Breaker Test Systems
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High-Tc Systems
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We offer easy to handle high-Tc systems with liquid Nitrogene as coolant. You can choose between fibre reinforced plastic vessels or glass dewars with robust Teflon shell.
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(2500kN+) Fatigue Testing Systems
8806
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The precision mechanical systems, combined with the advanced features of the 8800 digital controller and Dynacell™ load cells, enable Instron to supply fully-integrated turnkey solutions to meet the most demanding applications. The system can be used to cover a broad range of static and dynamic test applications, covering metals, rebar, high-force fracture mechanics, aerospace panels, civil engineering components, wire ropes, or concrete.
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Measurement System
DPS
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EYCOM develops and manufactures highly accurate and dependablemeasurement systems for permittivity, dielectric loss tangent, or permeabilityby leveraging its accumulated experience and expertise over a long period of time.Capitalizing on such experience and expertise, KEYCOM is committed todeveloping customized solutions for wide range of specific applications such asflexible circuit board, semiconductor, thin film, millimeter wave and microwave frequency board,
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Ferroelectric Test System
LCII
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Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.
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Scienlab Battery Test System – Pack Level
SL1700A Series
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increase the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 90 and 270 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Burn-in Systems
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Incal Offers A Line Of State-Of-The-Art Burn-In Testing Hardware And Software For Retrofit And/Or Total, Customized Burn-In System Configurations.
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Primary Injection Test Systems
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Weshine Electric Manufacturing Co., Ltd
1.DC display primary current, secondary current test value, easy to observe and record the experiment..2.High measuring accuracy: 0.5 level.3.Small size light weight easy to carry.
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Modular Test System
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A modular test system, RTS (real time scanner) provides instant test results with minimal interface cables to check wiring during installation.It tests wire harnesses in real time using our micro switching technology, reducing the need for high cost interface cables by around 90%. an innovative best-in-class solution for FAL testing, RTS also offers many benefits for wire harness and sub-assembly manufacturers.
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MultiBeam System
FIB
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An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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Development System
FE-51RD2
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* Emulates Atmel AT89C51RD2, AT89C51ED2 and others * 60K Code Memory * Real-Time Emulation * Frequency up to 20MHz/3V, 33MHz/5V * ISP and X2 Mode Support * MS-Windows Debugger For C And Assembler * Emulation Headers and Signal Testpoints * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
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Transforming Analog Circuit Breaker Testers
MAC-21
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The MAC-21 uses proven microprocessor and A/D converter technology to provide real-time waveform analysis. This ensures accurate true-RMS readings of current pulses, even with DC offset and distortion, which are typical in primary injection testing. Intelligent threshold algorithms provide accurate trip time measurement. Integration of measurement and control functions allow advanced features such as preset on times, auto ranging, and optional printer or computer interface.
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Automotive Test System
LABCAR
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The LABCAR product family comprises software, hardware, and models suitable for integration into tailor-made testing systems that fit perfectly into existing processes. Deployable from the earliest to the latest phases of development, the LABCAR family provides for efficient verification and validation of embedded systems and software.
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Portable Test System
MT680s
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Actual value, vector, curve displaypower generationerror measurementMeasurement of harmonics up to the 40thVoltage supply via existing measurement voltage
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LED Driver Automatic Test System
ATE-2
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•This system includes 2 groups (left and right); the 2 groups can work in turn, so that to improve the work efficiency. For example, if the left is on working, then the right can make wire connection. •It can test 4 LED drivers input and output at one time. •The equipment can connect with electronic load and LED load, the two difference loads can be fast switch under the control of computer. •Enable to print out the series number and parameters of sub-quality products by working with a micro-printer, •Enable to achieve the bar-code record function by working with a bar-code scanner. •The test report can be saved as Excel file for consult, statistic and analysis purpose. •Good software interface to freely choose the difference parameters combination, so that to meet different demands. All the parameters can set limit, and with the quality analysis function.
