Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
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Single Mode Multimode Test Inspect Kit
KI-TK072A
1310/1550/1625 nm & 850/1300 nm source & Autotest power meter + acceptance reporting software, inspection microscope, cleaning materials. Interchangeable SC/APC & LC/APC connectors
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Imaging & Analysis
Microscopes offered by Buehler generally fall into the categories of stereo microscopes, upright microscopes, or inverted microscopes. Inverted microscopes are commonly referred to as metallurgical microscopes. Microscopes may offer episcopic (reflected light) observation, diascopic (transmitted light) observation, or both possibilities. Illumination may be delivered in bright field mode (BF) or dark field mode (DF), and several techniques such as differential interference contrast (DIC) and polarized light microscopy make use of the nature of light to reveal specific pieces of information when studying materials.
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Production Wafer Level Burn-in
TV19 VersaTile™ probe cards are designed with Celadon’s patented ceramic technology for superior electrical performance, yet is highly modular due to it’s 28mm x 28mm chassis. Micro-adjustments can be made in seconds with an allen wrench and a microscope. Easily align VersaTile cards for different wafer layouts using a 4.5” compatible 1×3 , 200mm, or 300mm VersAdjust plate.
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Microscope Software
Choosing the right software for your Vision Engineering microscope is just as important choosing the hardware. Whatever you need and however you like to work, you’ll find the right application software here.
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LIFA FLIM System
The Lambert Instruments LIFA FLIM system is the fastest and easiest way to perform Fluorescence Lifetime Imaging Microscopy (FLIM).Available in versatile configurations dependent on your specific applications, the LIFA system offers a turn-key solution for fluorescence lifetime imaging microscopy. Compatible with any fluorescence microscope with a camera output – including microscopes by Leica, Nikon, Olympus, TILL and Zeiss. Set up is quick and easy, with all hardware integrated seamlessly with our dedicated LIFA software, so you can focus on your experiment.The advanced software instantly analyses data and presents the calculated fluorescence lifetimes visually. Recorded images are compatible with ImageJ, FIJI, Matlab and MetaMorph, while detailed statisitcal data can be exported to an Excel worksheet.
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Inspection Microscope
This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
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TEM Sampler
Naneos Particle Solutions gmbh
The naneos partector TEM sampler is the perfect marriage between simplicity and power: You can use it as a simple survey instrument to quickly identify nanoparticle sources in workplaces. You can also use it to sample particles directly to a standard transmission electron microscope (TEM) grid.
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3D Measuring Laser Microscope
LEXT OLS5000
The OLS5000 laser confocal microscope precisely measures shape and surface roughness at the submicron level. Data acquisition that's four times faster than our previous model delivers a significant boost to productivity. Measure samples that are up to 210 mm tall. Capture the shape of any surface. Total magnification: 54x - 17,280x
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Hand-held Fiber Inspection Microscopes
The WL-C series hand-held fiber microscopes use coaxial illumination to provide users with maximum detail. It easily can detect the finest scratches and contamination, making it ideal for critically inspecting polish quality.
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Particle Analysis for Liquids
With our partner Pamas we have developed the microscopic image analysis system PAMAS FastPatch 2 GO for automatic membrane filter analysis.
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Electron Microscope Analyzer
QUANTAX EBSD
QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
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NanoLattice Pitch Standard (NLSM)
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
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Electron Microscope Sample Preparation
Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
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Electron Microscope Analyzers
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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SAM Line
PVA TePla Analytical Systems GmbH
The SAM Line offers easy-to-use scanning acoustic microscopes for process control and quality assurance as well as for research applications. The individual models are derived from a component platform that complies with industry standards and incorporates cutting-edge production and manufacturing technologies. Thanks to their new high-frequency and transducer technology, our acoustic microscopes enable detailed acoustic analysis in the ultrasound range up to 400 MHz.
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SPM Control System
Nanonis
SPECS Surface Nano Analysis GmbH
Unbound to any specific microscope, the Nanonis SPM Control System is designed for the uncompromising demands of scientific excellence in a wide variety of SPM applications. Its modular concept implemented in a fully digital fashion is carefully thought through, with a strong emphasis on usability, stability and flexibility.
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Light Microscopy
Materials Evaluation and Engineering
MEE has a variety of light microscopes with magnifications ranging from 5X to 2400X. Each microscope is connected to a camera with digital image capture for subsequent measurements and/or additional image analyses.
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Scanning Electrochemical Microscope
VS-SECM (DC And AC)
The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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NeaSNOM Microscope
Based on high-stability scanning-sample Atomic Force Microscope optimized for optical nanoscopyOptical focusing unit accepts visible, infrared and even terahertz illuminationTwo independent module bays allow imaging & spectroscopy at the same time
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Microscope Automation
Prior Scientific is the world leader in microscope automation, microscope automated precision components and customized sub-assemblies. We offer a wide range of off-the-shelf components such as XY motorized stages, Z focus motors and translation stages, high-resolution microscope stage controllers and robotic slide loaders as well as high-intensity bright field and fluorescence illumination sources.
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Microscope
Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Microscopic Four-Point Probes
M4PP
CAPRES M4PP Microscopic Four-Point Probes have an electrode pitch three orders of magnitude smaller than conventional four-point probes, and are fabricated using silicon micro-fabrication technology.
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Cell Culture & Cell Monitoring Solutions
Improve and streamline your cell culture processes with Olympus’ innovative cell culture and cell monitoring equipment. At Olympus, we offer equipment to support processes through a range of cell culture analysis stages, including cell culture microscopes and cell monitoring equipment and software.
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Failure Analysis
A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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Atomic Force Microscope (AFM)
CombiScope
The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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PC Edition Ynit
RH-2000
"RH-2000" is a digital microscope which can evolve and customize. 2D Measurement, 3D Measurement, and Tilting. "RH-2000" enables you to make a high performance observation and analysis.
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DI-1000L-Pro
The DI-1000L-PRO combines the all-digital wide-view DI-1000L microscope with our ConnectorView™ Plus v2 Pass/Fail software for fast objective analysis of fiberoptic connector endfaces. Powered by it’s direct USB2.0 connection to your PC, the DI-1000L-Pro can provide you with automatically centered Analysis Reports and Summary Reports in Excel or text.
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Industrial Microscope Systems
Below you can see two industrial microscope systems which can be created using our components. Many other automated microscopy systems are possible using our components.
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Electron Microscope Analyzer
QUANTAX Micro-XRF
Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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High-end Transmission Electron Microscope
CryoARM
JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
