High Voltage Test
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Product
2.5mm Test Wire Test Probe Pin
CX-3C
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Shenzhen Chuangxin Instruments Co., Ltd.
2.5mm test wire test probe pin 1.Application: Used to verify the protection of persons against access to hazardous parts. Also used to verify the protection against access with a tool.
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Product
Test Automation System for Brake Testing
STARS Brake
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STARS Brake is an integrated automation, data acquisition and control system platform that provides a comprehensive application functionality in a single, powerful environment. STARS Brake is designed to address the needs of a wide range of brake testing applications from component development to final component and system validation. It offers users a level of flexibility and openness that enables thorough investigations of brake systems.
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Product
LCR Meter For High Current Test System
5400L Series
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WK5400 is the test system controller. The DC Bias Current source WK3265B machines are connected to the Bias Adapter of the 5400 directly with a dedicated wiring system. This makes it is easier to set up and maintain the system.
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Product
Environmental Testing
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Educated Design & Development, Inc.
Incredible size / features at a phenomenal price! A must have when a larger chamber is needed. Easy to use, microprocessor based digital controls. Standard models are heat/humidity Humidity range of 10-96%, temperature range of 35°-70° C, Refrigeration can be added for cold testing to -10°. Chamber inside dimensions are 34x28.5x60 in. (87x73x153 cm), many options are available including chart recorder, RS232, programmable ramp/soak, viewing window and CO2 system.
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Product
Indicators - Test
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Measures the deflection of the arm, the probe does not retract but swings in an arc around its hinge point.
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Product
Universal High Speed Bench Test Automation Framework
KayaQ™ (GRL-KAYAQ-FW)
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GRL’s Universal High Speed Bench Test Automation Framework ‘KayaQ™ ’ is an enterprise-quality, Windows 7 PC-based, ready-to-use automation environment for labs overcoming the next generation challenges of bench testing. The world’s leading provider of high speed interface PVT characterization test services, GRL developed KayaQ™ to address the gaps in available tools for high speed interface characterization. KayaQ™ provides a ready-to-deploy automated test solution for testing of high speed interfaces, tailored for the needs of volume bench-level IC PVT characterization.
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Product
Pulsed Withstand Voltage Safety Test
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Suzhou 3ctest Electronic Co.,Ltd.
Designed to test the induced and conducted disturbance on the telecom lines generated by power line and electrical railway. It meets the requirements of YD/T 993-2006(The technical requirements and test methods of over-voltage and over-current resistibility for telecommunication terminal equipment), ITU-T K21 and ITU-T K44.
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Product
Semiconductor Testing
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The integrated PXI platform and the open interfacing provides extension capabilities for additional testing requirements like DUT specific resistors-networks or temperature sensors. The Test System comes with the ready-to-run GTSoftware package and allows easy programming of test sequences (GTbuilder) and fast execution in production/test mode (GTengine).
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Product
Leak Testing
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Leak testing is a non-destructive method to verify the presence of a leak in a component or device.It is implemented as a control methodology for monitoring production process and product quality control. Leak tests are used to find out possible leaks due to non-suitable material (porosity, blowholes, cracks), or in the machining process to find out machining errors or defective parts, and ultimately in assembly, to find out missing or defective gaskets, wrong positioning or assembly. The presence of a leakage could jeopardize the correct functioning of the component, device or its life span, and can also be potentially dangerous for the environment and the safety of its user.
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Product
PXI High Voltage Programmable Resistor Module, D-Type Connector
40-230-026-HI
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The 40-230-026-HI (PXI) and 42-230-026-HI (PXIe) are programmable resistor modules with 4 channels which can be set between 3Ω and 26.7kΩ with 8Ω resolution with maximum voltage of 1kV. The 40/42-230 range provides a simple solution for applications requiring voltage handling up to 1kV (9-pin D-type connector) or 1.2kV (22-pin REDEL connector).
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Product
High Accuracy Spectrophotocolorimeter
LMS-3000
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• Measure and display the relative spectral power distribution (UV-VIS-NIR) P(λ), chromaticity coordinate, correlated color temperature, rending index, color difference, peak wavelength, luminous flux, luminous flux efficiency and photometry parameters of light source and light material under the control of general PC. • Automatically adjust high-voltage, it not only shortens the measurement time, but also reduces the wear and tear of the instrument • Simultaneously measure the temperature in both environment and integrating sphere to make the data more visually and reliably • Figure of chroma and color difference in test report can be exchanged freely • Color display and print. The relative spectral power distribution (UV-VIS-NIR) P(λ), reports both in English. RS-232-C interface, compatible with all kinds of computer • LSP-500 AC Power source PC RS-232-C interface. compatible with all kinds of computer • Range of wavelength: 380nm～780nm(Special:200nm～780nm) • Accuracy of wavelength: ±0.2nm • Repeatability of wavelength: ±0.1nm • Accuracy of chromaticity coordinate: ±0.0003(under standard illuminate A) • Spectrum sample interval: 5nm(Special order:1nm) • Luminosity linearity: 0.3% • Accuracy of luminosity: 1 class • Correlated color temperature measure range: 1500K～25000K • Accuracy of CCT: ±0.3%(under standard illuminate A) • Accuracy of rending index: ±(0.3%rd±0.3) • Environment temperature measure range: -10℃～80℃ • Temperature measure range(In sphere): -10℃～100℃
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Product
Active Voltage Rail Probe
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Voltage rail probes are designed specifically to probe a 50 Ohm DC power/voltage rail. The probe has large built-in offset, low attenuation (noise), and high DC input impedance. Built-in offset and low attenuation permit the power/voltage rail to be offset in the oscilloscope by its mean DC voltage with high oscilloscope gain (sensitivity) to achieve a noise-free view of small signal variations. The high DC input impedance eliminates loading of the DC rail.
