Computer Aided Test
Computer Aided Test
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Product
Extreme Rugged PCI-104 Single Board Computer with Intel® Atom™ Processor E3800 Series SOC
CM3-BT1
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The CMx-BTx is a PC/104-based, Single Board Computer (SBC), fully compliant with the PCI-104 Specification, Version 1.1 and partially compliant with the PC/104 Specification, Version 2.6. PC/104 SBCs are very compact and highly integrated computers. This SBC features the 22nm, Intel® Bay Trail SoC. The board provides a DDR3L SO-DIMM socket, a PC/104 connector, a PCI-104 connector, two USB 2.0 ports, one USB 3.0 port, up to two Gigabit Ethernet ports, up to two SATA 3 Gb/s ports, one dedicated HD-Audio panel connector, one VGA port, one LVDS port, up to four COM ports, one mini-PCIe slot (with one USB 2.0 port included). The CMx-BTx can be run with only 5 volts and is capable of running operating systems like DOS, Windows XP/7/8 in either 32-bit or 64-bit configuration, Linux, VxWorks, and others. Another feature included on the board is a fail safe BIOS that enables the user to start the module even if the original BIOS is corrupted.
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Product
COM-HPC Server Type Size D Module with Intel® Xeon® D-2700 Processor (formerly codename: Ice Lake-D)
COM-HPC-sIDH
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ADLINK’s COM-HPC-sIDH COM-HPC Server Type Size D module is based on the Intel® Xeon® D-2700 processor and features integrated high-speed Ethernet for up to 8x 10G or 4x 25G combined with 32 PCIe Gen4 lanes for instantaneous responsiveness and performance. Equipped with Intel® TCC, Deep Learning Boost (VNNI), and AVX-512 technologies for optimal, accelerated AI performance, and support for Time Sensitive Networking (TSN), it offers precise control for hard-real-time workloads across all networked devices.
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Product
Sealed Beam Bulb Testing System
H710019SSL
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EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Product
Audio and Acoustic Functional Test Solution
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With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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Product
ATE Self Test Fixtures
AL663
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AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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Product
Test Fixture (SMD Components)
16034E
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Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Product
Compact Modular Industrial Computers Based On 14/13/12 Gen Intel® Core™ Processors
MVP-5200 Series
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The MVP-5200 Compact Modular Industrial Computers powered by 14/13/12th Gen Intel® Core™ i9/i7/i5/i3 and Celeron processors. Featuring Intel R680E chipset and supporting up to 65W, the computers can also incorporate GPU cards in a rugged package suitable for AI inferencing at the Edge, and can be used for but not limited to smart manufacturing, semiconductor equipment, and warehouse applications.
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Product
Build-to-Print for Test Systems
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Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Product
VXI Digital Multiplier
4152A
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The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Product
Semiconductors Testing
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Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
200 Vdc External Voltage Bias Fixture
16065A
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Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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Product
Test Handler
M6242
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Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Product
Automated Test Equipment
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These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
In-Line RF Test Platform
AR925
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This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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Product
6TL23 Off-Line Seat Operation Base Test Platform
H71002300
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The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
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Product
Disk Drive Test System
Saturn
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The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Product
NI HIL and Real-Time Test Software Suite
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Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
CATR Benchtop Antenna Test System
ATS800B
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Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
ARINC-708 Module
M4K708
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The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
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Product
COM-HPC Server Type Modules
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The COM-HPC specification currently defines two server modules. The largest of the server modules, Size E (200mm x 160mm), offers up to eight on-board DIMM sockets. The power input is a single 12-volt supply that can deliver up to 358 watts of power, and there are 64x lanes PCIe Gen5 in total.
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Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Memory Test System
T5801
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Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
Client Type COM-HPC Size C Module with 13th Gen Intel® Core™ Desktop Processor
COM-HPC-cRLS
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ADLINK’s COM-HPC-cRLS COM-HPC Client Type Size C module is based on 13th Gen Intel® Core™ desktop processor. It features Intel’s advanced hybrid architecture (with up to 8 P-cores and 16 E-cores) along with 16 PCIe Gen5 that provide superior performance with fewer lanes than its predecessors, allowing for simplified designs and reduced time to market to drive various AIoT deployments.
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Product
Wireless Device Functional Test Reference Solution
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The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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2.5” Pico-ITX (MI/O-Ultra) Single Board Computers
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Advantech's 2.5" Pico-ITX (MI/O-Ultra) single board computer (SBC) measure 100 x 72 mm and feature REAR I/O, fanless operation, small form factor(SFF), compact and ultra slim design, extended temperature range, and low power consumption.
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Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
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The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Product
NFC Conformance Test System
T3111S
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The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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Product
Computer-On-Module
ETX®
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ETX is one of the earliest successful computer-on-module form factors. Today it is still widely used in applications such as industrial automation, transportation and medium and low level medical appliances. While high-end Intel® Core™ applications have mostly migrated to COM Express, ETX is still very much alive in the lower power segment, mostly notably using Intel Atom® SoCs.
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Product
Intel® Atom™ SoC E3825/ J1900 Pico-ITX SBC, DDR3L, 24-Bit LVDS, VGA Or HDMI, 1 GbE, Half-Size Mini PCIe, 4 USB, 2 COM, SMBus, MSATA & MIOe
MIO-2263
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Embedded Intel® Atom™ SoC E3825 & Celeron J1900 up to Quad-Core processor design, DDR3L 1333MHz support up to 8GBIntel Gen 7 DirectX®11.1 support, dual independent display by 24-bit LVDS + VGA or 24-bit LVDS + HDMIFlexible design using integrated multiple I/O: MIOe to approach vertical applications & keep domain knowhowRich I/O interface with 2 COM, 1 SATA, USB3.0, PCIe Mini Card and mSATASupports iManager, SUSI APIs, WISE-DeviceOn and Edge AI Suite
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
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Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
