Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
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Imaging & Analysis
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Microscopes offered by Buehler generally fall into the categories of stereo microscopes, upright microscopes, or inverted microscopes. Inverted microscopes are commonly referred to as metallurgical microscopes. Microscopes may offer episcopic (reflected light) observation, diascopic (transmitted light) observation, or both possibilities. Illumination may be delivered in bright field mode (BF) or dark field mode (DF), and several techniques such as differential interference contrast (DIC) and polarized light microscopy make use of the nature of light to reveal specific pieces of information when studying materials.
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Low to Medium Test
KI-TK035
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1310/1550 nm & 850/1300 nm source & power meter, inspection microscope, cleaning materials. Interchangeable MPO, MPO/APC, SC, LC connectors (EAR99 Restricted)
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Stereo and Zoom Microscopes
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Generate three-dimensional and laterally precise images. With Stereo Microscope you observe large samples such as leafs and tissues or inspect rough material surfaces. Upgrade your microscope flexibly with different digital cameras and benefit from various types of illumination techniques.
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Imaging Station
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Standard upright microscopes were not designed to work with temperature controlled stages. Microscopes are optimized to get the best possible image for a number of different techniques (phase contrast, DIC, polarized etc...) Unfortunately due to the confines of the standard microscope frame, it is not easy to get samples under the objective lens and into the stage.
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Pinhole Detection Devices
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ElektroPhysik Dr. Steingroever GmbH & Co. KG
The coating control by means of pore testing makes use of electrical voltage in order to uncover microscopically small defects (> 20 μm) in the coating of a surface. If even a small defect can be detected during pore testing of surface coatings, urgent action is required. Minimal flaws in the coating are sufficient to cause great damage.
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Metallurgical/Metallographic Testing
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A partial view of our Metallurgical examination areas, showing metallurgical microscopes with digital filar micrometers. These instruments, along with our cross-sectioning and polishing equipment, make the Optical Metallography facilities at Pacific Testing among the most extensive in the industry. In addition, these facilites are under the supervision of our Chief Metallurgist, with a Ph.D. in Metallurgy.
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Easycheck Fiber Endface Inspector
CA3002
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The integrated style design makes the size compact and operation easy. You are no longer to worry about so many cables between monitor and microscope, greatly saving the time for operation and worktable space, thus creating more productivity. Easycheck have a series different model according to different application, it has photo capture function; for transceiver checking; X、Y adjustable; image auto analysis and judgement, etc. The user can choose the desired model per the requirement.
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Acoustic Micro Imaging.
AMI Gen7
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The New Generation of C-SAM Technology. The most sophisticated and fully featured C-SAM acoustic microscope for laboratory analysis and specialized high resolution applications.
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Nanopositioning Stage & Controller
PInano
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Physik Instrumente GmbH & Co. KG
PInano® XY and XYZ low-profile piezo scanning stages are optimized for easy integration into high-resolution microscopes. They feature a very low profile of 20 mm (0.8") and a large aperture designed to hold Petri dishes and standard slide holders. The long travel ranges of up to 200 x 200 x 200 µm with nanometer closed-loop resolution are ideal for leading-edge microscopy and imaging applications. PInano® series piezo positioning stages are available in two versions: A) Highest Stability, Linearity and Precision with capacitive feedback sensors. B) High Precision with lower cost piezoresistive sensor feedback. Both types provide very high sensitivity and responsiveness as well as nanometer resolution. A proprietary servo controller significantly improves the motion linearity of the piezoresitive version compared to conventional piezoresistive sensor controllers.
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Electron Microscope Analyzer
QUANTAX EDS for TEM
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Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
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Ultrasonic Hardness Tester
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Sinowon Innovation Metrology Manufacture Ltd.
◆ Perfect Accuracy——±3% HV, ±1.5HR, ±3%HB.◆ Microscopic Indentation—— Only high-power microscope can observe the indentation.◆ Quick Measurement——Result in 2 seconds.◆ Large LCD Display——Directly display measurement result, times count, maximum, minimal, average and deviation.◆ Friendly Operation——Operate well after short training.◆ Promised Warranty——2-Year warranty for main unit (Excludes Probe).◆ Mass Storage——Save 1000 groups measurement data.◆ Simple Calibration——Save 20 groups calibration data for invoking, improve calibration efficiency.
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Single Photon Counting Camera
LINCam
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Photon counting is the only way to get as much information brought by light as it is physically possible. Here we present the system allowing to detect not only arrival time of individual photons but also a position as straightforward as camera. Standing on the shoulders of night vision technology LINCam allows to extend any simple wide-field microscope to the powerful fluorescence lifetime imaging system.
