Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
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Product
Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
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The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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Product
Micro Vickers Hardness Tester
900-392
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The 900-392 Micro Vickers Hardness Tester is engineered to produce a clearer indentation and hence a more precise measurement. By means of a 10 × lens and a 40 × lens the 900-392 vickers hardness tester has a wide measurement field and a broad usage range. Equipped with a digital microscope, it shows the measuring methods, the test force, the indentation length, the hardness value, the dwell time of the test force as well as the number of the measurements, all shown on its LCD screen.
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Failure Analysis
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A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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FLIM Upgrade Kits for LSMs
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As technology leader in equipment and techniques for single photon counting, Becker & Hickl offers a wide range of high-grade Fluorescence Lifetime Imaging (FLIM) systems for laser scanning microscopes since 1998. Our techniques have found broad application within the scope of Life Sciences, Clinical FLIM, Diffuse Optical Tomography (DOT), Fluorescence Correlation (FCS, FCCS), Förster Resonance Energy Transfer (FRET) and more.
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Product
Thermal Microscope Stage For Petri Dish
TS-4SMP
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With our TS-4SMP Thermal Stage for Petri Dish, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C. The collar on the stage is designed to accommodate a 35mm 'Nunc' petri dish. The collar may also be removed for use with slides.
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Portable Video Microscope
Cl-1000
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Video microscope system ideal for installation site. Enables the user to inspect mounted connector endface from the other side of adapter.
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Product
Scanning Electron Microscope
Verios G4 XHR SEM
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The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Microscopes
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Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Life Sciences Applications
LS-AFM
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The LS-AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.
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Scanning Electro-chemical Microscope
920D
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The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
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Flexible AFM
SA-AFM
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The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated with inverted microscopes.
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Product
Electron Microscope Analyzer
QUANTAX Micro-XRF
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Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Microscope
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Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Product
Stereoscopic Zoom Microscope Automation
SZ-2000
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Applied Scientific Instrumentation
Based on ASI's proven DC servo motor technology, the SZ-2000 automates stereo zoom microscopes. The unit can be configured for motorized focus only, motorized focus with automated zoom control, or motorized focus with automated zoom control and an automated XY translation stage. The Z axis focus resolution varies slightly depending upon the model of the microscope, with 0.8 microns being the smallest step size available on a Nikon SMZ800.
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Product
SPM Control System
Nanonis
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SPECS Surface Nano Analysis GmbH
Unbound to any specific microscope, the Nanonis SPM Control System is designed for the uncompromising demands of scientific excellence in a wide variety of SPM applications. Its modular concept implemented in a fully digital fashion is carefully thought through, with a strong emphasis on usability, stability and flexibility.
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Upright Microscope Systems
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Below you can see examples of an upright microscope system created using our components. Typically these examples are for life science applications, however they can be used for industrial or material applications.
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LIFA FLIM System
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The Lambert Instruments LIFA FLIM system is the fastest and easiest way to perform Fluorescence Lifetime Imaging Microscopy (FLIM).Available in versatile configurations dependent on your specific applications, the LIFA system offers a turn-key solution for fluorescence lifetime imaging microscopy. Compatible with any fluorescence microscope with a camera output – including microscopes by Leica, Nikon, Olympus, TILL and Zeiss. Set up is quick and easy, with all hardware integrated seamlessly with our dedicated LIFA software, so you can focus on your experiment.The advanced software instantly analyses data and presents the calculated fluorescence lifetimes visually. Recorded images are compatible with ImageJ, FIJI, Matlab and MetaMorph, while detailed statisitcal data can be exported to an Excel worksheet.
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Infrared Microscope
DDR200/300 NIR
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The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
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Manipulators
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The patented Nanomotor is the heart of any manipulator. Three independent linear stages are used in every single manipulator. The manipulator provides 0.5 nm resolution in all three axis. All manipulators can be used in air setups or inside of electron microscopes. Docking stations allow an easy transport between any setup.
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Industrial Microscope Systems
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Below you can see two industrial microscope systems which can be created using our components. Many other automated microscopy systems are possible using our components.
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Toolmakers Microscope
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Sinowon Innovation Metrology Manufacture Ltd.
It is widely used in mechanical, meter, electronic and light industry; university, Institute and metrology department. The measuring profile projector can detect the contour dimension and surface shape of variety complex workpiece, such as templates, punching pieces, cams, threads, gears, molding milling cutters.
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Atomic Force Microscope
FlexAFM
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For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
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Microscopy Software/Hardware
ZEISS Atlas 5
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Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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Connector Inspector
Series 1
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Lightel currently offers more than 60 standard and specialty tips for our Series 1 video microscope probes (black colored probes). All listed tips fit the CI-1000 and VC-6100-PL probes. These tips can be used with the CI-1100, DI-1000 or VC-6200-PL probes (gray colored probes), by using a PT2-CI/ADAPT adapter.
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Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
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Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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OTDR
OT700 series
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Shanghai Tarluz Telecom Tech Co., LTD
SM OTDR, MM OTDR, visual fault locato), PON online test, Optical Power Meter, Optical Laser Source, Fiber Microscope, Ready for all kinds of environment.
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Scanning Electron Microscope (SEM)
Prisma E
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Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Multiphoton Laser Scanning Microscope
FVMPE-RS
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The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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Benchtop Fiber Microscope
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BL-C series X/Y Axial Adjustment benchtop fiber microscope is used to inspect the polished surface or cleaved ends of fiber optic connectors. With a critical view of fine scratches, the BL-C series benchtop fiber optic microscope is an ideal choice for factory post-polish, component assembly, QC inspection of fiber connectors.
