Scanning Electron Microscopy
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopes, SEM
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Product
Scanning Near Field Optical Microscope
SNOM
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SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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Product
Programmable DC Electronic Load
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Programmable DC electronic load is a device that precisely regulates the load voltage and current dissipation power consumption of electrical energy. There are several important parameters to consider when choosing programmable DC electronic load, including maximum power, maximum current, maximum voltage, current slope, and so on. Each indicator is related to the needs and applications we actually test.
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Product
High Current Probes (Power Electronics) HCF77314B230G600
1000414
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The High Current Probes (Power electronics) HCF77314B230G600 are engineered for precision in demanding applications, operating efficiently across temperatures from -45°C to +200°C. With a compact design featuring a pitch of 3.50 mm, these basic contact probes are optimized for high-performance in electrical circuits, ensuring reliable connectivity and minimal resistance. The continuous current capacity of 30 A and a typical contact resistance of just 8 mOhm positions this probe as a superior choice for power electronics professionals who need dependable tools that withstand extreme conditions.
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Microscopy and Automation Solutions
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Opto already offers automated multifluorescence microscopes for cell analysis, inverted autofocus microscopes for motion analysis of growth processes, and high- throughput fluorescence microscopes for DNA and RNA sequencing.
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Electronic Type Universal Testing Machines
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Our list of current Electronic Type Universal Testing Machines products are listed below. If you cannot find what you are looking for, please contact us and we will try our best to help you.
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Product
Electronic Load Device
786531-01
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The RMX-4005 provides capabilities for qualifying power designs and validating power supply functionality in a production environment. You can combine Electronic Load Devices to customize your test system based on the number of channels, maximum load power, and voltage and current of each channel. You can connect multiple RMX-4005 devices in parallel to provide higher power capabilities for your power supply tests. This feature gives flexibility for future projects that have different power requirements.
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Product
Auditor Universal Electronic Testers
AUET-DC Series
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The Auditor Universal Electronic Testers (AUET) have a broad range of features to accommodate most requirements. These instruments are designed to be bench top mounted and are available in several configurations and various single or multiple torque ranges. They are also available with file capability (DC) models. The DC models require PC software Auditor Tool Manager (ATM).
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Product
Programmable DC Electronic Load
63000 Series
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The 63000 Series programmable DC electronic loads are reliable, precision instruments primarily designed to test switching power suppl ies, A/D power suppl ies, power electronic components, adapters, 3C batteries and chargers. Its maximum 350W rated power makes it suitable for testing numerous types of lower power devices. The 63000 Series offers models in two operating voltages 150V models, with 250W and 350W power levels up to 60A in a single unit. Their compact and light weight design make these loads easy to move around which is ideal for R&D and design validation. Each model of the 63000 Series has unique user-def ined waveform (UDW) funct ion capable of simulating real-world custom waveforms. In addition, a data storage function has been built in for saving and recalling up to 100 stored settings at any time. For automated testing, these save and recall functions can save a great deal of time. The 63000 Series has 3 power ranges that can precisely measure the voltage and current in real time. Since short circuit testing is a critical test item, the 63000 provides short circuit simulation to effectively address application demands for power and automated testing.
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Product
Scanning Head For Energy Meter Test
PACB108
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PACB08 is the accessory device to perform the energy meter test, which can work together with PONOVO’s relay test sets to test energy meter by using Energy Meter Module in Powertest software.
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Electronic Loads
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Flexible electronic DC loads for general purpose applications. Voltage up to 80V, current up to 80A and power up to 600 watts. CI, CR, CG, CV and CP modes, built-in transient generators. Models with USB, RS232, GPIB and LXI compliant LAN interfaces.
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Electronic Pressure Switch With Digital Display
PPG
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31mm compact 1-screen 2-color display pressure switch.Supports protection structure IP65. (Piping connection: Female thread added)
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Otolaryngology (ENT) Microscopy Solutions
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Otolaryngology (ENT) microsurgery requires top-class imaging quality and visualization. Microscopes for otolaryngology allow specialists to carry out complex and minimally invasive ENT surgical procedures with a high level of precision to enable the best possible clinical outcomes.
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Digital Control DC Electronic Load
IT8200 Series
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IT8200 series economical programmable electronic load,with the highest cost/performance ratio and small size, they are widely used in production testing lines and maintainance lines etc. Resolution 1mV/1mA ensures the accurate measurement result. IT8200 series has programmable performance, and can quickly recall 4 * 40 group memory data, panel function keys and display interface is clear, provide customers with simple operation program, easy and fast to complete a variety of complex tests. The series has CV, CC and CR mode, and short circuit test function, it is the most cost-effective electronic load products.