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High Quality Digital Benchtop Microscope
D SCOPE
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This unique microscope combines high quality optics with a modern and ergonomic design ideally suited to fiber optic applications. Until the D Scope, most microscopes were suffering from poor illumination quality yielding variable and non-reproducible image quality even amongst scopes of the same kind.
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Microscopy
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Aurora is an award-winning Airy Beam Light Sheet imaging system designed for researchers working in fields such as neuroscience, developmental biology, cancer biology, regenerative medicine and other bioscience disciplines, including Plant Sciences and Marine Biology. Compact, affordable and customisable, Aurora is available as a single and multiphoton light sheet fluorescence microscope for rapid, large 3D volumetric imaging, high resolution, multicolour, time-lapse imaging and live cell imaging. Aurora uses ground-breaking Airy Beam Light Sheet imaging techniques to achieve outstanding results in the field. It is currently in use by many leading organisations delivering results previously not possible.
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Double Monochromator
Gemini 180
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The Gemini 180 is a fully automated, double additive grating scanning monochromator. The incorporation of toroidal optics provides for optimum throughput and spectral resolution. The Gemini 180 functions as a high power, high purity light source for Fluorescence, detector characterization, and microscope illumination when coupled with one of our Xe Light Sources.
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TOC-L For Monitoring A Microscopic Algae Biomass
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Biomass is considered a prospective new energy source. The dry weight method has been typically used to determine the amount of microscopic algae in biomass. However, Shimadzu proposes a new method, one that is rapid, easy, and accurate, utilizing the TOC-L total organic carbon analyzer.
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Portable Microscope, X4001mm Field Of View, 1µm High Resolution
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The highest resolution digital field microscope. Ideal for observing plant and animal samples at the cellular level. The ioLight microscope will even display limited structure in blood cells, which are 5-10µm across.
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Ultrasonic Flaw Detector
ECHO
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The ECHO scanning acoustic microscope is a nondestructive ultrasonic flaw detector designed to simplify testing, increase yield and maximize productivity in the lab or on the production floor.
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Package Leak Detectors
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Packages should be absolutely leak tight. However, even with the utmost care in the process, faulty packaged products cannot be completely avoided. Defects in the sealing process or in the material can easily lead to leaks, sometimes microscopically small.
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Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
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Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Ophthalmic Surgery Microscopy Solutions
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Ophthalmic surgery requires a high degree of precision to ensure optimal accuracy when maneuvering instruments and manipulating delicate ocular tissue. The surgical microscope is one the most important instruments in eye surgery, allowing ophthalmic surgeons to visualize micro-anatomical details and perform efficient and extremely precise movements.
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Desktop Fluorescence Microscope
Nanoimager
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The complete package for super-resolution microscopy
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Metallurgical Microscope
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Offering you a complete choice of products which include dg classic trinocular metallurgical microscope, dg victory trinocular metallurgical microscope, dmi classic trinocular metallurgical microscope, dmi excel binocular metallurgical microscope, dmi optima trinocular metallurgical microscope and dmi prime trinocular metallurgical microscope.
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Compact Hyperspectral Cathodoluminescence
F-CLUE
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The F-CLUE is the optical fiber coupled solution offering a flexible interface for Cathodoluminescence Imaging and Spectroscopy analysis.Thanks to its rugged ultra-compact footprint and deported spectroscopy modules, it can be installed even on very busy microscopes and/or in harsh industrial environments or extreme conditions (clean room, mobile laboratories…).
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Polariser Analyser
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*includes analyzer to fit in microscope head and polarizer that fits over light source
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STM Microscope
NaioSTM
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The first scanning tunneling microscope (STM) was developed in 1981 by Gerd Binnig and Heinrich Rohrer at the IBM Research Laboratory in Rüschlikon, Switzerland, for the first time making individual atoms directly visible to a small group of specialists. They were awarded the Nobel Prize in physics in 1986. In 1997, Nanosurf went one step further and brought single atoms to the classroom!
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AOI Handlings System
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The AOI handling system is a compact facility with various test units. Via an ionization cleaning station the ceramics are transferred to the contacting station. There, the resistance values of the substrates are tested with a rigid needle adapter. Afterward, the ceramics are further conveyed to the three (optionally four) AOI test stations (for automatic optical inspection) and are tested for cracks, unevenness, faulty imprints, contamination, etc. The poorly evaluated ceramics arrive at a review station where the operator can assess and evaluate the errors on the monitor. If the operator is uncertain about a fault, the ceramic in question can be positioned under the microscope position and inspected by eye. Poorly defined ceramics are marked accordingly with an ink pen.
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Inspection Microscope
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This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
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Scanning Probe Microscope
SPM-9700HT
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Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
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Microscopy
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Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye. There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.
