Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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Product
Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
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Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Etch System
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When it comes to clean etches, Veeco’s Ion Beam Etch (IBE) systems deliver with sharp control and minimal disruption. Using a focused argon ion beam, this subtractive technique etches nanoscale features with precision, making it a go-to for pattern transfer, layer removal, and surface refinement where edge definition matters most.
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TEM Lamella Preparation And Volume Imaging Under Cryogenic Conditions
ZEISS Correlative Cryo Workflow
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ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
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Microscopy Software/Hardware
ZEISS Atlas 5
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Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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Sputtering Systems
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Known for precision and cleanliness, Veeco Ion Beam Sputtering (IBS) systems are ideal when engineers need tight control over film thickness, composition, and optical performance. Using a focused ion beam, IBS dislodges atoms from a target, depositing them onto a surface in smooth, ultra-uniform layers.
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Ion Chambers
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0.2 to 5000 mR/hr, 5 Ranges• Temperature Compensated• Retractable 1000 mg/cm² Beta Shield• High Background Zero Capability• Proportional Audio Output
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Beam Bender
10707A
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The Keysight 10707A bends the incoming beam at a 90-degree angle and is designed for beam diameters of 6 mm or less . Includes a housing for standard mounting.
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Technology that Focuses on Measurable Safety
Foretify™
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A Measurable Scenario Description Language (M-SDL) used to describe both scenarios and coverage goals at a very high level (soon to be made open) to enable a ‘measurable safety’ ecosystem
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Ion Chromatography
IC Software- MagIC Net
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MagIC Net is the software to control your Metrohm ion chromatograph and any modules for liquid handling, sample preparation, and automation connected. Intuitive operation, comprehensive system monitoring, and straightforward data management make MagIC Net, what it is: the preferred software for state-of-the art ion chromatography.
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Benchtop Ion Meters
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Benchtop Ion Meters for Cl (chloride), F (fluoride), Na (sodium), Ca (calcium), Br, (bromide), NH4 (ammonium), NH3 (ammonia), Cn (cyanide), Ag (silver), K (potassium), S (sulphide), Pb (lead), I (iodide), Cu (copper), Cd (cadmium)
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Beam Characterization
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Thorlabs offers a wide range of products that can be used for beam characterization. Properties such as intensity, degree of collimation, power, wavefront shape, and spectral properties can be measured.
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Ion Pumps & Controllers
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Agilent Vacuum (formerly Varian) offers a complete portfolio of VacIon ion pumps that provide various pumping speeds (from 0.4 to 1000 L/s). Agilent also supplies smart combinations titanium sublimation pumps (Ion CombiTSP) and Non-Evaporable Getter (Ion CombiNEG) pumps for clean and vibration-free environments.Agilent ion pumps and controllers can be customized in a number of configurations to satisfy your vacuum requirements. They are the best choice for those applications where stable ultrahigh or extreme-high vacuum (UHV or XHV) conditions are essential, such as: laboratories, large research facilities, medical devices, scanning electron microscopes, and surface analysis tools.
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Product
4% Beam Splitter
10725B
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The 10725B 4% beam splitter, designed for beam diameters of 9 mm or less, reflects 4% of the total incoming laser beam and transmits 96% straight through. This optic is without housing and requires a user-supplied mount.
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Product
Beam Profiler
WinCamD series
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CW & Pulsed laser profiling. Wavelength Range: 190 nm- 15 m*. Resolution: 5.0 m*. Smallest Beam: 42 m*.
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Broad-Beam Ion Milling
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Materials Evaluation and Engineering
Ion beam milling is a unique method of sample preparation that complements and significantly extends the capabilities of the traditional microscopy and metallographic laboratories.
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Ion Chromatograph Systems
HIC-ESP
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The HIC-ESP is a new anion suppressor ion chromatograph with built-in electrodialytic suppressor, boasting the same low carryover and excellent injection precision characteristic of Shimadzu HPLCs to bring you highly-reliable results. The newly developed anion suppressor prevents peak spreading and achieves high sensitivity, providing stable functionality even over long periods of use. The HIC-ESP is suitable for applications in a wide range of fields including environmental science, medicine, chemistry and food science.
