Showing results: 31 - 45 of 201 items found.
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Nexus Technology, Inc.
The following probes are available for the MA51x0 and MA41x0 series analyzers. These probes are designed for low-voltage and high-speed midbus probing or probing with an interposer. The following JEDEC memory standards are widely used by these probes: DDR5 (JESD79-5), DDR4 (JESD79-4), DDR3 (JESD79-3), LPDDR5 & LPDDR5X (JESD209-5), LPDDR4 & LPDDR4X (JESD209-4), and LPDDR3 (JESD209-3).
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N2830A -
Keysight Technologies
The N2830A Series InfiniiMax III+ probing system is the next generation of InfiniiMax probing, greatly expanding the measurement capability and usability of a probe capable of measuring all components of a differential signal. The built-in InfiniiMode technology allows customers to switch differential, single-ended, and common mode without adjusting probe tip connections.
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S-725 -
Signatone Corp.
Primarily used for probing targets that are approximately 0.5 mil (12.7 microns) and larger, with 80 TPI resolution.
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142-5 -
Electronic Specialties Inc.
Flexible 1.5 inch silicon pins provide easy back probing connections for DMM and Scope measurements
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Four Dimensions, Inc.
Based on decades of experience with needle four point probes and C-V, I-V Mercury probing stations, Four Dimensions developed a Mercury four point probe (patent pending). The liquid metal Mercury is used to form temporary electrical contacts at four terminals. These probes cause no damage to the sample and permit no contact pressure probing.
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VersaTile™ -
Celadon
Celadon has reduced the size of a probe card to 28mm with the VersaTile™ with Advanced Cantilever™ technology. The VersaTile™ with Advanced Cantilever™ technology can fit on a conventional 3-hole mount probe positioner for single site probing. The same VersaTile™ with Advanced Cantilever™ technology can be used in a 300mm VersaPlate™ for multi-site probing.
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Creaform Inc.
The most accurate scanning and probing solutions, whether in lab or on the shop floor.Highly accurate measurementDynamic referencingComplete metrology solution
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Ironwood Electronics
These sockets are specifically designed for standard 153 & 169 Ball eMMC devices. Custom probing sockets also available.
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PacketMicro Inc.
PacketMicro offers a family of horizontal and vertical PCB holders for engineers to hold PCB in a desired orientation for steady and easy probing.
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Nidec-Read Corporation
In addition to jigs and fixtures for probing conductors and electrode pads, NIDEC-READ provides specialized software for test point selection and log analysis.
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PS-5026B -
High Power Pulse Instruments GmbH
The PS-5026B is a rugged portable wafer probing solution which has been designed for high reliability, compact size and minimum cost.
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VXTRACK -
Creaform Inc.
The C-Track dual-camera sensor is a complete portable 3D measurement solution that offers probing inspection and dynamic measurement capabilities. It is fitted with high-quality optics and special lighting, enabling it to measure all reflectors within its operating space. The probing stylus is very useful for aligning parts with respect to a referential (calculated using a group of reflectors), which allows movement or deformation monitoring directly on the part's referential.
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ATS-8000A -
High Power Pulse Instruments GmbH
The ATS-8000A test system is a fully automated 2-pin probing solution for HBM, TLP, HMM and CC-TLP on package- and wafer-level.Future extension for CDM is optional.
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Cellcia -
Tokyo Electron Ltd.
Next-generation wafer probing system for 300mm wafers. The multi-layer system structure maximizes the efficiency of testing, further reducing the total testing cost.
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Materials Development Corporation
MERCURY PROBES are precision instruments that enable rapid, convenient, and non-destructive measurements of semiconductor samples by probing wafers with mercury to form contacts of well-defined area.