Scanning Electron Microscopy
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopes, SEM
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RF Electronic Calibration Module (ECal), DC To 13.5 GHz, 4-ports
N4431D
The Keysight N4431D RF electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4431D is a precision 4-ports ECal module that supports multiple selection of connectors like Type-N, 3.5 mm, 7-16 and 4.3-10 connectors and can be mixed up to 13.5 GHz. Select either female-female, male-male, or female-male connectors.
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Electronic Fuel Injection & Ignition Spark Tester Kit
36310
Quickly diagnose "no start" and engine miss conditions in the electrical fuel injection and spark plug circuits. Analyze rough running engines. Contains Cat. No. 36300, Noid Light Set to test electronic fuel injection signals and the Cat. No. 23900, In-Line Ignition Spark Checker to trouble shoot the ignition system (Shows a duplicate view of the ignition spark). Supplied with Noid Lights to check Bosch PFI, Ford TBI, Geo TBI, GM PFI, GM SCPI and GM TBI.
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Online OK Tester for Electronic Ballast and CFL
WT-1
• Test 6 pieces at one time, suitable for mass testing in assembly line. • Measure parameter: Vrms, lrms, W, PF. • Freely set upper and lower limit for lrms, W, PF, alarm when value out of limits. • Freely set test duration in range: 0-99.9s, tested data automatically locked. • Test range: 1) Vrms: 10.0-300.0V 2) lrms: 5-999mA 3) W: 0.1-300.0W 4) PF: 0.0001-1.000 • Accuracy: 0.5% • Digital display on 6 windows is easy to read • Print port and communication port available (optional)
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Ion & Electron Detection
Photonis is the global leader in the development and manufacturing of detectors and optical components to detect ions and electrons. These detectors and components have been designed for a wide range of scientific instruments used in space and research projects but also in cells and material analysis in lifescience or non destructive testing.
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Electronic Load System
Electronic loads are required for testing fuel cells such as PEMFC, AFC, PAFC, MCFC, SOFC. These electronic loads are designed either in IGBT technology with power, current and voltage ranges according to specific requirements or in transistor technology. Electronic loads in IGBT technology are designed for high voltage ranges up to 900 V, current ranges up to 1000 A, and power ranges up to 480 kW.
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Industrial Electronic Endoscope
Xiamen IDEA Electronic Technology Co., Ltd.
1.Railway Electronic Industrial Endoscope testing.2.Large screen color screen to restore the true image. 3.Industrial endoscope.
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Scanning X-Ray Detectors
Shad-o-Scan
Shad-o-Scan is a family of scanning X-ray detectors specifically designed for the challenging requirements of high-performance industrial and scientific X-ray applications. Industry-leading TDI CCD performance enables the ultimate sensitivity and highest resolution in the industry, and ensures long detector lifetime in even the harshest radiation environments.
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Electronic Brake Meter
BrakeCheck
The Bowmonk BrakeCheck is a fully self-contained, portable, battery-powered brake meter that can be used by workshops, government traffic authorities, testing and inspection stations etc. to test and report on vehicle brake efficiency. The unit is MOT approved.
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Brinell Optical Scanning System
B.O.S.S.
Newage Testing Instruments, Inc.
The B.O.S.S. brinell optical scanning system measures your brinell impressions faster, more accurately and more consistently. And it improves your quality control with advanced data acquisition and analysis capabilities, including the ability to save your high-resolution image of our impression to file.
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Electronic Ballast Production Line Tester
UI2000-OK
• Eight windows for displaying input characteristics, output characteristics, convenient for comparison and analysis. • Frequency response for testing input current up to 1 MHz, suitable for precise testing of various kind of electronic ballast. • High speed testing, finish testing input and output characteristics within 1 minute. • Portable with built-in chip micro-processor, particular suitable for development and spot production. • Parameters, waves and curves of input, output and startup can be printed. • Communicating with PC, special software provided and both Chinese version and English version available. Run in WINDOWS3.2, WINDOW95 or WINDOWS98, nice interface between people and computer, easy to operate.
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Output Characteristic Analyzer of Electronic Ballast
UI2002
• Measure lamp voltage, lamp current, lamp power, oscillatory frequency, filament current, guided cathode current, and crest factors • Measure changing curves and values of startup lamp voltage, lamp current, filament current, cathode current from 0 to 5 seconds, as well as the pre-heat time • Accuracy: Class 2 • Data and curves printable. All the data and curves can be displayed after being connected with PC
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Auditor Universal Electronic Testers
AUET-DC Series
The Auditor Universal Electronic Testers (AUET) have a broad range of features to accommodate most requirements. These instruments are designed to be bench top mounted and are available in several configurations and various single or multiple torque ranges. They are also available with file capability (DC) models. The DC models require PC software Auditor Tool Manager (ATM).
