Test Program
Generate native system input events for the purposes of test automation, self-running demos, etc. (developer.com)
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Program Specific Systems
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Curtiss-Wright Defense Solutions
Our experienced system design and integration teams analyze your system requirements, conduct trade studies to identify appropriate products, analyze data paths, select suitable cooling approaches, and create a rugged system solution tailored and optimized for your platform or program.
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Product
Flying Probe Testers
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Flying probe test systems require no test fixturing, have few restrictions on board access, and can test boards with virtually unlimited number of nets. These systems also allow developers to complete test programs in a short time.
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Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
TRUEngine program
TRUEngine
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A TRUEngine is an engine which has been maintained to GE or CFM manuals and recommendations. A TRUEngine contains TRUEngine LLP, which are life-limited parts (LLP) that have always operated in GE- or CFM- approved configurations. When rotating LLP and their associated critical influencing parts and all other internal engine parts are confirmed for GE- or CFM-approved configuration, the engine is eligible for TRUEngine status.
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Product
Flight Control System Test Platform
Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
Test Instruments
Test Instrument
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Product
Program Header and Cover
Series 680
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Program Headers and Covers. Complete versatility for programming within the unit itself...thus eliminating the need for DIP switches in many situations. Available pre-programmed from Aries, or do it yourself using Aries hand tool No. T-680. Consult Data Sheet No. 22002 for programming tool information.
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Product
Voltage Maintenance Program
VoltRef
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VoltRef provides the power of automation formaintaining statistical control of the volt in yourlaboratory. This program controls a low thermalscanner and voltmeter to compare voltagestandards using the process recommended by NISTand other national laboratories.
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Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Product
Universal In-System Programming Tool
ScanExpress JTAG Programmer
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ScanExpress JTAG Programmer is a universal in-system programming (ISP) solution designed for convenience and versatility—a modular, multi-functional, and high-performance tool to program, read, and verify Flash memories, serial EEPROMs, CPLDS, FPGAs, and more.Like all Corelis ScanExpress family products, ScanExpress Programmer is a tool for all phases of the product life cycle—whether programming early code during product development, programming production code during manufacturing, or reprogramming units out in the field, ScanExpress Programmer is designed to fit all in-system-programming needs.
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Product
Modular Functional Test Platform
LX-OTP2
Test Platform
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Product
Utility Card: Flash Programming Applications
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This new feature enables the Keysight Medalist i3070 ICT to perform higher speed flash programming at the ICT station in the printed circuit board assembly manufacturing line. You can combine programming and testing into a single phase, to save time and money. This in-system programming (ISP) flash solution is tester-based and does not rely on fixtures, thus enabling greater flexibility and ease of debugging.
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Product
OTP-Based Test System
Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
In-Circuit Test System
TestStation LX
Test System
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
Device Programming
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At A.T.E. Solutions, we offer a fast and reliable device programming service. With support for a vast number of devices from different suppliers, whatever your device programming needs, we will provide a speedy and cost-effective service.
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Product
Offline Programming, Advanced Simulation & Digital Twin
Silma
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Improve your 3D measurement experience with a winning combination: Silma, for advanced simulation and digital twin of your 3D measurement process, and Metrolog for on-machine execution and analysis.
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Product
EBIRST 78-pin D-type To 68-pin Female SCSI Adapter
93-006-222
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
EBIRST 50-pin D-type To 9-pin D-type Adapter
93-005-238
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
SPICE-Based Analog Simulation Program
TINA-TI
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TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages and waveforms. TINA''s schematic capture is truly intuitive-a real "quickstart."
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Product
SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Programming on-chip flash in your processor
XJDirect
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XJDirect is an advanced and innovative method for programming the internal flash of your processor and implementing some aspects of board test through JTAG when traditional boundary scan techniques cannot be used.
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Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
Programming Interface for CMC Test Sets
CMEngine
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CMEngine is an open programming interface that enables you to integrate the CMC test sets into your own testing environment and control them within any type of application.
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Product
Software Defined Radio Program
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Scientific Research Corp. STI Division
SRC is on the forefront of software defined radio technology, test, and interoperability. We provide systems engineering support for waveform testing, software and hardware integration, standards compliance, and information assurance.
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Product
Testing Services Test
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Aero Nav Laboratories is uniquely positioned to provide testing services that promote safe and reliable products, which are in compliance with the government and industry standards.
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Product
Total Substation Maintenance Program
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S. D. Myers' Solutions offers Substation Maintenance Services which provide the means to solve your substation and transformer needs. One phone call gives you access to the S. D. Myers' team, our expertise and experience, as well as our network of partnerships, all working toward the goal of extending the relaible and cost-effective life of your substation equipment.
