Semi-conductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
-
Product
Semiconductor Curve Tracer
CS-8000 Series
-
The CS-8000 series are equipped with a high-voltage source of up to 5 kV and a high-current source of 2 kA. It features Pulse output, Gate pattern, and very small current measurement capabilities, and it supports the design evaluation of wideband-gap semiconductors such as SiC and GaN.
-
Product
Non-Linear Junction Detector
ORION™ HGO-4000
-
The ORION HGO-4000 is REI’s original high gain Non-Linear Junction Detector for special applications. The ORION HGO-4000 can locate listening devices and semiconductors in walls floors, ceilings, fixtures, furniture or containers and provides a user the capability to detect hidden electronic devices, regardless of whether the device is radiating, hard wired, or even turned off.
-
Product
Semiconductor Electrical Test
-
We conduct electric property test (final test) of the completed (packaged) LSI products. We will support testing of analog devices, logic devices, other electronic parts, modules, application products and so on. We will test according to customer's specification regardless of evaluation, trial production, mass production, by know-how cultivated with long-time mass production results. Test initial examination ~ From consistent correspondence up to selection and evaluation, individual correspondence such as design only is accepted.
-
Product
LXI High Voltage Matrix 2-pole 200x2
60-310-202
Matrix Switch Module
The 60-310 is a 2-pole Matrix Module available in 300x2, 200x2 and 100x2 formats. It is capable of cold switching 1000VDC and has a maximum carry current of 1A. It is designed for high voltage applications including circuit board isolation testing, relay testing, semiconductor breakdown monitoring and cable harness insulation testing.
-
Product
PROBE CARD
-
the electrical characteristics of the individual CHIPs in WAFER that have been completed through the FAB stage during the semiconductor fabrication process
-
Product
MEMS Spring Probe
-
MEMS Spring Probe is developed by NIDEC-READ original ultra-fine 3D processing technology and enables our customer to supply advanced and innovative test solutions at PCB & semiconductor testing market.
-
Product
O Band Tunable Laser Source
CA9812
-
The CA9812 O Band tunable laser integrates a widely tunable laser with a semiconductor optical amplifier (SOA). The tunable laser is electronically tuned and can address any wavelength from 1265.00 nm to 1365.00nm. The integrated SOA facilitates flexible control of the output power and acts as a shutter when reverse biased, enabling dark tuning between channels. The device is packaged into a standard module box package, with an ternal optical isolator and a polarization maintaining fiber output.
-
Product
Solid-State And Electromechanical Relay Products
-
Relay is the name for a switch that is operated electro-mechanically or electronically. Their main task is to make and break connections to control the flow of current in electrical circuits. They’re used for various purposes ranging from validating semiconductors to interfacing low power computers or microcontrollers with high power machinery.
-
Product
Low Constant Temperature Trough
DRK6691
-
Shandong Drick Instruments Co., Ltd.
Drk6691 small low constant temperature trough is a special product designed for small Abbe refractometer, supporting the use of. It has many advantages such as constant speed, constant temperature, small volume, low noise and convenient operation and so on , so it is a higher price products. This product adopts the technology of the one chip computer, PID selftuning regulation technology;adopts imported platinum resistance temperature (Pt100), so it has high precision of temperature control and temperature fluctuation is small; adopts the semiconductor refrigeration technology, so that it consists of advantages of fast refrigeration, no noise.
-
Product
Metrology System
IMPULSE V
-
With tighter wafer-to-wafer and within-wafer uniformity tolerances, integrated metrology systems are in use across various semiconductor processing steps. Based on demonstrated high-resolution optical technology, the IMPULSE V system provides higher sensitivity to thin film residue measurements during the CMP process. The IMPULSE platform boasts the industry’s most reliable hardware with best-in-class reliability and productivity metrics.
-
Product
Regulators
-
Parker offers a range of air-line, pressure high flow and single phase regulators for instrumentation, filtration, refrigeration and pneumatic applications. Instrumentation regulators are used in the process, power, oil, gas and semiconductor industries to control the flow of liquids and gases with speed and precision. Air regulators provide quick response and accurate pressure regulation for the most demanding industrial air preparation applications, available as miniature, economy, compact, standard, hi-flow and pilot-operated regulators to meet a variety of service needs. The refrigeration line of pressure regulators includes valves that control inlet, outlet or differential pressure. Each regulator is available with an assortment of variations which enable one regulator to perform multiple functions. All regulators are built to the highest quality standards, recognized around the world for their performance, durability and reliability.
-
Product
High Resolution Inline AXI Platform
AXI XS Series
-
The XS-platform series is a small-footprint high-resolution automated X-ray inspection system concept designed for sophisticated high-speed inspection of semiconductor samples, wire bonds and PCB-assembly boards for single/multipanels or samples in trays. The inspectable applications range from component level inspection to mid-sized SMT boards.
-
Product
Programmable DC Power Supply
62000L Series
DC Power Supply
The Chroma 62000L Series Programmable DC power supplies have low noise linear performance and fast transient response. The units have many unique functions that are targeted for overall automated test system integration, automotive power electronics MCU/ECU, power semiconductors, wireless communications, etc. The 62000L Series is a high quality yet cost effective programmable DC Source, designed to meet the stringent requirements of the next generation of power electronics. The GPIB and USB control interfaces come standard with the 62000L Series, no additional purchase required. The 62000L Series can be easily remote controlled via either of these two interfaces. The 62000L weighs less than 2.5 kg, and its case measures 214.6W * 88.6H * 280D mm. Its light weight and compact size makes it easy to handle and stack safely.。
-
Product
Hi Rate Multi-Pixel Detection
-
Systems utilizing multiple electron beams are an emerging semiconductor metrology technology that aims to increase throughput. El-Mul is a pioneer in developing detection solutions for such metrology systems and has designed and manufactured prototype detectors that can simultaneously detect 144 beams at 35MHz.
