Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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Deep Reactive Ion Etch (DRIE
Syndion Product Family
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Deep silicon etch refers to plasma-based processes that remove silicon, creating features that can be many orders of magnitude larger than those in advanced transistors and memory cells.
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Technology that Focuses on Measurable Safety
Foretify™
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A Measurable Scenario Description Language (M-SDL) used to describe both scenarios and coverage goals at a very high level (soon to be made open) to enable a ‘measurable safety’ ecosystem
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High Power Beam Analysis
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The advantages of fiber lasers are their high power, mechanical stability and good beam quality; however beam quality and beam profile has to be periodically checked. In general, there are many difficulties in checking beam quality especially at the focal point, where densities will exceed 50KWatt per square cm. On one hand those energies are capable of melting and destroying most known materials, while on the other hand measuring a focused profile is the most significant measurement.
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Ion & Electron Detection
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Photonis is the global leader in the development and manufacturing of detectors and optical components to detect ions and electrons. These detectors and components have been designed for a wide range of scientific instruments used in space and research projects but also in cells and material analysis in lifescience or non destructive testing.
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Beam Panoramic Power Supply Battery Crawler 40 to 160 kV
CP160CR
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Designed to fit into 6” pipelines and higher, the CP160CR constant potential X-Ray generator for crawlers is – in its category – the most powerful panoramic X-Ray tube head in the world for crawlers. The generator is making the cutting edge constant potential technology of the CPSERIES even more compact into a 9.9 kg – 120 mm diameter X-Ray tube head. The crawler unit is capable of penetrating up to 28 mm of steel in 10 minutes, which corresponds to just a 25 second exposure time for 6” standard pipeline welds.
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Chloride Ion Test Kit for Abrasives
134A
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Contamination can build up, particularly if the blast media is recycled several times. Using the Elcometer 134A Chloride Ion Test in the field will accurately identify contamination and prevent costly surface-related failures.
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Beam Directional Power Supply Mains
SiteX CP225D
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The CP225D is currently the most powerful constant potential X-Ray generator in ICM's portfolio. Supplemental to its outstanding penetration capacity (up to 47 mm for steel in just 10 minutes), it includes a built-in multiple X-Ray output carrousel that features a Beryllium window for the inspection of lighter alloys such as aluminum and carbon fiber. The CP225D is one of the most versatile generators on the market and will adapt to an extremely wide variety of applications. In fields as diverse as the construction or petrochemical industries, its power and small focal spot, light weight, compactness and high penetration capacity will be much appreciated.
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Beam Probes
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The CO2 Laser Beam Probes are hand-held plates designed to simplify the alignment of IR optical systems. They display the laser beam as a dark image on a fluorescent background using the same UV-excited, thermal-sensitive surfaces developed for Macken Instruments'' Thermal Image Plates.
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pH Ion Meter
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pH Ion Meters can be used in research institutions, and at a variety water quality related production sites in the mining, agriculture, forestry and fishery industries, for measuring the ionic concentration and various laboratories for the researches and drug manufacture processes. In addition, it is used in agriculture to measure the salinity levels of surface water and of soil samples and also measure the quality of water.
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Secondary Ion Mass Spectrometry (SIMS Analysis)
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Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
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Nitrate Ion and Nitrate-Nitrogen Concentrations Pocket Water Meter
LAQUAtwin NO3-11C/NO3-11S/NO3-11
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The only pocket meter that directly measures nitrate ion and nirate-nitrogen concentrations in 0.3ml sample (or 0.05ml sample with sampling sheet B). Unique sensor allows measurement of viscous liquids, solids, and even powder samples. No need for a beaker to calibrate your meter or measure a sample. Just place few drops of the standard or sample onto the flat sensor. This procedure saves you time and prevents wasting your precious sample.
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Ion Chambers
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0.2 to 5000 mR/hr, 5 Ranges• Temperature Compensated• Retractable 1000 mg/cm² Beta Shield• High Background Zero Capability• Proportional Audio Output
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Microscopy Software/Hardware
ZEISS Atlas 5
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Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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Beam Diagnostics
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We offer camera-based devices with wavelength ranges from UV to IR. All are cameras are USB3.0, for the fastest data transfer rates.
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Single Light Beam Safety Devices
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Leuze electronic GmbH + Co. KG
Single light beam safety devices can be integrated flexibly into machine concepts – particularly in constrained spaces or where no flat mounting surfaces exist. They are used for point of operation and access guarding as well as for collision avoidance. The safety sensors are available as type 2 and type 4 devices with external monitoring as well as self-monitoring type 4 devices.
