Test Program
Generate native system input events for the purposes of test automation, self-running demos, etc. (developer.com)
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
High Power LED Test System
Lumere-GM
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Evolusys Technologies Sdn. Bhd.
Lumere GM is a LED test and measurement system for various parameters of LED light. It is a high-accuracy system with a temperature-controlled CCD, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. The Lumere GM is used in laboratory applications and in the production of high-power LEDs.
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Product
Certification Programs
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With the intention of creating confidence among customers and facilitating interoperability across multi-vendor networks, the UNH-IOL has partnered with several industry forums to create certification programs. Testing plays a large part in these certification programs, and the use of independent third-party test houses, like us, is key to their success. We do not certify devices, rather we supply unbiased information these certification programs need to accurately certify devices
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Product
ASIC Testing
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Silicon Turnkey Solution, Inc.
As ASIC designs increasingly become more complex, so does the testing process—in fact, it can even be the bottleneck that constrains the total design cycle time and therefore impacts time to market. Effective and accurate testing requires in-depth knowledge of the hardware design itself as well as the software skills to conceive and create the appropriate test programs.
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Product
In-Circuit Test Programming Services
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Acculogic offers in-circuit / ATE test programming services for the most widely used Automated Test Equipment / platforms, in our state of the art test development laboratories. Staffed by a highly skilled team of engineers with an impressive track record in providing test solutions to customers in a variety of industries.
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Product
Visual Editor for the Automatic Test Markup Language (ATML)
ATML Pad
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Reston Software offers ATML Pad, a visual editor for the Automatic Test Markup Language (ATML).The ATML formats are versatile but complex. Direct editing in XML is next to impossible, even with capable XML editors. ATML Pad overcomes this problem by exposing an application-specific visual interface. ATML Pad manages the complexity of the ATML formats, allowing you to focus on describing your tests. It abstracts XML ID references, allowing you to simply select the referenced item from a list. In addition, ATML Pad can generate XML IDs automatically and ensures that IDs remain unique while you edit the data.ATML Pad allows you to quickly generate complex ATML constructs through a single mouse click. It validates your data during input and on-demand, ensuring that valid ATML documents are produced.ATML Pad interoperates with the NI TestStand ATML Toolkit to deliver automatic code generation solutions that reduce the cost of implementing NI TestStand test programs and ensures their cost-effective long-term maintainability.
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Product
Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
ICT Software: Interactive Developmetn Encironment ICT ICE & ICT Sequencer
ICT IDE and Sequencer
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The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway
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Product
JTAG Boundary-Scan Controller
NetUSB-1149.1/SE
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8-TAP USB 2.0 and LAN Based JTAG Controller. The NetUSB-1149.1/SE is an advanced 8-TAP USB 2.0 and LAN-based JTAG/boundary-scan controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
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Product
FaithTech FTLP Series 100W/180W Portable Programmable DC Power Supply
FaithTech FTLP Series
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Shenzhen FaithTech Technology Co., Ltd.
FTLP series is a kind of programmable Portable bench DC power supply, with the widest output range, which allows engineers to test more program requirements with just one device. To be exact, the FTLP series provides full power all the way down to 25% of the rated output voltage. The FTLP series is equipped with RS232 and RS485 as standard interfaces that are essential for system integration, you can also choose USB or LAN interface as your add-on interface. The series supports SCPI and MODBUS-RTU protocol, which is convenient for all kinds of test platform. The FTLP series DC power supply can be widely used in battery chargers, high-voltage ultra-high-speed diodes, electrolytic capacitors, electromechanical control fields, and ATE test systems, etc.
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Product
PLD ISP Feature, GTE 10.00p
K8220A
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The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Product
DiodeTester
FECPLS500
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Frothingham Electronics Corporation
The PLS500 automatic tester is designed primarily to do SURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses and THERMAL RESPONSE either in DVF (mV) or degrees per watt. All three test types may be performed in a single test program.
