Showing results: 2761 - 2775 of 3568 items found.
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783703-01 -
NI
2-Port, C Series Vehicle Multiprotocol Interface Module—The NI‑9860 is a hardware-selectable HS/FD controller area network (CAN) and/or local interconnect network (LIN) interface for developing CAN and/or LIN applications. As part of the NI‑XNET platform, the NI‑9860 works well for applications requiring high-speed manipulation of hundreds of frames and signals while taking other data acquisition measurements in the same CompactDAQ hardware platform or while performing low-level FPGA control and embedded monitoring in the same CompactRIO chassis.
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Megger Group Ltd.
The transformer turns ratio test, or TTR test, confirms that the transformer has the correct ratio of primary turns to secondary turns. Using this test correctly can help to identify tap changer performance, shorted turns, open windings, incorrect winding connections and other faults inside transformers. Megger’s range of TTR testers are robust to withstand the harsh conditions that some transformer testing in. The range includes varying features to simplify and speed up testing as well as 3 phase TTR testers and PT and CT TTR testers.
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LSX Series -
Pacific Power Source, Inc.
The LSX Series consists of a range of fully featured, single and three phase AC Power Sources. Available models range from 1.5kVA to 6kVA with an advanced programmable controller sporting a color touch screen user interface. Cost effective and fully programmable for both basic frequency conversion as well as advanced AC power line disturbance test and ATE applications. For applications not requiring advanced features, a basic function set M version of the LSX is available as well.Note: The LMX Series is not CE marked yet at this time.
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SYSKON Series -
GMC-I Messtechnik GmbH
The analog interface is equipped with two programmable trigger inputs and three signal outputs, which can be linked to various device functions for indication, or for controlling external devices and an auxiliary power output. Beyond this, monitor outputs and control inputs for voltage and current setpoints are available as well. Sensing leads allow for auto-sensing operation at the power consumer. Strict menu-driven operation supports highly diverse programming functions. The device is transformed into a freely programmable test signal generator by means of an expanded sequence memory and extra functions.
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Extech CG204 -
Extech Instruments Corporation
The Extech CG204 is a portable meter designed for non-invasive coating thickness measurements with automatic recognition of ferrous and non-ferrous substrates. The tester uses dual technology to indicate ferrous (magnetic induction measurement) and non-ferrous (eddy current measurement) substrates. It features single and continuous measurement modes as well as direct and group working modes, 400-reading memory storage, and user-programmable high/low alarms. The CG204 comes with two AAA batteries, USB cable, software, calibration iron, calibration aluminum, precision standards, pouch case, and user manual.
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TOS7210S -
Kikusui Electronics Corp.
The PID insulation tester (TOS7210S) is designed based on the insulation resistance tester (TOS7200) to carry out the evaluation of the PID (Potential Induced Degradation) effect of the PV module precisely and efficiently. Being equipped with the output ability of 2000 V and the ammeter with nA resolution as well as a polarity switching function, the TOS7210S is also applicable not only to the PID evaluation but also the evaluation of the insulators that requires a high sensitivity of measurement. The tester is equipped with the panel memory that is externally accessible and RS232C interface as standard; it can be flexibly compatible with the automated system.
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C- Series -
NI
C Series LIN Interface Modules are bus interfaces for developing applications with the NI-XNET driver. The NI-XNET device-driven DMA engine couples the LIN bus to host memory to minimize message latency. You can import, edit, and use signals from LDF databases in integrated LIN databases. C Series LIN Interface Modules work well for applications requiring real-time, high-speed manipulation of many LIN frames and signals, such as hardware-in-the-loop simulation, rapid control prototyping, bus monitoring, and automation control.
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Eurotech RFID FS -
Voyantic Ltd.
The Eurotech RFID FS RFID accurately rewinds rolls of RFID labels and validates their receptivity by running them through the Voyantic Tagsurance RFID inspection system. The unit allows stopping at a predetermined editing spot for the removal and replacement of the defective piece, as well as indicating defective labels by a mark printed by an inkjet system integrated with the machine. Adjustment of the closed loop tension control system can be made through adjusting the parameters on the software that control the servo motor control system. This gives the customer a virtual infinite range with which to wind their labels without cracking the inlay or antenna. As well accurate web adjustment and guidance is provided with a web guide system complete with an ultrasonic sensor. The Eurotech RFID FS RFID label inspection system is equipped with the Voyantic Tagsurance for testing the performance of RFID tags. This is done by verifying that the tag responds to commands on its whole operational frequency range, which means testing the tag on multiple frequencies, also outside the RFID reader frequency. Accurate power output combined with the Voyantic Snoop Pro antenna, optimized for testing tags inline at high speed, allows defining precise acceptance criteria and achieving stable quality.
