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Component Test

A combination of two or more interrelated equipment (sets) arranged in a functional package to perform testing of particular components. (atis.org)


Showing results: 781 - 795 of 866 items found.

  • Sub-systems

    Ducommun Inc

    Our self-contained, in-house components design and fabrication capacities ensure the breadth of sub-assemblies offered from rapid prototyping and proof of concept to full production. Ducommun has produced many high performance millimeterwave band sub-assemblies for commercial and military system applications. Among them, the K and Ka band directional Doppler Radar front ends are in production. Several hundreds of sets have been delivered. In addition, Ducommun has delivered Ka through W band engineering prototypes for plasma detection system, automotive Radar, speed Radar, automatic test set, radio telescope, missile terminal guidance, telecommunication system etc. applications.

  • Vector Signal Generator

    SMBV100B - Rohde & Schwarz GmbH & Co. KG

    The state-of-the-art R&S®SMBV100B vector signal generator sets standards for its class. Ultra high output power, fully calibrated wideband signal generation and intuitive touchscreen operation make the R&S®SMBV100B ideal for all kinds of applications.Always in line with the latest major digital communications standards, such as 5G NR, LTE and WLAN, the SMBV100B is the preferred test solution for receiver and component characterization.The R&S®SMBV100B has many GNSS options that transform the instrument into a reliable, full-featured GNSS simulator. Advanced simulation capabilities can run realistic and complex yet repeatable GNSS scenarios under controlled conditions.

  • Vibration Test Chambers

    Cincinnati Sub-Zero Products

    Our vibration test chambers offer a variety of solutions for vibration testing. AV-Series and CV-Series vibration chambers offer rapid temperature change rates with combined temperature, humidity, and/or vibration environments. These chambers are designed for compatibility with your choice of electrodynamic or mechanical vibration systems. The Benchtop Vibration Table, ideal for vibration testing of small components or electronics and is designed for stand-alone testing or may be placed in an environmental chamber for combined temperature and vibration testing. HALT/HASS Test Chambers provide extreme vibration and temperature capabilities in order to identify design and product weaknesses.

  • MTM-IO-Serial: Software Controlled USB Hub and IO Module

    Acroname, Inc

    As part of Acroname's MTM series, the MTM-IO-Serial module is a key component to manufacturing test systems for electronic devices using a standard USB 2.0 interface, serial UARTs and one or more interface voltages. The MTM-IO-Serial module features a software controlled USB hub (USB 2.0 high-speed) with four controllable channels. Each channel has switched data and 500mA current-limited power lines.

  • Automotive Simulation Software

    DYNA4 Framework - TESIS DYNAware Technische Simulation Dynamischer Systeme GmbH

    DYNA4 is a modular simulation software for efficient work with simulation models in the automotive development process, e. g. of electronic control units and components. Model-based design, function development. Testing and pre-calibration in SIL and HIL environments. Fail-safe and functional tests, including evaluation of vehicle response and drivability. Advanced powertrain development and energy management. Fuel efficiency simulation for hybrid (HEV), electric (EV) or traditional vehicles.

  • Ionic Contamination Test System

    Omegameter SMD 650 - Specialty Coating Systems

    The SCS Omegameter SMD 650, the long-time industry standard for ionic testing utilizing “static test” methodology, is designed to perform cleanliness testing on printed circuits and assemblies. Identifies the presence of ionic contamination on bare and assembled printed circuit boards and other electronic components. Provides an accurate and repeatable method for determining cleanliness on site. Provides immediate process control results, eliminating the need for outside laboratory testing.

  • Multi-channel DC Electronic Load

    IT8700 Series - I-TECH Electronic Co., Ltd

    IT8700 series programmable DC electronic load adopts removable modules design, supports up to 16 channels with mainframe extension transient mode up to 25 kHz, which improves your test efficiency, with high resolution and accuracy. Users can freely choose in the 8 load modules according to the number of channels and power requirements, controlled by mainframe control panel, or controlled by host computer software via built-in LAN / RS232 /USB / GPIB interface. IT8700 is with adjustable slope, list function, automatic test and other functions, and can be applied to multiple or single output AC/ DC, DC / DC power converters, chargers and other power supply electronic components performance test, also can be used in ATE test system, solar cells, LED, communications testing, aerospace and other fields.

  • Plastics Testing Equipment

    Dongguan Amade Instruments Technology Co., Ltd

    Plastics testing equipment include a series of instruments intended to carry out testings of component analysis, formula analysis, performance determination, aging resistance test etc on various plastic materials and plastic products in accordance with ISO, ASTM, DIN, HB international standards. Mechanical & physical & chemical property testings include tensile strength, bending strength, friction coefficient, creep resistance property, tearing strength, shearing property, impact resistance property, compression performance, hardness, resilience property, fatigue strength, melt index, heat deflection temperature, melt viscosity, density, flammability characteristics, resistance to aging under UV, xenon, ozone, high/low temperature etc.

