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Showing results: 3181 - 3195 of 3569 items found.

  • Digital Portable Panel Meters

    ST-2001 DCV - Standard Electric Works Co., Ltd

    ● Big-size LCD (112 x 59mm)● Backlight function.● Analog scale with Bar-graph for viewing. (100 bars)● 10000 counts (high resolution).● DCV Ranges: 99.99mV~999.9V (ST-2001 DCV). ● ACV Ranges: 99.99mV~800.0V (ST-2001 ACV). ● 5 manual ranges controlled by rotary switch.● Data Hold function● Low battery indication● 9V power supply● Best resolution of 0.01mV (10uV)● Precision meter for factory maintenance, field servicing and educational purposes.● With an optical USB to RS-232 data transmission cable. (DCV-R & ACV-R)● 2 optical LEDs are built-in for data transfer. (DCV-R & ACV-R)● Well isolated to contact. (DCV-R & ACV-R)● The software is included (Compact disc). (DCV-R & ACV-R)

  • PXIe-4162, 12-Channel, ±24 V, Precision PXI Source Measure Unit

    785680-01 - NI

    PXIe, 12-Channel, ±24 V, Precision PXI Source Measure Unit - The PXIe-4162 is a high-precision, high-density source measure unit (SMU) with 12 identical SMU channels. This module features 4-quadrant operation, integrated remote (4 wire) sensing in each channel for accurate measurements, as well as analog-to-digital converter technology to help you perform high-precision measurements. It also features guard terminals to remove the effects of leakage currents and parasitic capacitances. Additionally, the PXIe-4162 can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4162 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.

  • SCB-12, Nano-Pitch Connector Block, 8 SE DIO, 1 QSFP+

    787419-01 - NI

    8-Pin 3.5 mm Pitch Connector to Nano-Pitch I/O, QSFP28 Terminal Block - The SCB-12 converts the Nano-Pitch connector to the industry-standard QSFP28 connector for interfacing I/O signals to plug-in data acquisition. This Terminal Block features the QSFP28 variant of the quad small form-factor pluggable (QSFP) transceiver for high-capacity data communication. The SCB-12 combines with shield cables to provide low-noise signal termination. Additionally, the SCB-12 supports the Nano-Pitch I/O Interconnect System that provides data transfer at 24 Gbps per lane and compatibility with PCI Express, Serial Attached SCSI (SAS), and SATA protocols. The SCB-12 breaks out the NanoPitch connector to a QSFP28 connector as well as an 8-pin connector for general-purpose DIO signals.

  • Ettus USRP X410, 1 MHz to 7.2 GHz, 400 MHz Bandwidth, GPS-Disciplined OCXO, USRP Software Defined Radio Device

    787272-01 - NI

    The Ettus USRP X410 integrates hardware and software to help you prototype high-performance wireless systems and perform over-the-air signal generation and analysis. Additionally, the Ettus USRP X410 features a two-stage superheterodyne architecture with four independent transmitter and receiver channels. It also features a Xilinx Zynq Ultrascale+ RFSoC with programmable FPGA supporting the Open Source UHD tool flow as well as LabVIEW FPGA. With these features, the Ettus USRP X410 has the RF and processing performance for applications such as wireless communications prototyping, spectrum monitoring, and signals intelligence. The Ettus USRP X410 is equipped with a GPS-disciplined 10 MHz oven-controlled crystal oscillator (OCXO) Reference Clock, which improves frequency accuracy and synchronization.

  • PXI-4132, 100 V, 2 W Precision PXI Source Measure Unit

    780558-01 - NI

    ±100 V, 10 pA Precision PXI Source Measure Unit—The PXI-4132 is a programmable, high-precision source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4-wire) sense as well as external guarding. With its high measurement resolution integrated guarding, the PXI-4132 is ideal for high-accuracy leakage measurements on integrated circuits, discrete components, PCBs, and cables. You can also perform high-speed I-V measurements on a variety of components including diodes and organic LEDs using the onboard hardware sequencing engine. In addition, you can synchronize multiple PXI-4132 modules using the PXI backplane to provide high-speed I-V measurements on transistors and more complex devices.

  • Edge AI Box

    EPC-R5710 - Advantech Co. Ltd.

    Advantech EPC-R5710 is an AI edge intelligent industrial gateway integrating NXP's high performance of video coding/decoding and AI function. It can provide 2.3-28.3 TOPS NPU AIcomputing power, and support multiple network ports, a variety of industrial interfaces and storage, as well as wireless technologies including 5G/4G,Wi-Fi5/6. It also supports 8-wayMIC array to realize audio and video AI analysis. Integrated cloud collaboration functions.EPC-R5710 supports a variety of PLC data acquisition and industrial protocol conversion. With its high performance and high quality, it is widely used in AI video surveillance, machine vision and industrial data acquisition applications in the fields of security, smart city, smart transportation, smart factory, energy and power.

  • Pico-ITX SBC With Intel® Atom® Processor E3845/E3827, LVDS/ VGA (HDMI), LAN And Audio

    PICO840 - Axiomtek Co., Ltd.