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Beam Profiler
WinCamD series
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CW & Pulsed laser profiling. Wavelength Range: 190 nm- 15 m*. Resolution: 5.0 m*. Smallest Beam: 42 m*.
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Sodium Ion Concentration Pocket Water Meter
LAQUAtwin Na-11
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The only pocket meter that directly measures sodium ion concentration in 0.3ml sample (or 0.05ml sample with sampling sheet B). Unique sensor allows measurement of viscous liquids, solids, and even powder samples. No need for a beaker to calibrate your meter or measure a sample. Just place few drops of the standard or sample onto the flat sensor. This procedure saves you time and prevents wasting your precious sample.
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Capacitors - Beam Lead
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Macom Technology Solutions Holdings Inc.
MACOM’s MMI-9000 and 9100 Series Chip Capacitors feature high stand-off voltage and low dielectric loss leveraging nitride/oxide dielectric layers. Gold bonding surfaces, top and bottom provide ease of bonding and minimum contact resistance. MACOMs beam lead capacitors have high insulation resistance, low dissipation factor, and low temperature coefficient, which are features that produce devices with excellent long-term stability.
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Gridless End-Hall Ion Sources
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Veeco's Gridless End Hall Ion Sources provide high beam current for vacuum coating processes.
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Beam Lead PIN Diodes
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The SemiGen SBL 2000 series Beam Lead PIN Diodes feature fast switching speeds at both low capacitance and resistance. Beam Lead PIN Diodes have high levels of mechanical strength and stability during assembly. These diodes are suitable for microstrip or stripline circuits as well as circuits requiring high isolation from a series of mounted diodes such as multi-throw switches, phase shifters, attenuators and modulators.
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Reactive Ion Etch (RIE)
Versys Metal Product Family
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Metal etch processes play a key role in connecting the individual components that form an integrated circuit (IC), such as forming wires and electrical connections. These processes are also used to pattern complicated metal hardmasks (MHM) that are used to form the wiring for advanced devices.
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UV-Vis Double Beam Research Spectrophotometer
UVD-3500
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The high- performance blazed holographic grating and the optimized CT-type Monochromator reduce stray light, and widen the photometric range. Wavelength range: 190 nm – 900 nm. Spectral bandwidth: 0.1, 0.2, 0.5nm, 1.0nm, 2.0nm, and 5.0 nm.(UVD-3500).
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Spectro UV-Vis Dual Beam
UVS-2700
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Spectro UV-Vis Split Beam PC is a precise scanning Spectrophotometer with a new design of 8 microprocessor automatic 2 row cell holder that moves noiseless with a special membrane. This Split Beam Spectro has a dual detector and a very accurate system.
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Headlight Beam Testers
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VLT offers a wide range of professional headlight beam testers. From simple manually operated models up to fullly automated robot type machines for use in integrated test lanes.
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Beam Directional Power Supply Mains
SiteX CP160D
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The CP160D is the lightest and most compact generator of the CPSERIES. Featuring a built-in Beryllium window, it is the perfect generator for the inspection of light alloys such as aluminum, magnesium or fiber based materials like glass and carbon, as well as the greater thickness of steel. In fact, with its penetration capacity that is capable of reaching up to 37 mm of steel, the CP160D is able to execute many different types of NDT tasks without the need to ever have to add extra accessories.
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Non-Contact Beam Profiler
BeamWatch
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The patented BeamWatch non-contact profiling system accurately captures and analyzes industrial multi-kilowatt lasers wavelengths from 980nm - 1080nm by measuring Rayleigh Scattering. It features a complete passthrough beam measurement technique, no moving parts, and a lightweight compact design which makes it ideal for comprehensive analysis of industrial multi-kilowatt lasers
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Ar Gas Cluster Ion Source
GCIS
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The Kratos Ar Gas Cluster Ion Source (GCIS) is optimised for depth profiling organic materials in Arn+ cluster mode and inorganic materials in Ar+ monomer mode, dependent on the operating parameters defined by the user and the type of material to be profiled. In Arn+ ion cluster mode the ions can be accelerated up to a maximum of 20 keV. This enables the successful sputter depth profiling of the widest range of polymer materials to be undertaken. However, Arn+ cluster depth profiling has been shown to give very low sputter yields for inorganic materials. In order to retain the capability of generating depth profiles from this class of materials this ion source can also be operated in the more conventional Ar monomer (Ar+) mode.
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Broad-Beam Ion Milling
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Materials Evaluation and Engineering
Ion beam milling is a unique method of sample preparation that complements and significantly extends the capabilities of the traditional microscopy and metallographic laboratories.
