Protocol Test
See Also: Protocol Analyzers
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Product
Protocol Simulation
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Message automation and protocol simulation test tool that supports simulation of a variety of protocols (VoIP/IP, TDM, Analog, Wireless) all within a single framework. The application includes various test plans and test cases to support the testing of real-time entities
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Product
USB 2.0 Protocol Analyzer
Mercury T2
Protocol Analyzer
The Mercury T2 is the industry's smallest, most affordable hardware-based USB 2.0 protocol analyzer that combines the defacto standard CATC Trace display with powerful analysis features. The pocket-sized Mercury T2 is bus powered and is controlled using any Windows PC. With comprehensive triggering, the Mercury T2 provides much of the same lab quality protocol analysis capabilities offered in Teledyne LeCroy's top-of-the-line USB analyzers.
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Product
PCIe 3.0 Protocol Analyzer
Summit T3-16
Protocol Analyzer
The Summit T3-16 is Teledyne LeCroy's fifth generation of protocol analyzers targeted at high speed PCI Express I/O-based applications such as workstation, desktop, graphics, storage, and network card applications.
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Product
ARINC 818 Analyser
Protocol Analyzer
iWave’s ARINC 818 Video Protocol Analyzer (VPA) instantly verifies the ADVB Packets against ARINC818 Standards. ARINC818 VPA software efficiently captures, decodes the ADVB data, and displays the ADVB data, raw video data, and error status. It is an excellent troubleshooting tool that helps to quickly detect and rectify errors in the ARINC 818-2 applications, simultaneously ensuring compliance of the system with the ARINC 818-2 standards.
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Product
PCIe 2.0 Protocol Analyzer
Summit T28
Protocol Analyzer
The Teledyne LeCroy Summit T28 PCI Express analyzer is for customers developing PCIe 1.0 or 2.0 x8 lane width server, workstation, desktop, graphics, storage, and network card applications.
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Product
Protocol Analyzer / Exerciser
Summit M616
Protocol Analyzer
The Summit M616 is Teledyne LeCroy's latest generation of protocol analyzers targeted at high speed PCI Express 6.0 and CXL I/O-based applications such as server, workstation, desktop, graphics, storage, AI, and network card applications.
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
Automotive Test Solutions
test
The testing and simulation systems from this division are used primarily in the automotive and automotive supplier industry. These are, for example, modular function-testing systems and diagnostic tools for automotive ECUs or bus communication systems for a wide variety of electronic components in automotive production. Electromechanical assemblies and entire car seats are also tested to ensure they function
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Product
SAS 4.0 Protocol Analyzer/Jamer/Exerciser System
Sierra M244
Protocol Analyzer
The Teledyne LeCroy Sierra M244 is the industry’s first SAS 4.0 protocol analyzer / jammer / exerciser system for testing next generation storage systems, devices and software.
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Product
Explosive Test Site Range Instrumentation
test
Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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Product
48G Protocol Analyzer / Generator
980
Protocol Analyzer
The 980 48G HDMI module is a feature rich HDMI 2.1a video analyzer and video generator for test any HDMI product or device. The instrument’s HDMI Rx analyzer port provides deep analysis capabilities for HDMI 2.1a Fixed Rate Link (FRL) with Forward Error Correction (FEC) up to 48Gbps (12Gbps/Channel). The analyzer port provides visibility into the Fixed Rate Link packetization—FRL packets, Character blocks and Super blocks. The instrument also supports analysis of the FRL link training functions of a receiver in the FRL mode in both 3 lane and 4 lane configurations to test a source's FRL link training function. Analysis of Display Stream Compression (DSC) is also supported.
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Product
Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
Testing Service
CloudTesting™ Service
test
CloudTesting™ Service is an Industry First, On-Demand Testing Service. CloudTesting™ Station is free rent. Fees for Testing IP are paid monthly.
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Semiconductor Testers
Test Instrument
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
Digital Test Instrumentation
EDigital-Series™
Test Instrument
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Product
High Temperature Component Test Fixture
16194A
Test Fixture
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Product
Military Communications Test
Test Platform
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
Test Platform
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
Test Fixture, Axial And Radial
16047A
Test Fixture
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
6TL60 Rotary Test Handler
H79006010
Test Platform
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Product
PCI Express (PCIe) 5.0 and Compute Express Link (CXL) Protocol Analyzer
Summit T516
Protocol Analyzer
The Summit T516 is targeted at high-speed PCI Express 5.0 and CXL I/O-based applications such as workstation, desktop, graphics, storage, and network card applications.
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Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
Test Fixture
This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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Product
PXIe Optical Test Modules
Test Module
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
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Product
Iridium Physical Layer Test Systems
PLTS
Test System
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
Modular Functional Testing Platform
OTP2
Test Platform
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
