Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Three-phase Fully Automatic Test System
TS33
Calmet Smart Calibration Devices
The Calmet TS33 portable test system consists of a three-phase reference meter of accuracy class 0.02%, 0.04% or 0.1% and an integrated three-phase current and voltage source up to 3x120A/600V. The TS33 is designed for analysis of complete metering installations and local mains conditions.
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Crank Angle Detector
PP/PA series
The Crank Angle Detection System is composed of a crank angle detector, a slit disk and a power box with built-in amplifier. By mounting the slit disk and crank angle detector to the crankshaft end of the engine, it enables to detect the rotation angle required for various engine performance tests such with high accuracy and high response.
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Portable Touchplate Wrist Strap Tester
Testing your ESD Wrist Strap system before handling electrostatic sensitive is extremely important. ESD events can go unnoticed by feel and sight. While a static discharge into a door knob (we’ve all done it!) can be thousands of volts, an ESD event can be as little as 10V, and you will not feel this. This is a no-frills, “go-no-go” type tester, but portable. Sure you could put this at your entry point, but where it really shines is in special remote applications. Keep one in your tool box, bag or Field Service Kit.
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ESD & Latch-Up Test System
Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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Single Event Effects Test System
SEE-RAD
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
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Plastic Optical Fiber Analysis System
2500
While the 2500 Optical Fiber Analysis System is the industry-standard for testing standard, silica multimode optical fibers, it is also capable of performing comprehensive characterization of the new generation of graded-index plastic optical fibers (GIPOF). The 2500 provides high speed, repeatable measurement of several critical fiber properties including spectral attenuation, time- domain (pulse) bandwidth, single-mode launch differential mode delay, core diameter and numerical aperture - all in accordance with recently developed IEC measurement standards. The GIPOF-capable 2500 is compatible with fibers having core diameters up to 120 um (IEC Type A4g and A4h).
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PCMCIA Card
DAS-429PCMCIA/RT10
Both cards contain 68 Kbytes of true dual-port RAM, for data blocks, control registers and Look-up table, mapped within the Common Memory space. The card also contains a FLASH-based Card Information Structure (CIS) within the Attribute Memory space.The cards comply with the Personal Computer Memory Card International Association (PCMCIA Release 2.1) standard, including Plug and Play. The card's small size and suitability for PCMCIA compatible notebook computers with Type II and Type III slots ma...show more -
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VLF Diagnostics System
PHG 80 TD
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PHG 80 TD. The combination of the PHG 80 programmable test generator with the BAUR dissipation factor measurement system produces the cable testing and diagnostics system PHG TD. It is operated via PC control. Dissipation factor measurement and diagnostic testing sequences can be programmed in the menu, after which the dissipation factor measured values are automatically determined in various voltage steps and a final evaluation is conducted.* Biggest ...show more -
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EQE/Photon-Electron Conversion Testing
Enlitech offers different solutions for incident photon-electron conversion testing systems. The available systems include IPCE, PV External quantum efficiency (PV-EQE), Internal Quantum Efficiency, Spectral Response (SR), Highly-sensitive EL-EQE. There are over 1,000 SCI papers cited Enlitech‘s systems to provide reliable experimental data for significant scientific publication. The Highest PV-EQE sensitivity and EL-EQE both reach 10-5 % (7 orders). They can be utilized to PV conversion efficiency, HJT/ PERC/TOP-CON current-loss analysis, Organic PV charge-transfer-state and Perovskite PV trap state measuring, and Organic PV and Perovskite PV Voc loss analysis.
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PXIe-5451, 145 MHz, 16-Bit, 128 MB, PXI Waveform Generator
781204-01
PXIe, 145 MHz, 16-Bit, 128 MB, PXI Waveform Generator—The PXIe‑5451 is a 145 MHz, dual‐channel arbitrary waveform generator capable of generating user-definied waveforms, standard functions, and I/Q communications signals. It is an ideal instrument for including in systems for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator as wells as time-domain signals like envelope tracking. The PXIe‑5451 also features onboard signal processing (OSP) functions t...show more -
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Mobile Cable Fault Location System
Syscompact 2000
BAUR Prüf- und Messtechnik GmbH
Fault location with Syscompact 2000. The Syscompact 2000 is a multifunctional cable fault location system designed for modular 19" rack technology. The integrated surge and test generator is used for cable and sheath testing as well as for precise location of high-resistive and intermittent faults. The SYSCOMPACT 2000 is preferably used in low- and medium-voltage networks for fault location up to a cable lengths of 65 km. * Fast and reliable * Precise, dependable cable fault location High performance * high voltage unit* Integrated proven cable fault pre-location methods
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Lamp Cap Temperature Rise Test System
CX-T1
Shenzhen Chuangxin Instruments Co., Ltd.
Lamp Cap Temperature Rise Test System is according to IEC60360-1998 and GB2512-2001(Standard method of measurement of lampcap temperature rise). It is used to test the working and environmental temperature as well as temperature-rise of the burner and lamp. It meets the requirement of IEC and GB Standards
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High-Power LXI Matrix Modules
Pickering's high-power LXI matrices are a single pole module available in a variety of configurations and are suitable for power signal routing in large automatic test equipment (ATE) systems. They are available with a selection of X and Y sizes as well as partially populated configurations.