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Gridless End-Hall Ion Sources
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Veeco's Gridless End Hall Ion Sources provide high beam current for vacuum coating processes.
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Single Beam Interferometer
10705A
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The Keysight 10705A Single Beam Interferometer, the smallest linear interferometer, is designed for making low mass or limited space single axis measurements. It is ideal for use in disk drive and other confined space applications. The single beam interferometer is called that because the outgoing and returning beams are superimposed on each other, giving the appearance of only one beam traveling between the interferometer and the retroreflector.
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Bending Beam Load Cell
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Futek Advanced Sensor Technology, Inc.
Are the best fit for many measuring tasks. Here, the signal, on principle, depends on the bending moment.
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Shear Beam Load Cell
SB-1.0
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The Shear Beam Load Cell SB-1.0 is a single point weighing device, suitable for use in multiple applications.
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Laser Beam Positioning
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Under the trade name of SpotOn we offer a wide variety of computerized position measurement systems.This is a family of cost-effective and versatile solutions to numerous industrial and laboratory applications.Among the measurement applications, are:Measure laser power and centration or displacementAlign beams and QC of optical systemsMeasure target rotation and displacementMonitor vibration, deflection and motion
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Capacitors - Beam Lead
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Macom Technology Solutions Holdings Inc.
MACOM’s MMI-9000 and 9100 Series Chip Capacitors feature high stand-off voltage and low dielectric loss leveraging nitride/oxide dielectric layers. Gold bonding surfaces, top and bottom provide ease of bonding and minimum contact resistance. MACOMs beam lead capacitors have high insulation resistance, low dissipation factor, and low temperature coefficient, which are features that produce devices with excellent long-term stability.
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Chloride Ion Test Kit for Water
134W
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The Elcometer 134W is used to monitor recycled water (after it has been applied) to establish effectiveness of salt removal, this test is ideal for testing the salt contamination in wash water and blast water.
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Beam Lead PIN Diodes
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The SemiGen SBL 2000 series Beam Lead PIN Diodes feature fast switching speeds at both low capacitance and resistance. Beam Lead PIN Diodes have high levels of mechanical strength and stability during assembly. These diodes are suitable for microstrip or stripline circuits as well as circuits requiring high isolation from a series of mounted diodes such as multi-throw switches, phase shifters, attenuators and modulators.
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Laser Beam Alignment
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The alignment product line provides full solutions for applications such as: alignment of laser cavities, straightness measurement, machine alignment, wide-bed printers alignment and others. The AlignMeter system simultaneously measures incoming laser beam position (in µm) and angle (in µRad).It is a powerful compact device perfect for alignment monitoring, for testing the drift, centration and beam alignment relative to the outer housing or tube.
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Ion Chromatography
930 Compact IC Flex
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The 930 Compact IC Flex is a versatile ion chromatograph developed with a focus on the requirements of routine users.
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Ion Beam Milling Systems
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When material specimen surfaces are prepared for SEM or incident light microscopy, the specimen usually undergoes multiple processes until the layer or surface to be analyzed is machined with precision. Leica Microsystems’ workflow solutions for solid state technology cover all steps required for demanding high-quality sample preparation.
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Ion 700 Benchtop Meters
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Oakton benchtop 700-series meters are designed for use in crowded laboratory settings. Compact footprint of less that 6" x 7" (16 x 18 cm) conserves valuable space, while the large, dual-display LCD provides excellent visibility—even from a distance. Ion 700 meter measures pH, mV, relative mV, ion concentration and temperature. Automatic temperature compensation (ATC) maintains reading accuracy even with fluctuating temperatures. Models feature five-point pH calibration with automatic buffer recognition for both USA (pH 1.68, 4.01, 7.00, 10.01, 12.45) and NIST (pH 1.68, 4.01, 6.86, 9.18, 12.45) pH buffers. Meters additionally feature ion concentration calibration of up to 5 points. Meter features include Auto-Hold, selectable °F or °C measurement, and easy recall of electrode slope or offset. The convenient pull-out quick reference card keeps procedures handy at all times. Use 700-series meters with any pH, ORP, or ISE electrodes with a BNC connector.
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