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In-Circuit Test
Testing of short circuits, open circuits, component values and operation of ICs.
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-circuit Testers, In-circuit Test Systems, Combinational Testers, ICT
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Flying Probe Test System
A8a
The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.
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Circuit Breaker Analyzers & Timers
CAT Handheld Series
When it’s not practical to use conventional robust circuit breaker analyzers, a handheld circuit breaker analyzer and timer may come handy. DV Power has developed a unique CAT Handheld series. It is specially designed for testing of circuit breakers with one break per phase. Their compact and ergonomic design can provide a wide range of features and reliable operations in low, medium and high-voltage substations or in industrial environments.CAT Handheld series consists of two models, CAT-P and CAT-H. Both of them have a large (5,7 in) colored touch screen display. Because of that, test results are visible in dark places as well as in bright sunlight.Powerful internal Li-Ion battery of the instruments can last up to 8 hours of testing without recharging.CAT Handheld series records:main contacts operating times,contact synchronization,sequence time,a resistance of pre-insertion resistors,open and close coil currents,main contacts bounce time,auxiliary contact time,DC Voltage.Multiple operations, such as Open-Close and Open-Close-Open, can be initiated by using a predefined delay time or by triggering signal from current clamps connected to circuit breaker coil.CAT-H is capable of performing a coil control, while this feature is optional at CAT-P instrument. In contrast to CAT-H, CAT-P instrument can execute “First Trip” test.Both instruments display numerical and graphical results. Because of that, a user can easily overlay up to 4 records in the graphical form and make a quick on-site analysis of potential defects.A user can download test results to a PC via Bluetooth interface for more detailed analysis using DV Win software.
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Semi-Rigid Test Probes Up to 6 GHz
Fairview Microwave’s semi-rigid test probe assemblies come in multiple cable diameters to help when attaching the unterminated end of the probe to a circuit board trace. There are two versions including straight-cut probe ends for those that would like to customize the dimensions of the center conductor and dielectric dimensions, as well as pre-stripped probe ends that are ready for immediate use. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, simple sampling measurements can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate. Fairview provides 3 diameters of semi-rigid coax and 3 different lengths from 3 inches to 12 inches to fit a variety of trace widths and applications. All test probes are 100% RF tested to ensure the cable assemblies operate to 6 GHz and also to make sure that the SMA connector interface meets the 1.35:1 VSWR specification prior to shipping. To protect the small diameter coax from damage, each part is shipped in a clear protective tube that can also be used for storing the probes for future use.
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E-Z Check® Plus GFCI Circuit Tester
61-051
*Tests for correct wiring, open ground, reverse polarity, open hot, open neutral, hot on neutral, hot and ground reversed with open hot in 3 wire, 120 VAC circuits*Simulates ground fault for testing GFCI*No-slip ergonomic design maximizes comfort*Premium neon lamps prevent false readings*Tough, impact-resistant case*2-year warranty
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E-Z Check® Circuit Tester
61-035
*Tests for correct wiring, open ground, reverse polarity, open hot, open neutral, hot on neutral, hot and ground reversed with open hot in 3 wire, 120 VAC circuits*Simulates ground fault for testing GFCIs*No-slip ergonomic design maximizes comfort*Premium neon lamps prevent false readings*Tough, impact-resistant case*2-year warranty
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PRECISION COMPONENT ANALYZER
6400 SERIES
The 6430B and 6440B Precision Component Analyzers provide thorough and accurate testing of any passive component to high resolution. In particular, for capacitor manufacturers, the instruments provide capabilities for both fast automatic production testing and complete design characterisation. Users include designers of passive components, manufacturing test, designing and testing materials as well as circuit designers who are evaluating component characteristics.
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Relay Test Equipment
Vanguard Instruments Company, Inc.
The VIC Model PCI-600 is a programmable, high-current source that is designed specifically for utility-substation applications. This alternating current(ac) test device is used primarily for injection testing of protective relays. This same device can also be used for testing thermal, magnetic and solid-state motor-protection relays and molded-case circuit breakers. The PCI-600 is versatile and can also be used in many other applications that require a high-current source.
