Wire Cable Test
The verification of wire cable integrity.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Military Communications Test
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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VXI Digital Multiplier
4152A
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Build-to-Print for Test Systems
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Bottom Electrode SMD Test Fixture
16198A
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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SAS Protocol Test System
Sierra M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Battery Management (BMS) Environmental Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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SSD Test Systems
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Lens Module Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Functional Test Trainer System
QT65
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Ethernet and Fibre Channel Test Platform
SierraNet M648
The SierraNet M648 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M648 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M648 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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T7 Fiber-Optic Cable Assembly for GPIB-140, 50 m
182805-050
2-Pin Male to 2-Pin Male, Core/Clad 62.5/125 um, 850 nm Wavelength Fiber-Optic Cable for GPIB-140A Extender - The GPIB T7 Cable, sometimes referred to as GPIB Cable, connects your system to high-speed GPIB-140A extender devices. You can use the GPIB T7 Cable with a GPIB extender to increase the cable length of your system up to 1 km without comprising the integrity of your GPIB system or requiring any application modifications. The GPIB T7 Cable is offered in different lengths.
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Cable Assembly, 9-Pin D-Type Female to Unterminated With Tinned Ends, 1m, HV
A009DF4-T-HA100
A range of 9-Pin D-Type High Voltage cable assemblies with unterminated connections on one end, constructed from PTFE Type C insulated wire. The unterminated connections are coded to match the connector pin designation.
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Cable Assembly, Receiver, QuadraPaddle, 20", 78 PN FML DSub w/ T/P
540034050140
Cable Assembly, Receiver, QuadraPaddle, 20", 78 PN FML DSub w/ T/P.
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Automated Test Equipment
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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96-Pin Male SCSI to 96-Pin Female SCSI Switch Cable, 1m (protected)
150579-01
96-Pin Male SCSI to 96-Pin Female SCSI Switch Cable, 1m (protected) - The SH96F-96M SwitchBlock SCSI Cable provides connectivity for SwitchBlock modules. You can connect these to the TBX-2809 Terminal Block, which exposes each channel of the switch module to screw terminals.
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Cable Assembly, 50-Pin D-Type, Male to Unterminated With Tinned Ends, 2m
A050DM4-T-0A200
The 50-Pin Connector to Unterminated Cable Assy is constructed from PFA insulated wire and can be secured to the product by screwlocks. The 50-Pin Female connector option of this cable assembly is suited for direct connection to Pickering Interfaces products.
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Cable Assembly, Receiver, QuadraPaddle, 20", 2 RJ45 Plugs
540224010140
Cable Assembly, Receiver, QuadraPaddle, 20", 2 RJ45 Plugs
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Cable Assembly 68-Pin Micro-D Male to Unterminated, Ferrules, 0.5m, Screwlocks
A068SMR-F-6A050
The 68-Pin Connector to Unterminated Cable Assy is constructed from 7/36 (28AWG) twisted pair wires with polypropylene insulation. The wires are colour coded to match the connector pin designation. The connector can be secured to the product by 2-56 UNC Screwlocks.
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20-Pin Scorpion Cable Assembly, Male to Female, 30A, 2m
A020AMR-020AFR-3A200
This is a 2m long male to female 20-Pin Scorpion cable assembly constructed from 37/0.4 (10AWG) Silver Plated Copper Wire with PFA insulation. Screwlocks are provided to secure the connector to associated product.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