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Product
TERAHERTZ HOT ELECTRON BOLOMETER DETECTORS FROM 0.1 to 70 THz
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Insight Product Company offers ultrafast superconducting hot-electron bolometers (HEBs) operating at terahertz frequency range. from 0.1 to 70 THz. Superconducting hot electron bolometers HEBs are designed to detect and register the electromagnetic radiation pulses in the frequency range from 0.1 THz to 70 THz.
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Product
Electronic Air Throttle Tester
DTA-1
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Throttle is usually associated with petrol engines. However, throttle valves are also found in modern diesel engines. They are used under different names, often general and not linking to intake system.
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High Speed-Large Current DC Electronic Load (CC/CV/CR/CP)
PLZ-4WL Series
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While the PLZ-4WL series succeeds to the superior operability of our conventional model of the PLZ-4W series, the PLZ-4WL series realizes the high speed rise and fall time (slew rate of 50A/µs.) in the range of low voltage with large current. The PLZ-4WL offers six operation modes, and equips with various features such as sequence operation, switching operation, soft-start function, and time and voltage measurement. The PLZ-4WL applies not only for the conventional load test of the CPU power supply, but also it can be applied to even faster current response test. In addition, the PLZ-4WL is a space-saving design (about 50% less volume of the conventional model) that can save the facility space of the testing site, and it can be applied for the single cell testing of the large scale rechargeable battery.
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Electron Multiplication (EM) Standard Image Sensors
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EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
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Electronic Ballast Production Line Tester
UI2000-OK
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• Eight windows for displaying input characteristics, output characteristics, convenient for comparison and analysis. • Frequency response for testing input current up to 1 MHz, suitable for precise testing of various kind of electronic ballast. • High speed testing, finish testing input and output characteristics within 1 minute. • Portable with built-in chip micro-processor, particular suitable for development and spot production. • Parameters, waves and curves of input, output and startup can be printed. • Communicating with PC, special software provided and both Chinese version and English version available. Run in WINDOWS3.2, WINDOW95 or WINDOWS98, nice interface between people and computer, easy to operate.
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Area Scan Sensors
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The ams family of pipelined global shutter sensors features high frame rates for a wide range of demanding professional and industrial applications. Their resolutions range from VGA up to 50Mpixels. Rolling shutter image sensors feature high 71Mpixel resolution for use in demanding industrial applications.
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Product
High Current Probes (Power Electronics) HCF73512A400U500
1019042
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The High Current Probes (Power electronics) HCF73512A400U500 is engineered for precision and durability in demanding electronic applications. With a basic contact probe design and a small pitch of just 5.00 mm (197 mil), it is capable of operating across a wide temperature range from -45°C to +200°C, making it suitable for various environmental conditions. Designed for high performance, it can handle a continuous current of up to 50 A while maintaining a low typical contact resistance of only 5 mΩ. This ensures effective and reliable electrical connectivity in high-power scenarios.
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High Precision Electronic Load
PEL-8000
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PEL-8000 series adopts high-performance chip high-speed and high-precision design, providing resolution of 0.1mV, 0.01mA (basic accuracy is 0.03%, basic current rise rate is 2.5A / US)
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Line Scan Sensors
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The CMOS line scan image sensor family from ams consists of 23 variants, offering a range of resolution and pixel size specifications. Resolution options range from 2kpixels up to 16kpixels and line rates extend up to 80,000 lines/s.
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10Ch Electronic Potentiometer 8 Bit
YAV90084
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The YAV90084 can work autonomously as a 10Ch electronic potentiometer of 8 bit resolution. By default, it features 10kOhm resistors), but other resistor values can be assembled under request.
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Product
Boundary Scan / JTAG Test Development System
onTAP Development
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The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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Electron Microscope Analyzer
QUANTAX EBSD
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QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
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3D Scan Systems
intelliWELD
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The intelliWELD is a 3D scanning unit for remote laser welding applications. While a robot leads the scan system along the processing line, the scan unit ensures the fast and precise positioning of the laser spot.The intelliWELD scan unit allows elimination of complex robot movements and fast repositioning, reducing the repositioning time between the welds to a few milliseconds.
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Basic Electronics Trainer
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Basic Electronics Trainer System to understand Characteristics of Variuos Type of Electronic Components.Functional block diagrams are provided on-board for Teaching/Training. These Trainer provides with various Test Points to Measure the Parameters on Multimeter.
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Electronic Equipment Testing System
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The task set forth the need to create a special universal software core, the main tasks of which are the provision of measurement and control processes, as well as the interaction of software components intended for collection, visualization, mathematical processing and documenting of data. For each stand, specific program modules were additionally developed according to test methods specific products. The overall modular architecture of the system makes it easy to supplement and correct test algorithms.
