SEM
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, Scanning Electron Microscopes, EBSD
-
Product
Gold-Plated Glassy Carbon Electrode
DP-1-1
-
Gold-plated glassy carbon electrode for electrochemical measurements and SEM analysis. Suitable for gold-surface chemistry, biosensor immobilization, surface modification, CV, EIS and post-test SEM characterization.
-
Product
Wafer Cathodoluminescence Microscope
Säntis 300
-
Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
-
Product
Field Emission SEM
FESEM
-
Materials Evaluation and Engineering
The FESEM is an advanced microscope offering increased magnification and the ability to observe very fine features at a lower voltage than the SEM found in most laboratories.
-
Product
Magnetic Field Cancelling System
MR-3
-
3-axis magnetic field cancelling system for electron microscopes (SEM and TEM), electron and ion beam experiments, nanotechnology, biomagnetic investigations, etc. High reliability through rugged analog design. No tedious programming, no chrashs. More than 1000 MR-3 systems sold worldwide.
-
Product
Energy Dispersive X-ray Spectroscopy
EDS
-
Materials Evaluation and Engineering
EDS is an elemental chemical microanalysis technique performed in conjunction with each of the SEMs at MEE. Features or phases as small as about 1 micron can be analyzed.
-
Product
Stand alone Software
MeX
-
MeX is a stand alone software package that turns any SEM with digital imaging into a true surface metrology device. Using stereoscopic images the software automatically retrieves 3D information and presents a highly accurate, robust and dense 3D dataset which is then used to perform traceable metrology examination. The results are obtained irrespective of the SEM magnification providing metrology at macro and micro levels. No additional hardware is necessary to run MeX and it can be used with any SEM. Due to the unique AutoCalibration routine the calibration data is automatically refined. Thereby only MeX enables traceable 3D measurements at any magnification in the SEM.
-
Product
X-Ray Photoelectron Spectrometer
AXIS Supra
-
AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
-
Product
Electron Probe Microanalyzer
EPMA-8050G
-
This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
-
Product
Microscopy Software/Hardware
ZEISS Atlas 5
-
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
-
Product
Scanning Electron Microscope
Verios G4 XHR SEM
-
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
-
Product
Scanning Electron Microscopy
SEM
-
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
-
Product
Electron Microscope Analyzer
QUANTAX WDS
-
The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
-
Product
Electron Microscope Analyzer
QUANTAX EDS for TEM
-
Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
-
Product
RF Analyzer
-
Occupied Bandwidth (OBW)Adjacent Channel Power (ACP)Channel Power (CHP)Complementary Cumulative Density Function (CCDF) Intermodulation (IMD)Spectrum Emission Mask (SEM) IQ (Waveform)Phase Noise
-
Product
CD-SEM
-
Our CD-SEM tools measure the width, height, sidewall angle, etc. of wiring patterns on semiconductor photomasks and wafers.
-
Product
Energy Dispersive X-Ray Spectroscopy (EDS)
-
Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
-
Product
Scanning Electron Microscope
SEM
-
Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
-
Product
Scanning Electron Microscopes
SEM
-
Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
-
Product
Electromagnetic Radiation Analyzer
SEM-600
-
Beijing KeHuan Century EMC Technology Co,.LTD
Broadband Electromagnetic Radiation Analyzer SEM-600 can accurately measure various complex electromagnetic environments. The probe covers all frequencies from low frequency to microwave radiation. It can measure electric field strength and magnetic field by equipping different types of probes. Intensity (magnetic induction) and power density, it is also equipped with ordinary probes and other weighted probes based on human safety standards.
-
Product
Plane Wave Converter
PWC200
-
The R&S®PWC200 Plane Wave Converter is a bidirectional array of 156 wideband Vivaldi antennas placed in the radiating near field of the device under test (DUT). The phased antenna array can form planar waves inside a specified quiet zone within the radiating near field of the 5G massive MIMO base station for realtime radiated power and transceiver measurements (EVM, ACLR, SEM, etc.).
-
Product
MASK MVM-SEM® E3600 Series
E3640
-
Ongoing semiconductor process shrinks are driving new demand for stable, highly precise measurement of pattern dimensions for photomask and wafer production. The E3640 satisfies these requirements with industry-leading precision measurement capabilities and upgraded functionality that enhances mask R&D and production efficiency.
-
Product
Vehicle Electromagnetic Field Exposure Test System
SEM-400
-
Beijing KeHuan Century EMC Technology Co,.LTD
Vehicles are our daily public transportation. Electromagnetic pollution in vehicles has attracted more and more public attention. The newly revised compulsory standard GB27630-201X "Passenger Car Air Quality Evaluation Standard" intends to require the electromagnetic field in the car as one of the indicators, according to GB/T37130-2018 "Measurement method of vehicle electromagnetic field relative to human exposure" The measurement method is to measure the intensity of the magnetic field in the car. In the frequency range of 10Hz-400kHz, the electromagnetic field measurement result should meet the public limit requirements of GB8702-2014 for electromagnetic exposure.
-
-
Product
Dual Relay Trip Amplifier for RTD and Slidewire Sensors
SEM1633
-
The SEM1633 provides an accurate alarm / switching function when used with RTD or Slidewire sensors. Other sensor characteristics or your own 22 point linearization characteristic (for slidewire or linear resistance) can be downloaded into the product enabling you to adapt it exactly to your application.
-
Product
Suitable For Temperature And Potentiometer Sensors
SEM1600T
-
The SEM1600T accepts resistance or mV signals from RTD, Slidewire or Thermocouple sensors.
-
Product
PRIME Ultra Clean, Ultra High Concentration, Ultra High Flow Ozone Generator
SEMOZON® AX8410
-
The SEMOZON® AX8410 PRIME is the initial product offering in MKS' next generation platform of compact, high concentration, high flow, ultra clean ozone generators. It features a newly designed cell and power structure to achieve twice the ozone output of earlier models with a similar footprint.
-
Product
In-Head RTD Temperature Transmitter
SEM203/P
-
The RTD in-head mounted temperature transmitter connects to any standard pt100 resistance sensor and converts the linearised temperature to a (4 to 20) mA signal.
-
Product
PC Programmable, Suitable For Thermocouple Sensors
SEM206TC
-
The SEM206/TC is our entry level PC programmable temperature transmitter
-
Product
Multi-Channel Ozone Delivery System With In-rack Chiller
SEMOZON® AX8575
-
The SEMOZON® AX8575 is a fully integrated, high output ozone gas delivery system that can be configured as a multi-channel system delivering ozone for up to 4 channels supporting multiple chambers or multiple tools. It has an optional in-rack chiller for ultra-high concentrations.
-
Product
Thermocouple Temperature Transmitter PC Programmable With Push Button Calibration
SEM1605/TC
-
The SEM1605TC is the next generation cost effective DIN rail mounted temperature transmitter from Status Instruments. It has been designed to accept most common Thermocouple temperature sensor inputs
