High Voltage Test
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SoC/Analog Test System
3650-S2
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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NI-9225, 300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module
780159-01
300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module - The NI‑9225 performs differential analog input. The wide measurement range is well suited for high-voltage measurement applications such as power metering, power quality monitoring, motor test, battery stack testing, and fuel cell tests. You can perform transient and harmonic analysis with high-speed simultaneous sampling. In addition, you can prevent ground loops and add safety to a system with 600 Vrms channel‑to‑channel isolation between the three NI‑9225 channels.
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NI-9209, ±10 V, 500 S/s, 16-Channel C Series Voltage Input Module
783729-01
±10 V, 500 S/s, 16-Channel C Series Voltage Input Module - The NI‑9209 performs single-ended or differential analog input. This module provides 60 VDC CAT I isolation and built-in 50/60 Hz filtering, making it a valuable addition to industrial measurement systems.
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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NI-9221, ±60 V, 800 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module
783732-01
±60 V, 800 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module - The NI‑9221 performs single-ended analog input. The wider voltage range makes this module well suited for industrial-level, automotive, or even smaller-cell battery measurements. There are two connector options for the NI‑9221: a 36‑position spring‑terminal connector and a 37-position D‑SUB connector.
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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6TL22 Off-Line Testing Platform
H71002200
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Seno-Con Test System
PANTHER 2K QST
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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High-Voltage Differential Probe, 100 MHz
N2790A
Use the N2790A 100-MHz high-voltage differential probe to make safe and accurate floating measurements with an oscilloscope. The N2790A probe allows conventional earth-grounded Keysight oscilloscopes to be used for floating signal measurements of up to 1,400 V of differential voltage and 1,000 V of common mode voltage.
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Build-to-Print for Test Systems
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Iridium Physical Layer Test Systems
PLTS
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Physical Layer Test System
N19301B
The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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NI-9264, 25 kS/s/ch Simultaneous, ±10 V, 16-Channel C Series Voltage Output Module
780927-01
25 kS/s/ch Simultaneous, ±10 V, 16-Channel C Series Voltage Output Module - The NI‑9264 is a simultaneously updating analog output module that accommodates higher‑channel‑count systems. Higher density modules conserve chassis space, which leaves room for other measurement types. Each channel has its own digital‑to‑analog converter. The spring-terminal version of the NI‑9264 uses a 36‑position connector for the output channels, and each channel has a ground connection.
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High Current Probes
*Low internal resistance to minimize arching*PogoPlus bias ball design*High current optimized base material and plating*Higher temperature spring design*Specialized high current tip geometry
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Ultra Light High Voltage DC Test Sets
This Compact power supply/test set can perform all laboratory and field tests of DC Hipot. A flexible High Voltage Cable is provided at the back for connecting to the test specimen. Available in Rack Mount as well as portable design.
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FADEC/EEC Test Platform
The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Alternate 24.00 (680.00) - 96.00 (2722.00) Godzilla High Current Probe
HC375F-6
Current Rating (Amps): 100Average Probe Resistance (mOhm): 25Test Center (mil): For more details, please contact us.Test Center (mm): For more details, please contact us.Full Travel (mil): 360Full Travel (mm): 9.14Recommended Travel (mil): 250Recommended Travel (mm): 6.35Overall Length (mil): 3,110Overall Length (mm): 78.99
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HV Test System up to 20000 Volt
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Fastest In-Circuit Test Platform
TestStation
Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Functional Test Trainer System
QT65
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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High Temperature Component Test Fixture
16194A
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Headlamp Test Platform
Leverage 25+ years of automotive test experience, with the specialized design and manufacturing of automotive lighting testers. Using specialized know-how in this field, including photometric, electro-mechanical equipment and software solutions, accelerate your time to market with a higher quality product.
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Test System Replication/Build-to-Print
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Standard 4.47 (127.00) - 12.00 (340.00) High Frequency Probe
K-50B-S
Current Rating (Amps): 6Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 2.50Nominal Impedance (Ohms): 50Test Center (mil): 600Test Center (mm): 15.24Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 90Recommended Travel (mm): 2.29Overall Length (mil): 1,205Overall Length (mm): 30.61
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Rogowski AC Current Probe,30 MHz, 300 A
N7042A
The Keysight N7042A Rogowski coil current probe measures AC currents up to 300 A, with bandwidth ranging from 9.2 Hz to 30 MHz. The probe has a thin, lightweight, flexible, and simple-to-use clip-around Rogowski coil that enables current measurement in the most difficult-to-reach parts and confined spaces of a circuit under test. It can also measure large AC current without an increase in transducer size.
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NI-9260, 51.2 kS/s/ch Simultaneous, 3 Vrms, 2-Channel C Series Voltage Output Module
783467-01
51.2 kS/s/ch Simultaneous, 3 Vrms, 2-Channel C Series Voltage Output Module - The NI‑9260 is an instrument-grade dynamic signal generator for testing the audio components and capabilities of consumer electronic devices and providing excitation in structural test applications. Unlike sound card-based solutions, the NI‑9260 can be deployed quickly and recalibrated to guarantee long-term measurement repeatability and decreased test time. It also features ±30 V overvoltage protection and short circuit protection.