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Meter Testing System
ASTel
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Three-phase Meter Test Equipment of ASTeL 3.2x.x series system is a fully automatic system enabling simultaneous, multi-position calibration and legalization of electric energy meters. The automatics include power sources, reference standards, stand controllers, photoelectric scanning heads, separating transformers, and other elements of the system. All these elements are controlled through a Windows based executive program.
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OTP-Based Test System
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Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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Battery Test System
WBCS3000Ls / WBCS3000Le
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Low current model8 channel battery cycler (expandable up to 128 channels)max. voltage range : ±5Vmax. current range : - Model WBCS3000Ls : ±10mA - Model WBCS3000Le : ±100mACustomized specification is available.
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G3 System
Dragonfly
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Unique 2D imaging technology provides fast, reliable inspection for sub-micron defects to meet today's R&D needs and tomorrow's production demands. Onto Innovation's patented Truebump® Technology combines multiple 3D metrology techniques to deliver accurate 100% bump height metrology and coplanarity.
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Collaboration Systems
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Solutions for small meeting, huddle, or collaboration spaces that foster group sharing using technology.
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Residential Meter Test System
RADIAN RM-17
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The Radian Research RM-17 Residential Meter Test System offers simplicity for testing residential watthour meters. In a compact, lightweight package of 7 pounds, the RM-17 delivers accuracy and flexibility in a practical solution to watthour meter testing. The RM-17 combines simple operation, advanced data management, and exceptional accuracy to provide a cost effective approach to field testing.
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Battery Test Systems
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Low current model32 channel battery cycler (expandable up to 128 channels)No. of minimum channel : 16 channelsmax. voltage range : ±5Vmax. current range : ±10
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High Voltage AC Test Systems
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Our range of high voltage AC test systems cover from 5kVac to 100kVac. All units have a variable trip range setting and key lock operation to prevent unauthorised use. Applications include testing of insulation systems and measurement of break down voltage of electrical plant and components.
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Flying Probe PCB Test and Repair System
GRS500
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Designed to help troubleshoot complex boards when fixture based tools are not a viable solution, the GRS500 is designed to help you compare the characteristics of good and faulty PCBs, using nodal impedance test, and a "Videosection" technique which presents you with high resolution images of a good board for use in live video comparison with the board under test,
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Optics Test Systems
Lens Test
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Optik Elektronik Gerätetechnik GmbH
LensTest enables the measurement of air gaps, lens thickness, lens radii and lens surface centration errors in mounted lenses as well as the active alignment of lens surfaces during optics assembly for centering without rotating the assembly.
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Development System
FE-51CC01
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* Emulates Atmel T89C51CC01/2 and T89C51AC2, T89C5115 * 60K Code Memory * Real-Time Emulation * Frequency up to 20MHz/3V, 33MHz/5V * ISP and X2 Mode Support * MS-Windows Debugger For C And Assembler * Emulation Headers and Signal Testpoints * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
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Electro-Dynamic Vibration Test System (Air Cooled)
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HIACC Engineering & Services Pvt. Ltd.
The air-cooled electro-dynamic vibration test system has a wide frequency range, high reliability, easy to operate and small foot-print area. The force ranges from 1kN to 70kN, and maximum load is from 70 kg to 1000 kg. This product can be integrated with HIACC’s environmental chambers.
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Product
330 System
NSX
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With a combination of inspection plus metrology, NSX 330 System measures multiple applications including wafer-level metrology for micro bumps, RDL, kerf, overlay, and through silicon via (TSV) in a single wafer load.
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Handover Test Systems
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Family of handover test systems designed for handset-to-network handover testing. Internal step attenuators allow the RF signal between the network access points and the handsets to be dynamically faded up/down. The Ethernet/Serial models run our latest generation 3.x.x firmware that features easy to use ASCII formatted commands.
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Capacitance & Tan-Delta Test System
TD-1
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By measuring the electrical properties such as capacitance and Tan-Delta regularly on periodical basis, it is possible to ensure the operational unexpected breakdown. Dissipation factor (Tan Delta) is one of the most powerful off-line nondestructive diagnostic tool to monitor the condition of solid insulation of various high voltage equipment.
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Automated Test Equipment
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These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