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Spectro UV-Vis Double PC 8 Auto Cell Scanning Spectrophotometer
UVD-3000
Spectro UV-Vis Double PC 8 Auto Cell is a high performance UV-Vis double beam automatic scanning spectrophotometer. Spectro UV-Vis Double has a brand new optical system design, microcomputer controlled. It is capable of processing data, from analytical and spectrum testing.
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Modular DC Electronic Load LED Simulator
6310/A
Chroma Systems Solutions, Inc.
Chroma 6310A Programmable Electronic Load integrates microprocessor capabilities into each load module and mainframe to provide simple and accurate parallel operation to optimize the speed and control among multiple load modules. All load modules may be configured to work synchronously, to test multiple outputs simultaneously, thus simulating real life applications.
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Optical Coherence Tomography Imaging Line Scan Cameras
OctoPlus Range
Teledyne e2v spent 2 years developing a CMOS sensor specifically for OCT. This resulted in the launch of OctoPlus, which has a specially designed pixel architecture that improves sensitivity and reduces signal roll-off to improve image quality by several dB vs state-of-the-art CMOS cameras, especially in deep structures.
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Electronic Light Table
ELT®/Series
The ELT/Series software provides powerful imagery and geospatial exploitation tools for a wide range of applications, including intelligence, mission planning and disaster management.
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3D Optical Microscopy
Bruker is the worldwide leader in 3D surface measurement and inspection, offering fast, non-contact analyses for samples ranging in size from microscopic MEMS to entire engine blocks. Our microscopes are the culmination of ten generations of proprietary Wyko® Technology advances that provide the high sensitivity and stability necessary for precision 3D surface measurements in applications and environments that are challenging for other metrology systems.
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Near-field Scanning Optical Microscope
NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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High Power DC Electronic Load
34000A Series（5KW~40KW）
34000A Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store / Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface.SHORT time setting and SHORT_VH, SHORT_VL setting function, also can measure Short Voltage and Current.
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TERAHERTZ HOT ELECTRON BOLOMETER DETECTORS FROM 0.1 to 70 THz
Insight Product Company offers ultrafast superconducting hot-electron bolometers (HEBs) operating at terahertz frequency range. from 0.1 to 70 THz. Superconducting hot electron bolometers HEBs are designed to detect and register the electromagnetic radiation pulses in the frequency range from 0.1 THz to 70 THz.
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Electronics Failure Analysis System
Sentris
Due to the continued decrease in integrated circuit feature size and supply voltages, detecting and locating the miniscule amount of heat generated by failure sites has become increasingly difficult. Sentris pinpoints low-level infrared thermal emissions from IC faults such as short circuits and leakage current.
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Saluki SEL8 Series Programmable DC Electronic Load (up to 200KW)
The new SEL8 series programmable DC electronic load is a new generation product designed by Saluki Technology. Incorporating high-performance chips, the SEL8 series delivers high speed and high accuracy with a resolution of 1mV and 1mA (basic accuracy is 0.03% and basic current rise speed is 2.5 A/μs).SEL8 series have wide application from production lines for cell phone chargers, cell phone batteries, electronic vehicle batteries, switching power supplies, linear power supplies, and LED drivers, to research institute, automotive electronic, aeronautic and astronautic, maritime, solar cell and fuel cell etc. test and measurement applications.* Customization available upon request
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Electronic Engine Instruments
Is a flight instrument display system in an aircraft cockpit that displays flight data electronically rather than electromechanically.
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Multiphoton Laser Scanning Microscope
FVMPE-RS
The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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3D Laser Scanning Systems
3D laser scanning is a construction, engineering, and architectural tool often used to document the existing conditions (as-builts) of any structure.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Single-in-Line (SIL / SIP) Reed Relays From Pickering Electronics
The SIL / SIP reed relay is the industry standard when high reliability and consistent performance are desired in a compact package. Pickering Electronics Series 100 - 110 SIL / SIP reed relays feature the highest quality instrumentation grade reed switches making them suitable for the most demanding application
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Boundary Scan Test (BST)
In the simplest case, the BST can be carried out via the connector of a module.Digital components require a JTAG port. In direct comparison to the ICT, the BST requires longer test times and the testing of analog components is not possible.
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Boundary Scan Trainer Kit
QE49
Qmax Test Technologies Pvt. Ltd.
The QE-49 IEEE1149.1 Boundary Scan Trainer Kit was developed by Qmax to provide user a good understanding and hands on the testing principals of boundary scan namely the scan chain test, interconnect test, non-BS functional testing of logic IC and cluster like a combinational or sequential circuits.