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Product
PXI High Voltage Programmable Resistor Module, D-Type Connector
40-230-123-HI
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The 40-230-123-HI (PXI) and 42-230-123-HI (PXIe) are programmable resistor modules with 2 channels which can be set between 3Ω and 3.55kΩ with 1Ω resolution with maximum voltage of 1kV. The 40/42-230 range provides a simple solution for applications requiring voltage handling up to 1kV (9-pin D-type connector) or 1.2kV (22-pin REDEL connector).
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Product
ETL Testing
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Data is of utmost importance in digital systems. Protecting data, therefore, is of utmost importance. ETL refers to Extract, Transform, and Load. It supports the movement of data from its source to storage. With ETL testing we ensure that the data is not lost or corrupted during this movement. Huge volumes of data are collected in various formats and sources. The mapping process of these data is error-prone and can have quality issues.
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Product
PXI High Voltage Programmable Resistor Module, D-Type Connector
40-230-145-HI
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The 40-230-145-HI (PXI) and 42-230-145-HI (PXIe) are programmable resistor modules with 1 channel which can be set between 4Ω and 2.954MΩ with 4Ω resolution with maximum voltage of 1kV. The 40/42-230 range provides a simple solution for applications requiring voltage handling up to 1kV (9-pin D-type connector) or 1.2kV (22-pin REDEL connector).
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Product
Test Handler
ETH
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The ENGMATEC test handler as the "heart" of our inline test solutions impresses with its wide range of applications for in-circuit, functional or final tests. All components of the modular system are coordinated with one another and can be combined with one another and with various production systems. Vision systems, scanners, marking devices and many other functions can be integrated.
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Product
5G Testing
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Teradyne test solutions are at the forefront of the 5G test era. Why? We work with the leading semiconductor manufacturers and provide optimized test coverage for the major wireless standards. From emerging millimeter wave devices to the traditional sub-6GHz, our test solutions are already leading the way.
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Product
LXI High Voltage Switching - 6-Bank, 1-Pole, 8:1 Multiplexer Plugin Module
65-231-909
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The 65-231-909 plug-in module is part of a scalable high voltage multiplexer platform that provides a high voltage switching solution with capability up to 9 kV.
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Product
Leakage Test
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Leakage current and discharge current depend on the insulation of the device. The measurement simulates various fault situations that could occur during operation. The test determines whether the measured current is within the permissible limits and poses no danger to the user in case of a fault.
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Product
High Resistance Meters
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Measurements International Ltd.
Direct or Substitution Measurements, Automatic and Manual Operation, No Temperature Coefficient, Multiple Modes of Operation.
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Product
PXI High Voltage Programmable Resistor Module, REDEL Connector
40-230-225-HI
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The 40-230-225-HI (PXI) and 42-230-225-HI (PXIe) are programmable resistor modules with 4 channels which can be set between 3Ω and 13.6kΩ with 4Ω resolution with maximum voltage of 1.2kV. The 40/42-230 range provides a simple solution for applications requiring voltage handling up to 1kV (9-pin D-type connector) or 1.2kV (22-pin REDEL connector).
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Product
High Impedance Differential Relay
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High impedance protection schemes are widely used for the protection of BUS bars, generators, motors & power transformers. BUS bar protection schemes utilizing electromechanical high impedance differential relays are often used due to their simplicity, reliability & comparatively low cost.
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Product
Single-Channel Voltage Output D/A Converters
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Analog Devices offers a broad portfolio of single-channel voltage D/A converters, which includes many leading products in performance and package size, with resolutions from 8-bit to 20-bit, low power, and a serial SPI, parallel, or I2C interface. Within the industry’s smallest packages, we offer more functionality within smaller board and module sizes. The integration of a precision reference minimizes board area and costs, eliminates the need of calibration, and reduces the number of external components to simplify the design stage.
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Product
Test System
ITC57300
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The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Product
High Performance Computing
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We have a strong and wide-reaching industry reputation and participates in many industry organizations including the Open Fabrics Alliance (OFA), the Ethernet Alliance, and the InfiniBand Trade Association (IBTA).
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Product
Test & Evaluation
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We are a world-leader in the provision of relevant Test & Evaluation services, an enabler to the delivery of advanced defence capability.
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Product
Test Sockets
QFN/QFP
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For today’s chipscale packages, finding the right socket solution can be challenging. With SC™ sockets from Ardent, you can count on the right design, the best performance, and quick turns for even the most challenging custom designs
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Product
High Density Modular Connector
L Series
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The L Series comes with frames in various lengths to accommodate a variety of module combinations. The frames range from a basic frame with just 2 side rails and 2 end caps, to more complex versions with jackscrews, backshells, cable clamps, etc.
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Product
Benchtop Automated Functional Test
midUTS
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Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
