profile
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Temperature profiling provides an effective method for measuring the actual environmental and product temperature during the cure process - essential for ensuring quality finish and a successful cure of a powder coating.
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Product
Stylus Profilers
Dektak
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Bruker's Dektak® stylus profilometers are the culmination of over five decades of proprietary technology advances. They provide repeatable, reliable, and accurate measurements — from traditional step height measurements and 2D roughness surface characterization to advanced 3D mapping and film stress analyses. With over 10,000 systems installed around the world, Dektak surface profilers have been widely accepted as the gold standard for measuring thin film thickness, stress, surface roughness and form in diverse applications areas from academic research to semiconductor process control.
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Product
Profiling Belt Radiometer
ILT400
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International Light Technologies
The IL400 Profiling Belt Radiometer continues with the all-in-one exposure, intensity, and profiling capability first introduced in the IL393. New solid-state detector and ultra-stable amplifier technology along with rechargability combine to give lower noise, greater speed, and higher accuracy at a price below any precision belt radiometer sold today.
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Product
Surface Profilers
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Taylor Hobson offers a world leading range surface form, surface finish and metrology solutions for 3D contour,ideal for the most demanding applications.
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Product
ElcoMaster Oven Profiling Software
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*Oven Logger set up & programming*Paint/Powder parameter library*Product probe maps*Fully customisable inspection templates*Selectable probe/channel traces*Statistical analysis by probe/channel*Max, Min, standard deviation, coefficient of variation*Temperature profile, cure progress, histogram & individual cure value graphs against product*Time at temperature, time of peak difference*Time above maximum absolute & minimum cross link temperatures*Fully customisable inspection reports*Combined reports - coating thickness, gloss, adhesion, profile, climate, surface cleanliness*Report generator wizard & PDF generator*Email or export data*Import photo’s, data sheets, critical data, inspection notes, etc & include on inspection reports*Cloud computing - allows for cross site collaboration, including internal text messaging tool*Overlay temperature profiles, review and compare multiple oven profiles over time*Use additional data loggers for multiple channels or run overlays
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Product
Wafer Edge Profile Measurement
WATOM
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WATOM can carry out fully automatic, non-contact measurements of the edge profiles and diameter in accordance with SEMICON standards. A special feature is the system's ability to make measurements of the mark cut into the edge of the wafer to indicate the crystal orientation. Because of its high measurement accuracy of less than 1.5 µm, leading wafer manufacturers across the world use WATOM for shop-floor geometrical quality control.
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Product
RTXCview System Trace and Profiling Tool
RTXCview
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RTXCview is a system trace tool designed to work in tight integration with the RTXC Quadros RTOS family. This powerful visualization tool gives you deep visibility into system performance and behavior. Typical embedded system development tools such as debuggers can only provide a static view of your system, focusing on code-level details. RTXCview complements this view by providing a system-level view, showing how tasks and interrupts interact with the RTXC kernel.
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Product
Low Profile PCI 8 Reed Relay Output
8012H
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Optimized for sensing 24V inputs, the 8012H Low Profile PCI digital interface provides eight Reed relay outputs (SPST) and eight optically isolated inputs supporting 10-30V. Reed relays are well suited for low current applications. The relays are normally open, and close when energized. The board is MD1 Low Profile and Universal Bus (3.3V and 5V) compatible.
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Product
Surface Profile Gauge
123
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The Elcometer 123 Surface Profile Gauge is an easy to use analogue gauge which measures the peak-to-valley height of a blast cleaned surface in a similar way to the Elcometer 224 Digital Surface Profile Gauge.
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Product
3U OpenVPX 6-slot Profile BKP3-CEN06-15.2.12-n
65c306-15212-30
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3U OpenVPX Backplane 6-slot, VITA 65, Backplane profile BKP3-CEN06-15.2.12-n, payload slot profile SLT3-PAY-2F-14.2.7, peripheral slot profile SLT3-PER-1F-14.3.2, switch slot profile SLT3-SWH-4F-14.4.4, power connections with M3/M4 power bolts.
