Test Executive Software
See Also: Test Management Software
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Product
Test Executive Software
TestBase
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TestBase is a test executive that supports the visual development, database storage and run-time execution of test program sets.
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Product
Test Automation Platform Deployment System
KS8000A
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TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher level test executive software environments. The Keysight KS8000A Test Automation Platform (TAP) Deployment System provides a lower cost, scaled down alternative to the full KS8400A TAP Developers System without the graphical user interface, results viewer and timing analyzer. Deploy your existing test software and TAP plugins into manufacturing environments using the KS8000A command line interface or your own interfaces.
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Product
JTAG Test Software
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JTAG Technologies software has been subject to a program of continuous development for over 20 years. The first products, launched in 1991 formed the start of our 'Classic' range of software and featured the first automatic boundary-scan test program generator (ATPG) for PCB interconnects plus associated test execution and diagnostics software. In 2006 JTAG Technologies launched it's new flagship tools platform JTAG ProVision.
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Product
PathWave Test Executive For Manufacturing Developer Version
KS8328A
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PathWave Test Executive for Manufacturing (PTEM) is a plug-in that enhances the user experience in developing automated test programs using PathWave Test Automation Platform (TAP). With powerful PathWave Test Executive software, we eliminate the need to maintain or develop a test platform by users, especially in a manufacturing environment where a high mix of products exist, the maintenance, enhancement, and control of it could become challenging. Development of a test execution platform should not be a priority for valuable resources, instead optimizing and improving test coverage should be the key area of focus.
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Product
LCA TAP Plug-In
N4370P01A
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Keysight Test Automation on PathWave (TAP) is a modern Microsoft .NET-based application for standalone use or in combination with higher level test executive software environments. Instrument plug-ins provide test steps that can be added to work-flow sequences without instrument level programming commands. The LCA plug-in steps further simplify automation by handling the interface to both the PNA instrument and the LCA optical hardware and software and providing the test steps for easy configuration.
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Product
Test Automation Platform Developer's System
KS8400A
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The Keysight KS8400A Test Automation Platform (TAP) Developer's System provides powerful, flexible and extensible test sequence and test plan creation with additional capabilities that optimize your test software development and overall performance. Keysight TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher-level test executive software environments. Leveraging C# and the power of Microsoft Visual Studio, TAP is not just another programming language. It's a platform upon which you can build your test solutions, maximizing your team's productivity by using your existing software development tools and infrastructure.
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Product
Test Automation Platform (TAP)
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The Keysight Test Automation Platform (TAP) provides powerful, flexible and extensible test sequence and test plan creation with additional capabilities that optimize your test software development and overall performance. TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher level test executive software environments.
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Product
Prototyping & Test Consulting Services Solutions
test
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Product
Automotive Test Solutions
test
The testing and simulation systems from this division are used primarily in the automotive and automotive supplier industry. These are, for example, modular function-testing systems and diagnostic tools for automotive ECUs or bus communication systems for a wide variety of electronic components in automotive production. Electromechanical assemblies and entire car seats are also tested to ensure they function
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
Rugged COM-HPC Server Type Size E Reference Development Platform Based On Ampere® Altra® SoC
Ampere Altra Developer Rugged
Software Development Kit
The rugged 4U rackmount server platform provides a cloud-native environment for embedded edge development. It can host the SOAFEE (Scalable Open Architecture for Embedded Edge) providing a cloud-native environment for embedded edge development and is compatible with Autoware Foundation's Autoware Open AD Kit. It supports the open source EDKII as bootloader with UEFI, so customers can just download a stock AArch64 (arm64) ISO such as Ubuntu and install it through booting a live ISO directly on the target. The same convenience we have become used to by using x86 / amd64 target systems.
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Product
Digital Management Software
EdgeGO
Digital Management Software
EdgeGO® is a robust software platform for remote device management in edge computing environments. It prioritizes quick deployment and user-friendly operation while ensuring scalability and security.
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Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
EFT Module for Teststand
test
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
NI Real-Time Test Cell Reference System
778820-35
test
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
Dielectric Material Test Fixture
16453A
Test Fixture
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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Product
EMI Test System
TS9975
Test System
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
Test Fixture
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Product
EVSE Test Platform
Test Platform
To manage both the challenging high-power requirements of electric vehicle supply equipment and the market demand, it is crucial to rely on a test system that performs to your specs. The right system needs to combine the tools for reliable asset communication, microgrid management, effective protocol simulation and high-power testing. This EVSE platform combines the right energy regeneration equipment with 25+ years of test experience to deliver the results you need to meet conformance in the time you need it.
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Product
PCIe 4.0 Test Platform
PXP-400A
Test Platform
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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Product
Regenerative Battery Pack Test System
17020E
Test System
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Product
SSD Test Systems
MPT3000ES / MPT3000ES2
Test System
Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
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Product
USRP‑2930, 20 MHz Bandwidth, 50 MHz to 2.2 GHz, Included GPS-Disciplined OCXO, USRP Software Defined Radio Device
781910-01
Software Defined Radio Device
20 MHz Bandwidth, 50 MHz to 2.2 GHz, Included GPS-Disciplined OCXO, USRP Software Defined Radio Device - The USRP‑2930 is a tunable RF transceiver with a high-speed analog‑to‑digital converter and digital‑to‑analog converter for streaming baseband I and Q signals to a host PC over 1 Gigabit Ethernet. It also features a GPS-disciplined oscillator (GPSDO) with PPS accuracy of ±50 ns. You also can use the NI USRP‑2930 for the following communications applications: white space; broadcast FM; public safety; land-mobile, low-power unlicensed devices on industrial, scientific, and medical (ISM) bands; sensor networks; cell phone; amateur radio; or GPS.
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Product
In-Circuit Test System
TestStation LX
Test System
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
Functional Test for Engineering Lab
Spectrum BT
Functional Test
Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
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Product
Configurable Functional Test System
ATS-5000
Test System
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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Product
USRP Software Defined Radio Device
Software Defined Radio Device
The USRP Software Defined Radio Device is a reconfigurable RF device that includes a combination of host-based processors, FPGAs, and RF front ends. The USRP Software Defined Radio Device include options that range from lower cost options with fixed FPGA personalities to high-end radios with a large, open FPGAs and wide instantaneous bandwidth. These devices can be used for applications such as multiple input, multiple output (MIMO) and LTE/WiFi testbeds, SIGINT, and radar systems.