  • Sensor Bodies

    optek

    The armature - assembled sensor body - is the central component of an inline photometer. We have already designed more than 1000 different sensor bodies and more than 50 types are always on stock. All optek inline sensor bodies are made from high quality materials and are machined with extreme precision. The quality-tested manufacturing tolerances allow optical path lengths of up to 1000 mm, for which the accuracy of the incoming and outgoing light beam is ensured by testing a laser-based coaxiality tolerance test to the reference axis. To cover a wide spectrum of different process conditions, optek sensor bodies can be manufactured from various materials (also for aggressive chemicals or with NACE MR 0175) and adapted with regards to:

  • Textile Testing Instruments

    Dongguan Amade Instruments Technology Co., Ltd

    Textile testing instruments are developed to determine the quality and performance of various fibrillar component fabrics, structural fabrics, garments, home textiles and other textiles by physical and chemical methods in conformance with international standards. By using scientific testing methods to judge the quality of materials or final products, manufacturers of textiles are capable of detecting the defects and unqualified products to correct problems in time, conducive to reducing loss and maintaining the business reputation. Testings cover tensile strength, tearing strength, seam slippage, joint strength, bursting strength, resistance to wear, pilling resistance, color fastness to washing, rubbing fastness, light fastness, color fastness to perspiration, dimension stability, inflaming retarding test etc.

  • Impulse Voltage And Current Testing

    Shanghai Jiuzhi Electric Co., Ltd.

    Our advanced CDY series Impulse test systems are used for impulse voltage testing of transformers, cables, gas-insulated switchgears (GIS), arresters, and other high-voltage devices. The test systems generate lightning impulse voltage (LI, 1.2/50 µs), chopping lightning impulse voltages (LIC, front time 1.2 µs, front, crest or tail chopped), and switching impulse voltage (SI, 250/2500 µs) in accordance with IEC 60060-1; as well as IEC 60076-3 for transformers, and IEC 62067, 60840 and 60502-1 for cables). By adding extra components, our impulse test system also can generate steeping wave (SWI, >2500kV/ µs) and impulse current (IC, 4/10 µs, 8/20µs, 10/350µs).

  • Data Distribution Middleware

    ADS2 Product Family - TechSAT GmbH

    The high degree of flexibility of ADS2 is achieved through a clear and straight forward architecture design paired with a highly optimized implementation of its components.- A deterministic publish-subscribe data distribution and scheduling middleware- Adapters for a wide range of client applications and third party tools- HW adapters for a wide range of I/O interfaces- A set of native tools for data visualization and analysis, recording and replay- A comprehensive system health monitor- Human readable system configuration files (structured text)- Scriptable generation of system configuration files- Automatic test execution for high level requirement based test definitions

  • Constant Temperature Humidity Test Chamber

    ACMAS Technologies Pvt. Ltd.

    Constant Temperature and Humidity Test Chamber from Weiber are environmental test chambers, designed to simulate constant climatic conditions for testing a wide variety of products for their quality, performance, shelf life and stability. They are used to simulate constant temperature and humidity conditions, thereby creating a physiologically ideal environment for product testing. These equipments are most commonly employed for testing electrical devices, electronic parts and components, instruments, biological samples, food items and other manufactured and processed goods and find widespread usage in scientific research organizations, semiconductor industries, material research institutes and other industrial and manufacturing units.

  • Dual Channel Bit Synchronizer for Rates up to 45 Mbps

    LS-45-DB - Lumistar Inc.

    The Lumistar LS-45-DB Dual Channel Bit Synchronizer Daughterboard provides optimal reconstruction of a serial PCM data stream that has been corrupted by noise, phase jitter, amplitude modulation, or base line variations. The all-digitaldesign assures a high performance, consistent product, with excellent reliability and long-term stability. Dual channel design can feed each channel of the LS-55-DD dual decom. The LS-45-DB also has a post D combiner that allows for optimal ratiocombining of the two input signals A unique Built-in-Test feature allows performance verification for the Bit Synchronizer to ensure the highest level of operation. Auto-test BIT is performed for a short duration on the application of power and tests more than 90% of the Bit Synchronizer components. This test verifies that power is properly applied, verifies that there are no internal bit errors, and performs other tests to ensure that the bit synchronizer is fully operational with status indication of results. Command-test BIT performs the same functions and can be initiated by the user at any time through the Lumistar software when used on Lumistar PC products. The user has the ability to generate internal pseudo-random patterns and calculate internal bit error rates with or without the injection of forced errors.Various status indicators are also available through the software. The Bit Synchronizer also contains a BER reader as well as frame sync pattern indicator.

  • Combination Board Tester

    ATE QT2256-640 PXI - Qmax Test Technologies Pvt. Ltd.

    Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.

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