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Physical Layer Test System
N19301B
The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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ICE 3000 Series
ICE3009
The ICE3009 subsystem is an agile filter for the VHF-L, VHF-H and UHF frequency bands. It allows operation of a number of transceivers in a cosite environment. The VHF/UHF Filter provides multiple poles of RF selectivity to reduce broadband noise in transmit mode of operation and to reduce interfering signals at the transceiver’s RF input in receive mode at Have Quick II/IIa and SATURN tuning speeds. This design incorporates a flexible control scheme that can be configured at the factory for var...show more -
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48V / 200 Amp Load
BD12-48P-24/12
For Battery Discharge testing and Power Supply testing. This particular Load has been designed to operate with 12V, 24V and 48V Battery systems and isextremely cost effective.
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SPD High, Medium, and Low Voltage TOV Test Equipment
Shanghai Guantu Technology Co., Ltd.
The high (medium) voltage TOV tester is used for transient overvoltage tests caused by faults in high and medium voltage systems such as surge protectors (SPDs), and can also be used for other scientific research tests.standardGB/T 16927-1997 High voltage test technology.GB18802.1-2011 Surge protective device (SPD) for low-voltage power distribution system Part: Performance requirements and test methods.IEC61643-1:2005 (Surge protective devices connected to low-voltage power distribution systems...show more -
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H-Field Rod Antenna
The A.H. Systems' set of H-Field Rods provide an accurate standard for magnetic field testing. The rods are available individually or in a set of four to cover the frequency range of 100 Hz to 30 MHz.
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Protective Cover, S6, Receiver
310113432
The Receiver Protective cover is designed to protect your modules and contacts while the test system is not in use.
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Automatic Test System
Star-Rec
Test entire HDI panel at once, or step & repeat in the "feed" direction. Fastest BGA Strip test system available. Star-Rec comes standard with: * loader * board cleaner * CCD Camera Alignment * electrical test section * fail and pass re-stackers * Board Marker
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Enlarge Environmental Chamber
REXMED REC-250
MOD. REC-250, AC 230/380/415V, 1/3 phase, Environmental chamber, HS CODE: 841989, UNCCS CODE: 484384, UMDNS CODE: 16327, Main construction: SS304, Interior: SS304, Exterior: SS304 powder coated, Insulation: Rigid polyurethane foam and glass wool, Controller: Fix point PID controller, temperature ˚C/PV and ˚C/SV, humidity %/PV and %/SV display and setting, Temperature range: -20˚C~100˚C, Humidity range: 20%RH~98%RH, Constancy: ±0.3˚C ±2.5%RH, Uniformity: ±1˚C ±3%RH, Temperature and humidity senso...show more -
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Custom Test Stands/Production Test Cells
Emprise Corporation is an engineering consulting firm serving the automotive, aerospace, industrial and alternate power industries. Our expertise in each of the individual fields of technology, systems integration, construction management, and integrated test facility design and delivery sets Emprise apart from other single-source engineering firms.
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16/32 -CH 16-Bit 250/500 KS/s Multi-Function DAQ Cards with Encoder Input
PCI-9222/9223
The ADLINK PCI-9222/PCI-9223 is a 16-bit, 16/32-CH, 250/500 KS/s high performance DAQ card with 8 different input ranges. It also features 2-CH 16-bit analog outputs capable of a 1 MS/s update rate, 2-CH encoder inputs, and programmable function I/O. The software-programmable function I/O supports a variety of applications, including TTL digital I/O, high-speed DIO, general-purpose timer/counter, pulse generation, and PWM output. Analog input, analog output, and function I/O at full speed simult...show more -
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Servopulser Vibration Testing Machine
EHV Series
This machine performs vibration tests on structures, equipment, transport packages, etc. Vibration directions include horizontal and vertical. Large capacity and large stroke can be obtained with the electro-hydraulic servo system.
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PXIe Vector Network Analyzer, 300 kHz to 14 GHz
M9373A
Pay for only the frequency range you need with a choice of six frequency ranges up to 26.5 GHz Improve accuracy, yield and margins with the best PXI VNA speed, dynamic range, trace noise and stability Add functionality to your test system with a full 2-port VNA that fits in a single PXI slot Address your multiport applications needs by cascading multiple models Increase throughput and lower costs by adding modules in a multi-site configuration
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Integrated 5G mmWave Test System
IQgig-5G
The IQgig-5G is a fully-integrated, non-signaling solution for testing 5G mmWave products at both the 28 GHz and 39 GHz frequency bands. All signal generation, analysis, and RF front-end routing hardware are self-contained inside a single chassis. The IQgig-5G is license-upgradeable to support the pre-5G and 3GPP standards evolution with up to 1 GHz of tester bandwidth. The IQgig-5G solution has three bi-directional source and measurement ports each with 2.92mm connector coaxial interface.
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DC Power Module, 100V, 1A, 100W
N6746B
This module is used in both the small, multiple output 1U high N6700 Low-Profile Modular Power System (for ATE systems) and the multiple output N6705 DC Power Analyzer (for bench testing). GPIB, LAN, USB, and LXI compliance are standard. Select from more than 20 different DC power modules, ranging in capability from basic to high precision, and in power from 20 - 300 W.