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M2730 DIGITAL PORTABLE FLOW CALIBRATOR
M2730 is the new digital portable calibrator of ForTest® M series. Enclosed in a container of anodized aluminium with shatterproof plexiglass front, we find a completely new circuit board and a mass flow meter sensor, for direct measurement of leaks. Coupled to the micrometer nozzle supplied, they are designed to simulate the desired leakage, facilitating the procedure for programming and verification of leak test instruments.
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Current Measurement Probes
Comprehensive line of clamp-on current probes covers the entire spectrum of applications, from electrical panels to substations. AEMC Current Probes measure current without interrupting the circuit under test and extend the measuring capabilities of DMMs, recorders, power meters, and loggers. The numerous jaw sizes are designed to accommodate a wide variety of conductor diameters and ranges. Available for AC or DC measurements.
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The Ultimate Circuit Tester Kit
28640
The tester kit tests low voltage up to 28 volts. Also finds electrical shorts, checks polarity, detects battery drain, and checks circuits from a distance. Heavy-duty coil cord extends over 8 feet. Detachable, spring-loaded hook pulls the center of the wire into the probe every time. Attach alligator clip to the probe when a clip-on connection is needed.
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Appliance/Tool Tester
FISHER TESTERS AUTOMATIC TEST EQUIPMENT
• Touch Screen Interface• Windows® 10 Pro• High Reliability with Proven Design• Lowest Board Count In Industry• No Proprietary Circuit Boards• USB Interface – No I/O boards in Computer• Remote Control Software for Factory Diagnostics/Updates• Full Network Compatibility• Integral Statistical Reporting• Test Data May be Stored in Multiple Formats• Two Year Warranty on Electronics
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Volt-Finger Detector / Driver
LVD-18
Standard Electric Works Co., Ltd
● Bright LED and audible alarm sound when voltage is present.● Designed for both contact and non-contact voltage detection.● Direct contact voltage detection: 50V~600Vac.● Non-contact voltage detection: 50V~600Vac.● Can be used to detect voltage in lighting fixtures, circuit breakers.● Compact and handy.● Can be used to find a break in a wire.● Continuity test and basic driver function..● Flashlight.
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DC Electronic Load
M9822/M9822B
M9822/M9822B is newly designed circuit adopts rapid AD and DA technology to achieve rapid measurements with high accuracy. And the resolution of 0.1mV/0.1mA can effectively display the minor change of voltage and current, so the instrument has a wider application field and achieves better test results. Meanwhile your operation becomes much more comfortable and easy by equipping the high-light VFD, the simple menu and displayed contents and the operation state indicators on all keys. Otherwise the complete and humanized test functions will greatly improve your productivity.
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JTAG Visualizer
JTAG Visualizer is an advanced graphical viewer and data management system for PCB schematics and layouts. Visualizer integrates seamlessly with the JTAG Technologies family of boundary-scan products, such as the ProVision application development platform, and accepts PCB data from a variety of CAD, CAM and EDA tools. In design Visualizer provides DfT (design for test) feedback to the user by enabling a graphical view of fault coverage on their design. In manufacture and test Visualizer can be used to highlight faulty nets (short circuits, opens, stuck-ats etc.) in both layout and schematics views.
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PXI-2535, 544-Crosspoint, 1-Wire PXI Matrix Switch Module
778572-35
544-Crosspoint, 1-Wire PXI Matrix Switch Module—The PXI‑2535 is a high-density 4x136 PXI matrix switch module that is ideal for routing low-power DC signals in validation test systems of mass produced devices such as semiconductor chips and printed circuit boards (PCBs). Featuring field-effect transistor (FET) relays, the PXI‑2535 offers unlimited mechanical lifetime and switching speeds up to 50,000 crosspoints/s. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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Multiple Channel Burn In Power Supply
MCPS
The most important features of this burn in power supply is its ability to hold a constant output for each channel even in the event that a unit under test on one channel may short and fail. Since each channel has it''s own transformer, no glitches or voltage spikes can get into any of the other channels. This image shows the results as the second channel from the left is shorted with a small wire and the circuit breaker pops out. Used for burn-in testing and other timed testing where power isolation is required. Very basic simple circuit, see schematic below. Cleans and frees up benchtops, burn in racks and work space clutter. Available in benchtop or rackmount.