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Product
DiodeTester
FECPLS510
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Frothingham Electronics Corporation
The PLS510 automatic tester is designed primarily to doSURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses andTHERMAL RESPONSE either in DVF (mV) or degrees per Watt. All three test types may be performed in a single test program.
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Product
Functional Test Fixtures
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Test Head Engineering's Custom Functional Test Fixtures range from simple to extremely complex. Typically, our customers do their own wiring and programming, but we will complete the job right up to the customer's requirements, including offering turn-key control and test programming through our partners.
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Product
Microelectronic Services
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Services for ASIC houses and Integrated Device Manufacturers are IC Wafer / Final Test, IC assembly, Test Program development, product engineering, Flash / EEPROM programming, characterisation / capability studies, yield enhancement, design verification and failure / yield analysis. Das Test Haus are specialists for wafer test, low power, mixed signal and eeprom test.
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Product
CAD / BOM Translation Software
ProntoTEST-FIXTURE
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In minutes the Unisoft ProntoTEST-FIXTURE software translates CAD and Bill of Materials (BOM) files into real reference designators, netlists, X/Y component pin geometries, values, tolerances, part numbers, etc. This data is then used by Test Engineers to program their ATE (Agilent/Hewlett Packard "board & board x/y", Teradyne "ipl", Genrad ".ckt"), MDA, and flying probe test equipment and design the "Bed of Nails" test fixtures.
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Product
Solar Spectrum Test Chamber / Solar Radiation Test Chamber
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WEIBER Solar Spectrum Test Chambers are one of solutions to be utilized in large scale PV testing program. We offer customized as well as standard multidimensional test program for PV modules in reasonable prices. This system delivers the weathering stress representative of long term outdoor exposure.Our flexible system can be designed according to our test requirements, to suit environmental test conditions like volume, temperature, humidity solar radiation intensity and other measuring instruments. Weiber provide Solar Radiation Test Chamber.WEIBER solar test system are recognized for superior solar simulation environmental Testing, evaluating outdoor use product reliability, quality & safety. This technology allows for very high concentrations of UV energy without excessive heating of test samples. Custom mounting and cooling can be added depending upon specific material exposure requirements. MHGs (metal halide global lamps) are used as radiation source. Weiber provide Solar Simulation Test Chamber.
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Product
HV AC Hipot
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The HV AC Hipot package is a hardware and software upgrade available for select Eclypse Analyzers. This package adds a High Voltage AC stimulus source CCA to the analyzer chassis and the HV AC Stimulus utility provides the software drives for ELITE to integrate AC Hipot into test programs.
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Product
Integrated Test Facility
ITF
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The ITF, located in El Segundo, California, has multiple test stations to enable parallel testing and significantly streamline program test schedules. More than 25,000 square feet are available for integration and test activities, including a 10,000-square-foot Class 10K clean room. Our facilities feature thermal vacuum chambers and test stations to support optical alignment, warm optical bench testing, and hardware integration.
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Product
SD Express
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SCHILLER AUTOMATION GmbH & Co. KG
The Standard SD Express Memory Card Test Adapters support PCIe® 16 GT/s (Gen4) and PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD8.0 and SD7.1. Minimal crosstalk, short trace lengths. The Micro SD Express Memory Card Test Adapters supports PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD7.1. Minimal crosstalk, short trace lengths. They all support SDHC, SDXC, and SDUC operation modes Data collection via Lab Standard SSMP Test Cables and hard gold mating surface allow for high cycle count insertions and reliable performance.
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Product
Test Adapter
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Development of a 12-way test and programming adapter from Toptest for ?? The Dash ?? from Bragi, a wireless, intelligent earphone with communication and sensor technology. With the first version of the test adapter, only a purely sequential testing was possible due to the interdependencies of the tests. In version 3.0, the now autonomous tests were brought into a parallel TestStand sequence. In addition, individual sockets were prioritized in order to optimally use the hardware resources. This resulted in a time advantage of 80% compared to the initial situation.
