Protocol Test
See Also: Protocol Analyzers
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PCIe 3.0 Protocol Analyzer
Summit T34
The Teledyne LeCroy Summit T34 PCI Express protocol analyzer is designed for PCIe storage, add-in card and embedded application developers. It supports x1 to x4 lane widths with the capability of expanding to x8 with two boxes connected together, and deep buffer memory that is expandable from 4GB to 64GB ideal for storage analysis, the Summit T34 provides unmatched capability and flexibility for developers and users of advanced PCI Express products. Teledyne LeCroy has been the leader in NVM Express and SATA Express protocol analysis since 2010. This storage analyzer incorporates all of these powerful legacy features and adds the latest in storage queuing performance analysis.
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Protocol Analyzer / Exerciser
Summit M616
The Summit M616 is Teledyne LeCroy's latest generation of protocol analyzers targeted at high speed PCI Express 6.0 and CXL I/O-based applications such as server, workstation, desktop, graphics, storage, AI, and network card applications.
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Protocol Simulation
Message automation and protocol simulation test tool that supports simulation of a variety of protocols (VoIP/IP, TDM, Analog, Wireless) all within a single framework. The application includes various test plans and test cases to support the testing of real-time entities
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Wireless Protocol Analyzer
Frontline X240
The Frontline X240 Wireless Protocol Analyzer captures information streaming between wireless devices and can do so utilizing various technologies including Bluetooth, Wi-Fi, and 802.15.4. It is paired with the powerful Teledyne LeCroy Wireless Protocol Suite software to provide developers with a robust set of analysis tools including Bluetooth protocol analysis, Bluetooth audio analysis, and spectrum analysis.
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TestStand
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Protocol Analyzer for PCI Express 5.0
Summit T54
The Summit T54 Protocol Analyzer captures, decodes and displays PCIe 5.0 protocol traffic data rates for x1, x2, x4 lane widths.
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Standardize Production Test Software For PCBAs And Electronic Devices
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Cable Free ATE
CABLEFREEATE
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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PCIe 3.0 Protocol Analyzer
Summit T3-16
The Summit T3-16 is Teledyne LeCroy's fifth generation of protocol analyzers targeted at high speed PCI Express I/O-based applications such as workstation, desktop, graphics, storage, and network card applications.
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PCIe 2.0 Protocol Analyzer
Summit T28
The Teledyne LeCroy Summit T28 PCI Express analyzer is for customers developing PCIe 1.0 or 2.0 x8 lane width server, workstation, desktop, graphics, storage, and network card applications.
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Universal Test System
LEON System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Parametric Test Fixture
U2941A
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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ARINC-708 Module
M4K708
The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
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6TL08 Benchtop Test Platform
H710008
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Electronics Testing Solutions
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Protocol Analyzer / Jammer for PCI Express 5.0
Summit M5x
The Summit M5x is Teledyne LeCroy's PCIe/ NVMe Jammer solution and is the latest protocol analyzer targeted at high speed PCI Express 5.0 I/O-based applications such as workstation, desktop, graphics, storage, and network card applications.
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EMI Test System
TS9975
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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PCIe 3.0 Protocol Analyzer
Summit T3-8
PCIe 3.0 technology achieves twice the effective data throughput rate of the PCIe 2.0 standard through a combination of increased data bit rate (5 GT/s moving to 8 GT/s) and the elimination of 8b/10b data encoding, which previously added an overhead of 20 percent to all data transfers. In eliminating 8b10b encoding, PCIe 3.0 technology now relies on the existing data scrambling techniques similar to those used for PCIe 2.0 technology to ensure that receivers maintain lock on the incoming data stream.
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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SoC/Analog Test System
3650-S2
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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6TL22 Off-Line Testing Platform
H71002200
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Seno-Con Test System
PANTHER 2K QST
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