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Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Component Test and Analysis Laboratories
The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testing. The component analysis team offers the analytical expertise and advanced instrumentation to identify root cause explanation for a wide range of component-level failures, as well as the resources to evaluate for possible quality and reliability issues through non-destructive and destructive techniques. With access to a detailed database, the Component Test and Analysis team offers a 25-year history of test and analysis data — a valuable resource for addressing new customer requirements.
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Copper Diffusion TestSystems
Materials Development Corporation
MDC announces the addition of software and hardware for copper diffusion studies to its CSM/Win suite of semiconductor test systems and software. This new CSM/Win feature plays an important part in the development of processes and materials for the next advance in integrated circuit technology that employscopper as a conductor. Special Current-Voltage Bias-Temperature Stress (IV-BTS) software can measure the degradation of insulator quality due to copper diffusion.Multiple test sites can be stressed with a constant voltage while the current through each site is measured and recorded. The Current-Voltage Bias-Temperature Stress test supplements conventional MOS C-V measurements and Triangular Voltage Measurements (TVS) that are also employed in copper diffusion studies.
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Insulation Resistance Testers
Shanghai Beha Electronics Co., Ltd.
*This is a variable high voltage insulation tester from 500V to 15kV in 500V steps.*The is menu driven and uses Dynamic Current Auto ranging technology.*It has a Bar-Graph which displays the voltage stressing the insulation while the test is in progress and the voltage decay during the automatic discharge of the tested circuit.*The top line of the display shows the elapsed time at the start of the test. Digital readout of the total time will remain displayed even after testing has ceased.*A 4-digit display (2000 counts) is showing the actual insulation resistance.*This instrument displays a voltage warning and sounds when AC or DC is present before injecting the test voltage.
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Solid State Voltage Injector
J2110A
While it is possible to obtain high quality injection transformers with bandwidths as wide as 1Hz to 5MHz or more, in some cases this is still insufficient for some tests. For example a typical heater control loop might have a bandwidth of less than 1Hz while some linear regulators and opamp circuits can have bandwidths of up to 100MHz or in some cases even higher. For these applications, a solid state injector can provide the necessary bandwidth. A solid state injector can perform at DC, while the upper frequency limit is dictated by the components selected and the printed circuit board material and layout. It is possible to obtain a solid state injector with a working range of DC – 200MHz, though above 50MHz the interconnection between the injector and the circuit being tested can become quite critical. It is essential that ripple from the injector power supply does not dramatically degrade the dynamic range or the signal to noise ratio of the measurement. The resulting plots are often much cleaner when using a solid state injector than with a transformer injector.
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10A DIGITAL MICRO-OHMMETER
MPK-2000e
The MPK-2000e digital very low resistance ohmmeter is a portable, microprocessor controlled instrument used to accurately measure resistances of switches and circuit breaker contacts, transformer and motor windings, wire and cable samples, joints in busbars, etc., using test currents from 1mA up to 10A. It uses the Kelvin-type, four-terminals measurement principle, thus eliminating errors caused by lead and contact resistances.
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Non-Contact Voltage Tester
1AC II
The portable 1AC II non-contact voltage tester from Fluke are easy to use – just touch the tip to a terminal strip, outlet, or supply cord. When the tip glows red and the unit beeps, you know there's voltage present. Electricians, maintenance, service, safety personnel, and homeowners can quickly test for energized circuits in the workplace or at home and even detect miswires of an electrical outlet.
