Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
-
Product
Fiber Optic Inspection Microscope
80760
-
The Miller 200x Microscope helps inspect fiber optic connectors quickly and easily. Its ergonomic design and built-in features make it ideal for field and lab use. The microscope features a pressure-activated on/off switch, focusing wheel, eyepiece, auxiliary white LED light source rated for 100,000 hours, adapter tip for inserting ferrule and battery compartment.
-
Product
Stereo & Pocket Microscope
-
A small microscope which is designed to be easily portable. In some cases, the microscope may literally fit in a pocket, while in other cases it may be more comfortably carried in a field bag or small carrying case.
-
Product
Image Analysis Software
-
Olympus image analysis software turns an Olympus microscope into an effective, high-performance analysis station. Its intuitive operation enables smooth image acquisition, filtering, measurement, documentation and archiving.
-
Product
Microscopic Probes
M12PP
-
CAPRES M12PP Microscopic Twelve-Point Probes are specialized versions of the CAPRES Micro Multi-Point Probes. By using a dedicated 12-by-4 multiplexer, a total of 495 different pin-configurations can be obtained, each with different probe pitch. This is utilized in e.g. the CIPTech, where 8 or more combinations are used to obtain a “depth profiling” of the measured structures.
-
Product
SAM Auto Line
-
PVA TePla Analytical Systems GmbH
The fully automated acoustic microscopes from the SAM Auto Line enable simple detection of cavities, voids, bubbles, inclusions, and delamination and are ideally suitable for wafer inspection, bond checking, and MEMS inspection. An automatic defect-review software package performs a fully automated evaluation of the entire wafer. The results can be issued as klarf files and VEGA MAP. A GEM/SECS connection is also possible.
-
Product
Multiphoton Laser Scanning Microscope
FVMPE-RS
-
The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
-
Product
Optical Inspection
-
Typically, in a standard PCB manufacturing facility, there will be a department where people perform inspection of PCBs through a manual processes, such as visual inspection with magnifiers, microscopes, etc...
-
Product
LCD Module Repair System
LCD-4400M
-
The LCD 4400M is a precision instrument designed to repair large size LCD modules. Featuring light weight, state of the art technology, the LCD4400 focuses a Nd:NAG laser directly through a microscope objective.
-
-
Product
Smart G-Scope
-
Dou Yee Enterprises (S) Pte Ltd
Auto focus digital microscope & telescopeReal fast auto focus by using liquid lensInfinity(x10) ~ Contact (x250) hole area auto focus by changing mode switchAuto focus & manual focus functionChangeable various End caps to support 3pi coner end capHigh luminance OLED displayInfrared wireless controlSupport Android & Windows (XP, Win 7, Win 8)Various image filters & digital zoom functionSpecial design for portablility (aluminum case) No battery neededProvide software for Android and PC
-
Product
Microscopy Software/Hardware
ZEISS Atlas 5
-
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
-
Product
Nanomechanical Instruments For SEM/TEM
-
As the world leader in nanomechanical testing systems, Bruker makes it easy for you to conduct in-situ mechanical experiments in your microscope with the Hysitron PI Series PicoIndenters. Our unique transducer design delivers unmatched stability throughout your experiments, resulting in precise data even at the nanoscale. Video capture from the microscope enables real-time monitoring and direct correlation of mechanical data to microscope imaging. With solutions designed to fit many of the microscope brands in use, you are sure to find one that is ideally suited to your research.
-
Product
Energy Dispersive X-Ray Spectroscopy (EDS)
-
Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
-
Product
Microscope Photomultiplier Photometers
-
HORIBA's microscope photometers are ideal for any lab wishing to quantitate light intensity from a sample on a microscope stage. Initially designed for the most demanding low light level fluorescence kinetics of labeled mammalian cells, these photometers are also just as well suited for mineral analysis or transmission studies.
-
Product
Microscope Spectrophotometer
508 PV
-
The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.
-
Product
UV-Visible/NIR Microspectrophotometers
MSV-5000 Series
-
Microscopes that use a high resolution double-beam scanning spectrophotometer for precise and accurate measurement in the wavelength region 200-2700 nm.
-
Product
Spectroscopic Platform
Allalin
-
The Allalin is a nanometer resolution spectroscopy instrument, based on a disruptive technology known as quantitative cathodoluminescence that integrates a light microscope and a scanning electron microscope (SEM) into one tool.
-
Product
Complex of Visualization and Image Recording for a Video Microscope
-
To develop a complex for visual inspection of electronic components (other micro-objects) in order to identify visual defects, record the resulting image and transfer information for processing.
-
Product
Metallographic Microscope
-
Beijing TIME High Technology Ltd.
A specialized optical instrument used to examine the microstructure of opaque materials, such as metals and alloys, by reflecting light off the polished and often etched surface of a sample.
-
Product
Advanced Stand-Alone AFM
SmartSPM
-
The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques).
-
Product
Scanning Electron Microscope
Verios G4 XHR SEM
-
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
-
Product
Osmometer
LD-LOSM-A10
-
OsmometerLD-LOSM-A10is colorful LCD touch display with sample size 50 μl to 100 μl and measuring range up to 0 to 3000 mOsmol /kg H2O at ambient temperature 10 to 30°C. Features with on-screen display of molar concentration, freezing point, and osmolarity. At very low testing time it provides fast and accurate osmolality test results. Applicable in General medicine, Routine and research, Forensic medicine, Electron microscope.
-
Product
Autofocus Optical Fiber Microscope - AFM-700
-
Shanghai Fibretool Technology Co.,Ltd.
The AFM-700 is an autofocusing optical fiber microscope.
-
Product
Wafer Cathodoluminescence Microscope
Säntis 300
-
Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
-
Product
AFM Atomic Force Microscope
FM-Nanoview 6800
-
Zhengzhou Nanbei Instrument Equipment Co. Ltd
All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
-
Product
Optical Filter Sets
-
Our filter sets support a great range of fluorophores for microscopes and imaging systems. Patented design techniques drive some of the most spectrally sophisticated optical filters on the market. High transmission, steep edges, precise spectral edge placement, and optimized blocking combine for more reliable measurements. A wide selection of individual bandpass filters and dichroic beam-splitters support unique applications, and world-class manufacturing and cutting-edge metrology ensure consistent performance that always meets specifications.
-
Product
FLIM Upgrade Kits for LSMs
-
As technology leader in equipment and techniques for single photon counting, Becker & Hickl offers a wide range of high-grade Fluorescence Lifetime Imaging (FLIM) systems for laser scanning microscopes since 1998. Our techniques have found broad application within the scope of Life Sciences, Clinical FLIM, Diffuse Optical Tomography (DOT), Fluorescence Correlation (FCS, FCCS), Förster Resonance Energy Transfer (FRET) and more.
-
Product
Inspection Systems
-
Video Inspection Systems with?or without measurement capabilities are an excellent way to evaluate and test small items or items in?difficult to access locations. Many options are available in addition to the measurement capability. Video Inspection is used for a variety of purposes including the ability to see? and measure items that are much smaller than the eye can see or that hand tools can measure. Video systems can also reduce the eye and/or back strain associated with production environments where an operator must look in a microscope all day.
-
Product
Fluorescence Microscopes
-
We develop epifluorescence microscopes with a single fluorescence up to 16 fluorescences in a few seconds. Realized with standard cameras or highly sensitive sensors.
-
Product
Atomic Force Microscope
HDM Series
-
The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