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Product
High Intensity Acoustic Sensors
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Columbia Research Laboratories
Columbia's High Intensity Acoustic Sensors are designed for the measurement of gas-borne sound in industrial applications. They are constructed of type 316 SS for use in corrosive environments. These sensors offer a variety of connector and mounting options, all of them when combined with the all-welded construction provide a true hermetic seal.
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Product
Laser Doppler Vibrometer
LV-1800
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The LV-1800 non-contact type Laser Doppler Vibrometer uses newly designed interference optical system and has achieved improvement of detection sensitivity by 20 dB compared to the conventional models. The built-in positioning camera makes it easy to check the target by laser beam irradiation.
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Product
Analog Surface Profile Gauge
NOVOTEST LIMIT
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Mechanical depth gauge is designed to comply with ASTM D 4417-B, SANS 5772, US Navy NSI 009-32, US Navy PPI 63101-000 for (depending on configuration): measures the peak-to-valley height of a blast cleaned surface; measurement the depth of focal corrosion; measures depth of narrow holes and grooves.
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Product
Doppler Sensor Heads
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Designed for long range motion/speed/directional detection where the sensitivity is essential.
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Product
Acoustic Transducer
RESON TC 2178
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The TC 2178 is a hydrodynamic dual-frequency transducer, ideal for navigation and carrying out hydrographic surveys. The hydronamic shape in combination with integrated mounting bracket and rope connection points allows for easy over-the-side use on smaller vessels.
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High Resolution Thickness & Surface Profiler for as-sawn Wafers
MX 70x
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The MX 70x series measure Thickness, Warp, Waviness, Roughness and are usable for nanotopography.
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Product
Acoustic Zooplankton Fish Profiler
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The ASL Acoustic Zooplankton Fish Profiler™ (AZFP™) offers a new, economical way of obtaining reliable measures of marine environmental conditions in the water column. The AZFP™ can monitor the presence and abundance of zooplankton and fish within the water column by measuring acoustic backscatter returns at multiple ultrasonic frequencies. Other sonar targets realized from the sonar backscatter data include bubbles and suspended sediments.
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Product
Acoustic Control
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Acoustic Control provides accurate control for high-level noise testing of reverberant chambers or progressive wave tubes. Based on the Spider hardware platform, Acoustic Control achieves quick and reliable control of the noise level to the reference octave spectrum and the overall sound pressure level (OASPL). Included safety features guarantee the safety of the unit under test.
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Product
3U OpenVPX 12 Slot Profile BKP3-CEN12-15.2.6-4
1OVX312DZL-1X11R
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Hierarchical star x 2, no expansion plane| control plane, supports PCI Gen 3, 3U, 12 Slots.
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Product
Low Profile PCI Express 1-Port
7106e
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The 7106e low-profile PCI Express serial interface provides a single serial port configurable for RS-232, RS-422, RS-485 or RS-530. The ultra high-speed UART, flexible clock prescalar, and large 256-byte Tx/Rx FIFOs allows the adapter to support the widest range of standard and non-standard baud rates exceeding 921.6 K bps. These features make the 7106e ideal for data intensive applications that require reliable, ultra-fast throughput rates.
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Product
Optical Profilers
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Finally, measurements of surface roughness and topography can be made for a price that's less than that of a stylus profilometer. The Profilm3D has sub-nanometer vertical resolution, which surpasses optical profilometers that cost 3x as much. It does so by using the same state-of-the-art measurement technologies as the most sensitive optical profilers available: vertical-scanning interferometry (VSI) and phase-shifting interferometry (PSI).
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Product
3U OpenVPX 3 slot Profile BKP3-CEN03-15.2.9-4
1OVX303QXL-1X11
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Single Star, no expansion or control planes, Gbaud rate to 8, 3U, 3 Slots.