    The PICO840 ultra-small Pico-ITX embedded SBC supports the quad-core Intel® Atom® processor (code name: Bay Trail-I) and supporting DDR3L-1066/1333 MHz system memory up to 8 GB. Considering different environments, this industrial-grade Pico-ITX mainboard is built to withstand extreme temperature, ranging from -40°C to +70°C (-40°F to +158°F). Moreover, with superior integration and power efficiency, this compact size single board computer enables system developers and OEMs to create smaller, lighter, quieter devices than ever and embrace the new possibilities across POS systems, mobile medical monitor, compact panel PCs as well as multiple embedded computer, system and appliance segments.

  • PXI Signal Insertion Switch Module

    NI

    PXI Signal Insertion Switch Modules, also known as fault insertion units (FIUs), provide a set of feedthrough channels, which make the switch transparent to the system when closed. You can open or short these channels to one of two fault buses, allowing you to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXI Signal Insertion Switch Module can validate the integrity of control systems including engine control units (ECUs) and full authority digital engine controls (FADECs). You can also use the FIU models for hardware-in-the-loop (HIL) applications and electronic reliability tests.

  • COM Express Module

    CM22202 - LinkedHope Intelligent Technologies Co.,Ltd.

    CM22202 is a Type 6 COM Express® module developed by LinkedHope® based on China local x86 architecture ZX® KX-6000 series Processors. This module pinout is compliant with PICMG COM.0 R3.0 specification. CM22202 contains all kinds of high-speed interfaces such as SATA III, USB 3.0 and PCIe 3.0. CM22202 provides dual-channel SO-DIMM, supporting DDR4-2666 MHz memory and the capacity up to 32GB.CM22202 supports KX-6000 series 4 core processors which TDP from 25W to 55W. CM22202 provides high performance computing with balanced power consumption. CM22202 works well in a wide range temperature environment. It is ideal for the high-bandwidth and processing intensive requirements of industrial and edge computing applications.

  • Environmental Chamber

    Wewon Environmental Chambers Co, Ltd.

    The environmental chamber for conditioning of samples prior to testing, It also can be used for a variety of materials of high – low temperature alternating test. The test for temperature, humidity, time can be programmed. Provides conditions of temperature from -70 degree to +180 degree and of humidity form 10% to 98%.environmental chamber ● The ideal simulation environmental chamber for all heat and cold testing between -70 ºC and 180 ºC temperature range.● Well suited for reliability testing based on current test standard in the temperature range of -70 °C to 180 °C & 10% to 98% RH.● This design SUS environmental chamber meet all requirements for extreme testing and low temperature alternating climate profiles from -70 °C -180 °C with humidity

  • Torque Multipliers

    Mountz Inc.

    Mountz torque multipliers make tough nuts easy to crack. They boost productivity, giving your workers the power to quickly turn the large fasteners found in the aerospace, transportation, mining, marine, oil/gas, and power generation industries. Mountz torque multipliers can improve process control compared to less controlled options, like impact drivers, and they guarantee quality of work. They generate less reaction torque than impact drivers as well, protecting your workers and their projects from harmful hammering. Electric and pneumatic torque multipliers are also much faster than hydraulic ratchets, helping you get more work done in less time. To top it off, they’re quiet, reducing the din of the workplace and helping to prevent hearing-related injuries.

  • Hail Impact Testing

    National Technical Systems

    Hail is an extremely destructive force of nature, especially for aircraft, with impacts occurring at more than 600 mph. NTS performs hail and stone strike testing and high velocity hail strike testing. These tests can be performed using clear ice, stone and aluminum projectiles of up to two inches in diameter, fired at velocities of up to 741 miles per hour(331.4m/sec, 1087.4 f/sec). Typical test programs include aircraft windshields, antennas, radomes, and wheel/brake assemblies. Using a laser equipped system with a high degree of accuracy, repeatable impacts can be performed to within a quarter inch of the desired target. This accuracy allows NTS to test even the smallest of test samples, as well as limit the potential damage area of larger units.

  • High Voltage Switching Test System

    Accel-RF Corporation

    The advanced development of new technologies, such as SiC and GaN, have opened the opportunity for more efficient and higher voltage/power performance in switching and power management circuits. Their high cutoff frequencies, low on-state resistance, and very high breakdown voltages can increase power supply power handling densities approaching hundreds of watts/inch. Reliability of these new technologies and techniques is critical for realizing practical applications. While Silicon devices have a rich history of proven reliability, these newer compound semiconductor technologies are too new to have a reliability history and have not been well proven. Further, process variations, even in well-controlled lines, yield widely varying results. This has driven the need for additional testing and to burn-in devices prior to delivery.

  • Production Line Acoustic Test Chamber

    PLATC - Listen Inc

    The Production Line Acoustic Test Chamber from GRAS is designed for quick and qualified acoustic test of cell phones, tablet PCs, Bluetooth speaker systems etc., including frequency response, THD, Rub & Buzz and microphone test using optional sound source. The chamber has a number of connections for injecting test and control signals to the test object (DUT).Benefits include:Repeatable testing and reliable dataEasy open/close for quick and safe change of DUTFlexible test jig for easy adjustment to new DUTFlexible microphone mounting for both front/backside speakers as well as edge-mounted speakersHigh quality, high sensitive 1/4” CCP measurementmicrophone included (G.R.A.S. 46BL)Individually calibrated frequency response** Compared to reference measurement in anechoic room

  • Semiconductor Memory Tester

    T5851 - Advantest Corp.

    Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.

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