Showing results: 181 - 195 of 201 items found.
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W5643A -
Keysight Technologies
The W5643A DDR5 2-wing BGA interposer for DDR5 x4/x8 BGA DRAM probing takes full advantage of the quad sample state mode on the U4164A. The W5643A is the smallest BGA interposers for DDR5 x4/x8 DRAM capable of capturing simultaneous read and write traffic at data rates exceeding up to 5GT/s for protocol analysis and up to 4Gb/s for DQ capture. U4208A and U4209A probe/cables connect any W5643A DDR5 BGA interposer directly into the U4164A logic analyzer module using 61-pin high density zero insertion force (ZIF) connectors that attach to the W5643A BGA interposer wings.
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Instec, Inc.
INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
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Ironwood Electronics
*Package-size PCB footprint: Since the PCB footprint of G80 is identical to the package, only one PCB design is required, enabling a seamless transition from test and validation through production and reducing overall cost of test*Low insertion force: Unique contact design reduces the insertion force required to insert and retain higher-ball-count packages safely and securely within the test socket*No lid required: The package snaps directly without a lid, enabling easy probing, scoping and troubleshooting the topside of the device*Excellent signal performance: A short signal path achieves low inductance and low insertion loss, providing a nearly invisible electrical connection
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Huntron
Flying Probe technology is used to automate the testing of printed circuit boards (PCB) that would otherwise have to be tested manually. Adding a Huntron Access Prober to your test procedure will significantly decrease test times therefore increasing productivity.Access Probers can accurately place a probe on test points with high accuracy achieved using micro-stepping motors and linear laser encoders. Probing the smallest surface mounted devices is possible. Huntron Access Probers can automate your unique test process using the standard probe or by adding a custom probe of your design. Huntron offers three Flying Probe system configurations based on PCB size and test head requirements.
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Emergent Electro-Mechanical
Emergent's fixture kits are available in bottom and double sided probing versions. They are fully scalable, from compact benchtop testers to full size multi-UUT production floor models. The removable, interchangeable plate design allows you to easily add and move test points, or swap out plates to test a completely different product. Each kit comes with a standard linear collapse over-clamp. A cam-follower closing system can be specified for higher force applications. Our fixture kits are manufactured using industrial grade phenolic laminate, which is similar to G10 in hardness and strength but easier to machine. The standard kit comes pre-assembled with blank plates for machining.
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7 -
Picoprobe
Designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes. The Model 7 consists of a flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms in order to avoid undesirable reflections. A special miniature connector receives replacement coaxial probe tips that provide a shielded environment to within 3 mm of the fine tungsten probe point, thus minimizing capacitive coupling to other parts of the circuit. The replaceable coaxial probe tips are offered in various point sizes and can also be bent to any shape in order to accommodate a variety of probing geometries.
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W6601A -
Keysight Technologies
The W6601A LPDDR4 2-wing BGA interposer for LPDDR4 200-ball BGA DRAM probing takes full advantage of the quad sample state mode on the U4164A logic analyzer module it is compatible with. The W6601A is the smallest BGA interposer for LPDDR4 200-ball DRAM capable of capturing simultaneous read and write traffic at data rates in excess of 3.2 Gb/s. U4208A and U4209A probe/cables connect W6601A LPDDR4 BGA interposer directly into the U4164A logic analyzer module from 61-pin high density zero insertion force (ZIF) connectors that attach to the W6601A BGA interposer wings. Refer to the W6601A data sheet for complete list of LPDDR4 signals probed with the W6601A.