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High Flexibility Test Controller Card
TCC 1800-UE
The TCC1800-UE Test Controller Card is a generic control board for production testing of printed circuit boards (PCBs). The board is controlled by a command language on a PC to which it is connected via Ethernet.The TCC1800-UE is designed to work with positive voltages up to 24V. The card provides extensive IO: Analog and digital interfacing, counters, PWM outputs, bidirectional I/O, ethernet-, CAN, USB, SPI and I2C interfacing.
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100 Amp Intelligent Power Management
IPMDS100
- Intelligent Power Management System- 3 - 20 Amp Single Phase Outlets- 3 - 40 Amp Three Phase Outlets- 2 - 60 Amp Three Phase Outlets- Automatic Load Shedding- 100 Amp Mil Spec Input and Output Connector- Easy Access Circuit Breakers- Phase Over Current Protection- Low Voltage Warning- Built In Press to Test
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Software
D2B
The unique capabilities of Teradyne's D2B software enable EMS and OEM manufacturers and partners to interconnect their global enterprises to optimize printed circuit board assembly test and inspection efficiencies early in the manufacturing / build cycle. D2B is a powerful suite of solutions that provides a standards-based architecture that supports GenCAM and ODB++ file formats enabling electronic manufacturers to outperform their competition, maximize profitability, and get to market first.
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Reliability Testing
ELES Semiconductor Equipment SpA
ELES designs and manufacturers reliability test solutions to verify the performance of integrated circuits from concept validation to high volume production during all the test phases. No other company can provide universal equipment for all the reliability tests, or can guarantee a seamless data flow between phases or can apply on chip embedded reliability engineering for data tracking and failure investigation. Clients use our functional test data to proactively analyse variations between lots, between temperature extremes and during lifetime (often these defects escape ATE). The improvements to products and processes needed to arrive at zero defects cannot be driven by the quantity of Big Data alone, the quality of reliability data is a strategic advantage that only ELES can provide.
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Universal Launcher Test Set
TS-217
The TS-217 is an I-level and Depot-level Universal Launcher test set supporting fighter aircraft launchers including the LAU-127, LAU-128, and LAU-129 (AMRAAM), LAU-117 and LAU-88 (Maverick), and LAU-7 (Sidewinder) missile launchers, launcher electronic assemblies, launcher power supplies, and circuit cards. The TS-217 is also used as a depot-level tester for F-18 armament including launchers (LAU-127, LAU-7, LAU-115, and LAU-116), bomb racks (BRU-32), and aircraft pylons (SUU-62 and SUU-63). Additionally, the TS-217 supports MAU-169 Paveway kits, subassemblies, and circuit cards. The TS-217 performs full parametric functional testing as well as troubleshooting to the faulty LRU (I-Level configuration) and SRU (Depot-Level configuration). The TS-217 can be used as an I-Level tester or as a Depot / Acceptance tester for launcher subassemblies.
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POWER PROBE MAESTRO
PPTM01AS
*Connects with the new Power Probe Tek application for greater diagnostic functionality*The Maestro and Power Probe Tek App will be compatible to connect with a majority of diagnostic scan tools*Trace mode offers scope-like functionality*Stream and record visual traces of electrical issues found when diagnosing*DC voltmeter with the capability of applying battery supplied voltage or ground*AC voltmeter: TRMS, peak-to-peak/min/max, frequency, duty cycle*Resistance testing with a live or unloaded circuit*Fuel-injector test mode*Driver test for testing module drivers
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Test And Repair
If you are responsible for maintaining a system where faulty electronic modules are not readily replaceable. Innovasys can assist by providing cost effective repair services or by developing support tools to allow in-house repair.Our IPC J-STD-001 certified technicians provide test and repair of electronic modules and are backed by a team of electronics engineers. This gives us the capability to diagnose and repair complex circuitry.Innovasys provides test and repair services to the Defence Materiel Organisation. Our technicians are experienced in effecting repairs to meet strict quality requirements on complex multi-layered circuit card assemblies.