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IPS960-511-PoE -
Axiomtek Co., Ltd.
Featuring a multi-core CPU, IP40-rated rugged design, camera communication interfaces, real-time vision-specific I/O with microsecond-scale and LED lighting control, the IPS960-511-PoE provides an all-in-one solution that addresses the needs across various machine vision platforms and automatic inspection cases. The IPS960-511-PoE is powered by the LGA1151 socket the 7th & 6th generation Intel® Core™ (codename: Kaby Lake/Skylake) and Celeron® processors (up to 65W) with the Intel® H110 chipset. The intelligent vision system comes with dual DDR4-2133/2400 un-buffered SO-DIMM sockets for up to 32GB of system memory as well as supports rich camera interfaces for connecting industrial cameras, including four IEEE802.3at PoE LAN ports and four USB 3.0 ports. Its vision I/O integrates a full range of isolated I/O interfaces and real-time controls essential to machine vision applications, including trigger input, LED lighting controller, camera trigger, as well as an encoder input for conveyor tracking. The IPS960-511-PoE also supports lighting dimming control to identify object characteristics for different inspection. Two easy-swappable 2.5" HDDs are available for extensive storage needs.
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ST2827 -
Saluki Technology Inc.
ST2827 series precision LCR meter has multiple functions and higher test frequency. With small size and portable appearance, it is convenient for use on the shelves. This instrument has a basic accuracy of 0.05%, maximum test frequency of 1MHz and resolution of 10 mHz. ST2827 series is easy to operate with a 4.3-inch LCD screen as well as English operation interfaces. Integrated transformer test function greatly improve the test efficiency. The instrument is also provided with multiple interfaces which can meet various requirements of the automatic sorting test, data transmission and storage.
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Smiths Interconnect
Filter connector series includes EMI/ EMP/ESD circular, ARINC, D-subminiature and micro-D connector styles. They can be combined with high energy TVS diode technology to achieve lightning and EMP transient protection. Smiths Interconnect's EMI filter connectors use multi-layer ceramic capacitor arrays together with inductive materials to realize robust, high performance low pass filter networks. Where required, transient protection can be combined with EMI /RFI filtering to provide maximum protection. The diodes as well as the EMI filter are packaged separately so the construction of the connector remains modular.
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Saluki Technology Inc.
SE2041 Digital Lock-in Amplifier provides an excellent performance within its bandwidth from 1 mHz to 60 MHz. With the advantage of the latest digital signal processing technology and high-speed 250MSPS 14-bit ADC, SE2041 can easily detect the phase and the magnitude of weak signals overwhelmed by various large noises. The performance of SE2041 is as good as other lock-in amplifiers all over the world, even better than them in some certain parameters, such as measurement accuracy, SNR, dynamic reserve, which meets the needs of scientific research and industrial application well.
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Neff Instrument Corporation
Low-level multiplexed systems have a single programmable gain, wide-band amplifier following the input multiplexer. To accommodate low-level signal signals such as those from strain gauges or thermocouples and at the same time high level signals from other sources, the throughput rate must be limited to enable the high bandwidth amplifier to settle to the correct value after switching to a new channel. This results in a relatively low aggregate throughput rate when compared to an amplifier-per-channel system. A major benefit of a well designed low-level multiplexed system is the extremely high performance/cost relationship.
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Tenney Environmental
Tenney Environmental offers a line of compact benchtop humidity and temperature test chambers that provide a small footprint and maximize workspace. These benchtop environmental chambers range from 1 to 5 cubic feet making them ideal for laboratories. In addition to laboratory applications, benchtop test chambers are commonly used for electronic, military, and pharmaceutical quality assurance and reliability testing, along with research testing and production processes. Even though Tenney benchtop environmental testing chambers take up minimal space they offer well sized interiors for product testing.
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Test Coach Corporation
Boundary Scan is a very useful tool for quick, low-cost, re-usable powered-up test of an assembly for basic functionality. Because a fixture with test probes is not required, it is possible to have a working test available within hours or days, rather than weeks. Designers can receive rapid feedback on their prototype boards with tests that can be used again during production testing, as well as for device programming. Given power, ground and Tap port signals, tests can be written to assess the performance of the boundary scan enabled parts on an assembly and other parts on the boundary scan chain.