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LX-08 -
Link Instruments
The LX-08 series of high voltage logic analyzer adapters provides a safe isolated method of measuring high voltage control signals with a low voltage logic analyzer. All inbound signals are optically isolated and attenuated to a safe level for the delicate inputs typically found on logic analyzers. The inputs on the LX-08 are capable of withstanding voltages up to +/- 300V AC/DC, higher voltage configurations are available upon request. Rather than probing with multiple neon screwdrivers, the LX-08 can provide simultaneous viewing of up to 8 circuits in the STANDALONE mode via the indicator array. Need to catch a transient event or map out a timing sequence? Just add a logic analyzer to the outputs of the LX-08 and turn it into a high voltage logic analyzer. High voltage signals that were hazardous for a logic analyzer can now be measured safely. Typical outputs of a high speed PLC sequencer can be precisely timed and measured from both sides of the control relay. With the built in user selectable AC filter circuit, an AC signal can be measured as DC events or AC cycles.
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Model BCA6/12M -
Aplab Limited
- Instant Measurement of energy stored in a storage battery- Tests 6V or 12V Lead Acid Batteries from 2Ah to 100Ah Capacity- Suitable for any SLA, GEL or Car Flooded Batteries- Displays DC Voltage and Balance available Ah capacity of the battery- Shows the Internal Resistance of the battery- Powered by the Battery under test- Micro-processor based digital control of entire testing process- Specially designed 4-terminal probing Battery Clamp of 100A capacity- Test simulates 20-Hr discharge test (C/20) with a few seconds- Bright, back-lit LED Display for test process display- On-screen User Guidance for testing on the built-in LCD Screen- Easy to use, portable and robust housing in a custom extrusion
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5900 SERIES -
Probe Master Inc.
Probe Master's new 5900 series passive oscilloscope probes are available in 400 MHz & 500 MHz bandwidths. Probes are also available with readout actuators for oscilloscopes with the readout feature. The "GOLD PROBE" has been designed specifically for use with Tektronix, Hewlett Packard and other high performance oscilloscopes. This new slim design along with a host of versatile accessories, allows you to reach the most difficult test point in today's highly complex circuitry. The gold plated Probe Tips, Sprung Hook, Ground Lead, Alligator Tip and other critical interconnect points within the Gold Probe, provide excellent contacts for probing low level analog signals and high speed digital data. Unlike most "off shore" commodity probes, Probe Master guarantees quality and continuing domestic support for our "Made in America" Gold Probe.The probe body is made of high impact ABS. Soft molded strain reliefs at all stress points assure long cable life. In short it has been designed to offer you high performance coupled with high quality.
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PTE-100 -
SEICA SpA
The PTE-100 gives test personnel access to electrical signals for probing, voltage injection, isolation checks, voltage/current and time/frequency measurements, and it offers the ability to analyze hot and loaded circuits, verifying missing, corrupted or present valid signals. Furthermore, the PTE-100 offers the ability to make electrical verification activities more efficient, repeatable and safe, by introducing software controlled test sequences to reduce human errors and guide diagnostic resolution. Break Out Boxes are commonly made in-house and are often specific to a particular project. They are simply designed to multiplex connections between two units and use external instrumentation for signal injection or measurement. The end result is a multitude of tools, difficult to maintain, with limited transportability, providing costly and inefficient operations at the factory or in the field.
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Fairview Microwave Inc.
Fairview Microwave’s line of coaxial RF probes and RF PCB probe positioner are ideal for use with chip evaluations, signal integrity measurements, coplanar waveguide, substrate characterization, gigabit SERDES and test fixture applications. The RF coaxial probes provide return loss better than 10 dB and a maximum operating frequency of 20 GHz. The probes have a 3.5mm female interface, a pitch of 800 or 1500 micron and they can be cable-mounted. They feature gold-plated contacts and can be used by hand, with or without a probe positioner. Compliant coaxial GSG (or GS) pogo pins allow for a broad range of probing angles. The RF PCB probe positioner can hold coaxial probes, has articulated joints and delivers multi-axis positioner control. This positioner also boasts a magnetic mounting plate with on-off positioner switch.
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Celadon
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Celadon
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe cards as well as DUT probing solutions. These Cryogenic probe cards have all the benefits of Celadon’s Crash Resistant™ probe technology but with the ability to probe as cold as humanly possible. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovate custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cable-out designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Amida Technology, Inc.
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