-
Product
Compound Semiconductor
-
Scientific Computing International
Semiconductors that are made from two or more elements.
-
Product
Lan Digitizer / Oszilloscope With 16 Bit, 4 Channels 200 MS/s Up To 8 GS Memory
Razor-X
-
The GaGe series of Faceless Connected Instruments (FCiX) provide test and measurement professionals new options for integrating high resolution, multi-channel digitizers into Ethernet and LAN enabled measurement systems. The applications served include manufacturing test, automotive test, remote communications monitoring, multi-site semiconductor test, and other solutions where a lightweight but powerful, multi-channel, independent digitizer system is required.
-
Product
Emulation Adapters
-
With some of the more advanced 32-bit microcontrollers and SoCs, the full program and data trace capabilities of the device are not made available on production silicon. Instead, semiconductor vendors provide special 'emulation devices'. These typically feature more pins than the production device, thereby providing the interface to the trace interface.
-
Product
Trace Moisture Analyzers
-
Used primarily with air separators, medical gas, semiconductors and in pharmaceutical settings, Edgetech Instruments provides both stationary and portable units used to accurately measure moisture levels in dew point and PPMv units.
-
Product
Curve Tracer
Series 5000C
-
Our curve tracers are used worldwide for high volume production, quality control and final testing of descrete semiconductor devices. Provided with an Intel based single board computer(SBC) and Windows based software, the Scientific Test curve tracer is highly reliable, extemely fast, very easy to operate, and provides quick creation of digital curves for data storage and intuitive manipulation.
-
Product
Centralized Motion Controller
Motion Controller
ADLINK‘s pulse train controllers provide comprehensive and application-oriented motion functions for servo and stepper motors through digital signal processing (DSP)-based and Application Specific Integrated Circuit (ASIC)-based two pulse train mode controllers to achieve excellent synchronous motion control and precise positioning suitable for laser engraving, marking and cutting applications in semiconductor, AOI, and conventional manufacturing industries.
-
Product
Multiple Camera Board For NVIDIA® Jetson AGX Xavier™
E-CAM130_CUXVR
-
e-CAM130_CUXVR is a synchronized multiple 4K camera solution for NVIDIA® Jetson AGX Xavier™ development kit that has up to four 13 MP 4-Lane MIPI CSI-2 camera boards. Each camera is based on the camera module e-CAM137_CUMI1335_MOD, 1/3.2" AR1335 color CMOS image sensor from ON Semiconductor® and integrated high performance Image Signal Processor (ISP). All these four cameras are connected to the base board using 30 cm micro-coaxial cable. These four 4-lane MIPI camera modules can be synchronously streamed in 4K resolution, which will be best fit for high end multi camera solution. Customers can opt to purchase anything between single camera to four cameras as according to their requirement.
-
Product
High-Standard Bench-Top Laser Source
-
Shanghai Stone Communication tech Co., Ltd
These bench-top laser source has built-in high-feature Semi-conductor laser device, it is the SM output, with less than 10MHz plus width. Based on the advanced micro-processor control system, this instrument integrated high precision ATC and ACC(APC) to control the electric circuit, in order to realize the high stable output of the laser device, and make the operation easily and directly. We also can provide user required communication port with the software to realize remote control from the PC.
-
Product
Semiconductor Testing
-
Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.
-
Product
Pulsed IV-Curve Solutions
-
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
-
Product
PhotoMASK Services
-
For years APPLIED IMAGE has been serving customers who work with semiconductors, displays, PCB, MEMS, along with college professors, researchers, and students with Photomask making solutions tailored specifically to each customer’s needs. Working with a dedicated sales engineer means that you will have all of your questions answered.
-
Product
SEM- Based Dectors
ScintiFast™
-
ScintiFast™ is El-Mul’s flagship scintillator technology enabling the next generation of detectors with shorter response time and higher sensitivity. Recently released, ScintFast™ has the highest available photon yield for the nanosecond scintillator category. ScintiFast™ is the scintillator of choice for detectors in SEM-based tools for the semiconductor market as well as in Time of Flight Mass Spectrometry instruments.
-
Product
Millimeter-Wave Automated Accelerated Reliability Test Systems
nm-Wave AARTS System
-
AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
-
Product
Light-Transmitting/-Receiving Devices for Optical Communication Systems
-
Sumitomo Electric Industries, Ltd.
Various light-transmitting/-receiving devices support the foundation of optical communication systems. The portfolio includes semiconductor lasers and photodiodes for optical transceiver modules and board level design, as well as wavelength-tunable lasers and optical receivers for optical coherent communication devices in the backbone systems.
-
Product
Wafer Chucks
-
ARC, in addition to fabricating Wafer Chucks from aluminum, is also known for its ability to work in hard to machine materials such as hardened (50-62 Rockwell) metal alloys, fired ceramics, e.g. SiC and glasses. These materials are often ideal for semiconductor equipment applications due to their ability to hold critical dimensions and tolerances. ARC specializes in surface grinding and lapping these materials to precision flatness and parallelism specifications needed for semiconductor wafer chuck requirements.
-
Product
Total Reflection X-ray Fluorescence (TXRF) Services
-
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.





























