Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Dynamic Component Test Systems
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RedViking brings advanced engineering and proven implementation expertise to your next dynamic component test stand. We’ve designed entire fleets of multi-model and single-model test systems for new component development and production as well as military and commercial MROs. We have decades of experience building and implementing turnkey dynamic component test systems, and we’ll work with your teams virtually anywhere in the world.
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Product
Car-to-X Test Systems
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Qosmotec Software Solutions GmbH
Wireless Communication Technology is finding its way into automotive industry – not only for entertainment purposes, but for security and safety reasons: With Car-to-X technology, drivers shall get information that other vehicles and road side facilities already have, for example, in case of a traffic jam ahead, a slippery road behind a curve or a necessary change of the traffic lane because of road constructions.
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Power Device Test Systems
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Power semiconductors are devices that control electric power, and are used in automobiles and a wide range of electrical products. Our power semiconductor test systems, developed and provided by CREA, an Advantest Group company, specialize in testing power semiconductors that handle high voltages and large currents, and have special safety features for this purpose.
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Telecom Test Systems
4301 Series
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The 4301 is designed to work with a standard arbitrary wave form generator or signal source that can be triggered. The system can be ordered with an optional Fluke 281 arbitrary waveform generator, which comes pre-programmed and integrated into the 4301 system. When equipped with the Fluke 281 option, the 4301 provides a complete solution for GR-1089 Section 10/ATIS-0600315.2007 testing.
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Electrodynamic Vibration Test Systems
A-series
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A wider range of test requirements and higher test specifications.A-series meets the needs for such a versatile test environment.Advanced automatic energy saving, high level of functionality and a protected test environment.
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Hydraulic Test Systems
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Genuen specializes in hydraulic test stands, including component tests, pumps, motors, valves, actuators, fatigue, load frames, and burst testers. As an industry leader in custom test systems, we focus on hydraulic solutions that leverage off-the-shelf technologies for mechanical subsystems and components. Our hydraulic test equipment has been deployed in aerospace and defense, automotive, industrial, commercial, and many other industries.
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Product
Dual Bay Flex 40 For Larger Generic Test Systems
Flex 40
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The Flex 40 is generally suited to the larger Generic Test Systems. A Flex 40 is a dual bay version of the Flex 30 that gives us the ability to fit a wide range of external instrumentation, PXI, custom modules and large fixture interfaces. Generally it is fitted with the VPC G12x Interface but this can be changed to suit the requirement.
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Product
Universal Function Test System for Industrial Electronics
Test System
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Simulation Systems
System
Bloomy offers Simulation Systems for Hardware in-the-Loop (HIL) and open loop test of electronic controls and mechanical actuators for all types of transportation and defense systems including aircraft, rail, automobiles and ships. These systems, now deployed at major aerospace, locomotive and military manufacturers and research facilities worldwide, provide world-class, high-fidelity simulated environments for use in both closed-loop and open-loop testing. Because Bloomy’s Simulation Systems are largely constructed from COTS components, time to first test can be reduced significantly, and their highly-customizable nature allows your test system experts to provide your unique IP to differentiate your product from your competitors.
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Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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High Voltage DC Cable Test Systems
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We can offer from ±18kVdc to ±30kVdc units which all have automatic earthing for discharging capacitive loads. They are designed to perform tests on installed cables and jointing systems.
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
Automatic Circuit Breaker Test Systems
UPA-16 (UPA-20)
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Mobile systems for primary injection testing and trip curve control of circuit breakers and overcurrent protection relays.
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In-Circuit Test System Calibrations
Test System
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
Test Workflow Standard
test
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
Test System for High Volume Production Testing of Integrated Circuits
ETS-364
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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SSD Test Systems
MPT3000ES / MPT3000ES2
Test System
Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
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Flight Control System Test Platform
Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Electromagnetic Vibration Testing Systems
EV series
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Labtone Test Equipment Co., LTD
EV series of electromagnetic vibration testing systems cover a wide range of forces ideal for many different applications. The electrodynamic shaker systems are well-suited for vibration testing products and structures of any size – from small components and electronic hardware to very large devices and structures.
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Non-contact Ultrasonic Testing System
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Yamaha Fine Technologies Co., Ltd.
Contact-free inspection through ultrasonic transmission detecting air bubbles, separation, and foreign materials inside workpieces. With a Yamaha ultrasonic amplifier installed, contact-less inspection in the air is realized. Without damaging or wetting the workpiece, it is possible to inspect the workpiece for packing defects, air bubbles, and even flaw depth.
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Halo Automatic Testing System
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Our revolutionary Halo system is an automatic metal detector testing device. It is designed to automatically test ferrous, non-ferrous and stainless steel samples on all Fortress metal detectors. Automatic testing saves time, money, labor, along with removing the risk of human error and work place injury at critical control points on a manufacturing line while complying with industry standards. The Halo system is ideal for applications where manual testing of a metal detector is made difficult due to access, position, access to the product flow, environmental conditions, etc.
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Product
PXI 5W Programmable Resistor Module, 4-Channel, 1Ω to 122Ω
40-252-012
Programmable Resistor Module
The 40-252-012 is a programmable resistor module with 4 channels which can be set between 1Ω and 122Ω with 0.5Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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Product
PSG RF Analog Signal Generator, 100 kHz to 9 GHz
E8663D
Signal Generator
Tackle demanding radar & satcom measurements with metrology-grade performance, including high output power & superior level accuracyUse as an ideal reference in phase noise test systems or for analog-to-digital converter testing with the lowest phase noise in a commercial sourceCharacterize devices & circuits by adding AM, FM, M & pulse modulation to your signalImprove existing test system performance: E8663D is built on the outstanding legacy of the 8663A & is fully code compatible
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Product
PCI Precision Resistor Card 4-Channel, 2Ω To 52.4kΩ
50-297-133
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