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Product
Aging and Life Test Rack
SY2036
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SY2036 Aging and life test rack is fully designed according to the IEC standard, and can also be designed based on the customer request. SY2036 can test LED, CFL, HID Indoor lamp and Outdoor lamp. Input Power supply: AC220V, 50/60HZ, 12KVA Min (110V is option) • Built-in transformer: 0-250V 5KVA and 0-300V 5KVA (Other power is option) • Maximum power for EUT: 5KVA and 12A (Other power is option) • EUT and Number: 112pcs B22, 112pcs E27. 36pcs T5/T8/T12 Tube. 32pcs LED panel (Other EUT can be designed according to customer request) • ON/OFF test: Can be set on the touch screen with program • Test number: 0~99999（Adjustable）
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Product
Test Module
FailSim
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FailSim simulates a faulty component and allows the user to quickly and simply improve the actual fault detection of a test program. The result represents a definitive conclusion for tested or untested components.
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Product
Pulse Adapter
CV5P350
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Frothingham Electronics Corporation
The CV5 P350 station is the first mid power pulser in a series of exponential pulse generators that can be connected to an FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of high power exponential pulses. For exponential pulses up to the 10/1000, the CV5 P350 can produce up to 5KW, 500A, or 350V whichever is most limiting. It can also test all of the usual FEC200 tests in the same test program.
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Product
Quality Control Program
ATB QC
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The ATB Quality Control program has been used for 18 years all over the world. In the production of speaker, headphone, microphone, soundbox, PC, tablet and smartphone the quality is tested with the program and the Audio analyser ATB 804 USB.
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Product
Drug Stability Test Chamber
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Sanwood Environmental Chambers Co ., Ltd.
If you want find complete details about Integrated drug stability test chamber, Drug stability test chamber, Chemical drug stability test chamber, New designed integrated drug chamber, Good quality integrated drug test chamber - China Sanwood Environmental Chambers Co., Ltd. The scientific method to create a drug for a long time to failure evaluation of stable temperature, humidity and light environment for pharmaceutical enterprises to accelerate drug test, long-term test, high humidity and strong light test, is the best choice for pharmaceutical companies and drug stability test program.
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Product
288-Pin Dual In-Line Memory Module
SQR-UD4(ECC)
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SQRAM is Industrial Grade DRAM memory. all of SQRAM are designed with original IC chip and adopt a rigorous test program.
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Product
Engineering Design & Development
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TPSA has over 20 years of experience in Engineering Design & Software Development including:Hardware & Software DesignOTPS Acquisition SupportSystems Installation & SupportAircraft Modification/CertificationEngineering Studies & AnalysesFunctional & Systems TestingIndependent Verification & Validation (IV & V)Test Program Set EngineeringReliability & Maintainability (R&M)Engineering Drawings & DataConfiguration Data ManagementReverse EngineeringRequirements AnalysisSupport Equipment (SE)Aircraft Launch & Recovery Engineering (ALRE)Engineering Change Proposal (ECP) ReviewTechnology Insertion (TI)PDR, CDR, FAT, Techeval, OSV Support
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Product
1-2 Independent, Dual Redundant 1553 Channels on Small Mezzanine
MEZ-E1553
Ethernet Interface
From our popular ENET product, the MEZ-E1553 is a small, rugged mezzanine product that can easily be integrated into your system design. Alta provides full reference schematics, design notes, STEP 3-D Files, and sample ESS test programs. Guaranteed 1553A/B/C compliant with AS4111 5.2 Protocol Test reports.
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Product
Digital Test Instruments
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High-performance VXI and PXI instruments for digital functional test. Teradyne’s Di-Series and eDigital-Series digital test instruments address technologies such as low voltage differential signaling (LVDS), while maintaining full capability to support legacy test requirements. In addition to excellent reliability, these instruments reduce test system footprint, programming and support effort, and overall cost-of-ownership.
